Study on Organic Triplet Exciton Emission and Quenching Processes by Low-temperature Photo- and Electroluminescence Spectroscopy

2008 ◽  
Vol 1115 ◽  
Author(s):  
Nils Asmus Kristian Kaufmann ◽  
Frank Jessen ◽  
M. Heuken ◽  
Herbert Boerner ◽  
Holger Kalisch ◽  
...  

AbstractOrganic light emitting diodes (OLED) are efficient light sources based on organic semiconductors. Unlike inorganic LEDs which are more or less point sources, OLED are planar light sources with up to 1 m2 in area. By using organic materials, they are cheap to produce and economical to use. The determination of triplet exciton energy levels is of interest for the development of efficient OLED, based on the fact that electrical excitation usually creates three times as many triplets as singlets. Additionally, the knowledge of these energy levels is crucial for the design and choice of emitter matrix materials and exciton blocking layers. These values are normally determined by photoluminescence (PL) measurements in solution for materials which show intersystem crossing (ISC) between singlet and triplet states. For some materials, the triplet levels cannot be measured this way because some materials prohibit ISC. In this work, a method is presented which allows the determination of the energy levels using low-temperature electroluminescence (EL) spectroscopy. The dependence on ISC is avoided by creating triplets directly with electrical excitation and this allows to measure a large class of organic materials. A low-temperature EL spectrum is presented for N,N'-bis(3-methylphenyl)-N,N'-diphenyl-[1,1'-biphenyl]-4,4'-diamine (TPD) in a 3-phenyl-4-(1‘-naphthyl)-5-phenyl-1,2,4-triazole (TAZ) matrix (TPD/TAZ 1:3) at 77 K. Triplet emission is only observed at very low charge carrier density (0.5 μA/mm2). Quenching processes are analyzed using combined EL and PL measurements and unipolar devices. Two factors can be the cause of the quenching: A strong quenching based on a low concentration of electrically activated impurities could explain the dependency. The other explanation points to a quenching based on electrons in the emitting layer. This might be explained with triplet-polaron quenching (TPQ). TPQ is proportional to the charge carrier density and contributes the dominant part to the quenching at low current densities.

1973 ◽  
Vol 51 (13) ◽  
pp. 1438-1442
Author(s):  
S. B. Joshi ◽  
V. T. Chiplonkar

The spatial distribution of the charge carrier density in aglow discharge plasma of air and argon has been obtained by a double probe measurement and is shown to conform with the theoretical expectations, with appropriate modifications.


1999 ◽  
Vol 163 (4-6) ◽  
pp. 212-216
Author(s):  
S.X. Dou ◽  
Juntae Kim ◽  
Seungwoo Yi ◽  
Jaichul Yi ◽  
Sungdo Cha ◽  
...  

Author(s):  
Guillaume Celi ◽  
Sylvain Dudit ◽  
Thierry Parrassin ◽  
Philippe Perdu ◽  
Antoine Reverdy ◽  
...  

Abstract For Very Deep submicron Technologies, techniques based on the analysis of reflected laser beam properties are widely used. The Laser Voltage Imaging (LVI) technique, introduced in 2009, allows mapping frequencies through the backside of integrated circuit. In this paper, we propose a new technique based on the LVI technique to debug a scan chain related issue. We describe the method to use LVI, usually dedicated to frequency mapping of digital active parts, in a way that enables localization of resistive leakage. Origin of this signal is investigated on a 40nm case study. This signal can be properly understood when two different effects, charge carrier density variations (LVI) and thermo reflectance effect (Thermal Frequency Imaging, TFI), are taken into account.


ACS Omega ◽  
2018 ◽  
Vol 3 (11) ◽  
pp. 16328-16337 ◽  
Author(s):  
Stanley Bram ◽  
Matthew N. Gordon ◽  
Michael A. Carbonell ◽  
Maren Pink ◽  
Barry D. Stein ◽  
...  

2020 ◽  
Vol 693 ◽  
pp. 137689
Author(s):  
S. Abhirami ◽  
Shilpam Sharma ◽  
E.P. Amaladass ◽  
R. Rajitha ◽  
P. Magudapathy ◽  
...  

2019 ◽  
Vol 3 (1) ◽  
Author(s):  
János Pető ◽  
Gergely Dobrik ◽  
Gergő Kukucska ◽  
Péter Vancsó ◽  
Antal A. Koós ◽  
...  

Abstract MoS2 single layers are valued for their sizeable direct bandgap at the heart of the envisaged electronic and optoelectronic applications. Here we experimentally demonstrate that moderate strain values (~2%) can already trigger an indirect bandgap transition and induce a finite charge carrier density in 2D MoS2 layers. A conclusive proof of the direct-to-indirect bandgap transition is provided by directly comparing the electronic and optical bandgaps of strained MoS2 single layers obtained from tunneling spectroscopy and photoluminescence measurements of MoS2 nanobubbles. Upon 2% biaxial tensile strain, the electronic gap becomes significantly smaller (1.45 ± 0.15 eV) than the optical direct gap (1.73 ± 0.1 eV), clearly evidencing a strain-induced direct to indirect bandgap transition. Moreover, the Fermi level can shift inside the conduction band already in moderately strained (~2%) MoS2 single layers conferring them a metallic character.


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