Direct Observation of Friction at the Atomic Scale

1988 ◽  
Vol 119 ◽  
Author(s):  
Gary M. McClelland ◽  
C. Mathew Mate ◽  
Ragnar Erlandsson ◽  
Shirley Chiang
Keyword(s):  
Atomic Force Microscope ◽  
Direct Observation ◽  
Frictional Force ◽  
Basal Plane ◽  
Graphite Surface ◽  
Atomic Scale ◽  
Atomic Force ◽  
Tungsten Tip

AbstractAn atomic force microscope has been used to measure the frictional force on a tungsten tip sliding across the basal plane of graphite at low loads < 10-4 N. The frictional force displays the 2.5 Å periodicity of the graphite surface.

Slip Length Measurement of Water Flow on Graphite Surface Using Atomic Force Microscope

2014 ◽  
Vol 941-944 ◽  
pp. 1581-1584 ◽  
Author(s):  
Da Yong Li ◽  
Da Lei Jing ◽  
Yun Lu Pan ◽  
Khurshid Ahmad ◽  
Xue Zeng Zhao
Keyword(s):  
Atomic Force Microscope ◽  
Water Flow ◽  
Drag Force ◽  
Silicon Surface ◽  
Slip Length ◽  
Graphite Surface ◽  
Length Measurement ◽  
Hydrodynamic Drag ◽  
Experimental Measurements ◽  
Atomic Force

In this paper, we present experimental measurements of slip length of deionized (DI) water flow on a silicon surface and a graphite surface by using atomic force microscope. The results show that the measured hydrodynamic drag force is higher on silicon surface than that on graphite surface, and a measured slip length about 10 nm is obtained on the later surface.

Modelling atomic scale manipulation with the non-contact atomic force microscope

2006 ◽  
Vol 17 (23) ◽  
pp. 5866-5874 ◽  
Author(s):  
T Trevethan ◽  
M Watkins ◽  
L N Kantorovich ◽  
A L Shluger ◽  
J Polesel-Maris ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Scale ◽  
Atomic Force

Direct Observation of Domain Structures in Triglycine Sulfate by Atomic Force Microscope

1994 ◽  
Vol 33 (Part 1, No. 3A) ◽  
pp. 1390-1393 ◽  
Author(s):  
Min-Kun Bae ◽  
Toshihisa Horiuchi ◽  
Kazuhiro Hara ◽  
Yoshihiro Ishibashi ◽  
Kazumi Matsushige
Keyword(s):  
Atomic Force Microscope ◽  
Direct Observation ◽  
Triglycine Sulfate ◽  
Domain Structures ◽  
Atomic Force

Atomic-scale electric capacitive change detected with a charge amplifier installed in a non-contact atomic force microscope

2016 ◽  
Vol 9 (4) ◽  
pp. 046601 ◽  
Author(s):  
Makoto Nogami ◽  
Akira Sasahara ◽  
Toyoko Arai ◽  
Masahiko Tomitori
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Scale ◽  
Charge Amplifier ◽  
Atomic Force ◽  
A Charge

scholarly journals Atomic Resolution with the Atomic Force Microscope

1995 ◽  
Vol 3 (4) ◽  
pp. 6-7
Author(s):  
Stephen W. Carmichael
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Atomic Force Microscope ◽  
Recent Article ◽  
Atomic Scale ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force

For biologic studies, atomic force microscopy (AFM) has been prevailing over scanning tunneling microscopy (STM) because it has the capability of imaging non-conducting biologic specimens. However, STM generally gives better resolution than AFM, and we're talking about resolution on the atomic scale. In a recent article, Franz Giessibl (Atomic resolution of the silicon (111)- (7X7) surface by atomic force microscopy, Science 267:68-71, 1995) has demonstrated that atoms can be imaged by AFM.

A comparison of dynamic atomic force microscope set-ups for performing atomic scale manipulation experiments

2007 ◽  
Vol 18 (34) ◽  
pp. 345503 ◽  
Author(s):  
T Trevethan ◽  
M Watkins ◽  
A L Shluger ◽  
J Polesel-Maris ◽  
S Gauthier ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Scale ◽  
Atomic Force

Direct monitoring of equilibrium protein folding–unfolding by atomic force microscopy: pushing the limit

2019 ◽  
Vol 55 (86) ◽  
pp. 12920-12923 ◽  
Author(s):  
Adam Xiao ◽  
Hongbin Li
Keyword(s):  
Atomic Force Microscopy ◽  
Protein Folding ◽  
Atomic Force Microscope ◽  
Direct Observation ◽  
Force Microscopy ◽  
Helix Bundle ◽  
Atomic Force ◽  
Bundle Protein

We report the direct observation of equilibrium folding–unfolding dynamics of a mechanically labile, three helix bundle protein GA using a commercial atomic force microscope (AFM).

Direct observation of the polymer and monomer Langmuir–Blodgett films with the atomic force microscope

1999 ◽  
Vol 349 (1-2) ◽  
pp. 250-253 ◽  
Author(s):  
Pu Qian ◽  
Hiroshi Nanjo ◽  
Norio Sanada ◽  
Toshiro Yokoyama ◽  
Osamu Itabashi ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Direct Observation ◽  
Langmuir Blodgett ◽  
Atomic Force ◽  
Langmuir Blodgett Films

Grains Observation Using FIB Anisotropic Etch Followed by AFM Imaging

1996 ◽  
Author(s):  
H. Yamashita ◽  
Y. Hata
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
Conventional Technique ◽  
Wet Etching ◽  
Atomic Scale ◽  
Atomic Force ◽  
Afm Imaging ◽  
Al Thin Film ◽  
Anisotropic Etch ◽  
Afm Observation

Abstract It is becoming more important to observe structures and failed sites in LSIs. An atomic force microscope (AFM) can obtain atomic scale topographic images on sample surfaces. To analyze failures in LSIs, several treatments for the AFM observation, such as wet etching and mechanical polishing for a crosssectional imaging, have been proposed so far. A good correlation of AFM images using FIB anisotropic etch with those acquired by conventional technique such as SIM and TEM has been demonstrated A crystallographic information about Al thin film is obtained by AFM using this technique.

Nanotribology Properties and Microscopic Interfacial Frictional Behavior Studied by Atomic Force Microscopy

2011 ◽  
Vol 230-232 ◽  
pp. 639-643
Author(s):  
Hsiang Chen Hsu ◽  
Li Ming Chu
Keyword(s):  
Atomic Force Microscopy ◽  
Frictional Force ◽  
Friction Stress ◽  
Local Variation ◽  
Atomic Scale ◽  
Displacement Curve ◽  
Force Microscopy ◽  
Frictional Behavior ◽  
Atomic Force ◽  
Force Displacement

This paper deals with the description of a method for the measurement of the nanotribology properties and microscopic interfacial frictional behavior with Atomic Force Microscopy (AFM). AFM force-displacement curve is utilized to determine the nanotribology properties. The interfacial coefficient of frictional force can be derived from a serial of calculations. A well-defined contact area is measured to study the frictional force and friction stress. The roughness of contact surface influences the contact between friction and surface forces. The study of roughness parameters corresponds to evaluate the friction and the interfacial strengths. Local variation in micro/nano tribology is also measured. The measured surface topography (3D profiles) are then applied to determinate the potential energy in molecular dynamic (MD) method to study the atomic scale frictional interactions.

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