Slip Length Measurement of Water Flow on Graphite Surface Using Atomic Force Microscope

In this paper, we present experimental measurements of slip length of deionized (DI) water flow on a silicon surface and a graphite surface by using atomic force microscope. The results show that the measured hydrodynamic drag force is higher on silicon surface than that on graphite surface, and a measured slip length about 10 nm is obtained on the later surface.

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Effect of Solvent and Dopant on Poly(3,4-ethylenedioxythiophene) Thin Films by Atomic Force Microscope Lithography

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2008.ic06 ◽

2008 ◽

Vol 8 (9) ◽

pp. 4757-4760 ◽

Cited By ~ 1

Author(s):

Yong-il Kim ◽

Hyunsook Kim ◽

Haiwon Lee

Keyword(s):

Thin Films ◽

Conducting Polymers ◽

Atomic Force Microscope ◽

Organic Solvents ◽

Silicon Surface ◽

Silicon Oxide ◽

Organic Thin Films ◽

Effect Of Solvent ◽

Aspect Ratios ◽

Atomic Force

AMF anodization lithography was performed on organic thin films with conducting polymers which is poly(3,4-ethylenedioxythiophene). The conductivity of PEDOT thin films was changed by different dopants and organic solvents. Two different dopants are poly(4-styrenesulfonate) and di(2-ethylhexyl)-sulfosuccinate. Also, DMF and IPA were used to prepare the PEDOT thin films doped with PSS and DEHS on silicon surface. The conductivities of these PEDOT variants were compared by obtaining their I–V curves between tip and thin films using AFM. Silicon oxide nanopatterns with higher aspect ratios can be obtained from the films with higher conductivity.

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Hydrodynamic drag-force measurement and slip length on microstructured surfaces

Physical Review E ◽

10.1103/physreve.85.066310 ◽

2012 ◽

Vol 85 (6) ◽

Cited By ~ 26

Author(s):

A. Maali ◽

Y. Pan ◽

B. Bhushan ◽

E. Charlaix

Keyword(s):

Drag Force ◽

Force Measurement ◽

Slip Length ◽

Hydrodynamic Drag ◽

Microstructured Surfaces

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Dual unit scanning tunneling microscope-atomic force microscope for length measurement based on reference scales

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.589408 ◽

1997 ◽

Vol 15 (4) ◽

pp. 780 ◽

Cited By ~ 6

Author(s):

Haijun Zhang

Keyword(s):

Atomic Force Microscope ◽

Scanning Tunneling Microscope ◽

Length Measurement ◽

Scanning Tunneling ◽

Tunneling Microscope ◽

Atomic Force

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Investigating pore-forming peptides using the atomic force microscope

10.32469/10355/70030 ◽

2019 ◽

Author(s):

◽

Anna Elizabeth Pittman

Keyword(s):

Atomic Force Microscope ◽

Focused Ion Beam ◽

Ion Beam ◽

Temporal Stability ◽

Force Spectroscopy ◽

Hydrodynamic Drag ◽

Gold Coating ◽

Cross Sectional ◽

Lipid Interactions ◽

Atomic Force

In my projects, I used the Atomic Force Microscope (AFM) to image the effects of pore-forming peptides and I used the Focused Ion Beam (FIB) to modify AFM cantilevers to increase the precision of force spectroscopy measurements. ... Another way to investigate peptide-lipid interactions is to perform force spectroscopy experiments using the AFM. In order to lower drift and increase force precision, I used a FIB to modify commercially available AFM cantilevers. By reducing the cross sectional area of the cantilever, the hydrodynamic drag was reduced, thus increasing the force precision. Removing most of the gold coating on the cantilever increased the temporal stability. These modified cantilevers have already been put to use in the lab to measure peptide-lipid interactions.

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Numerical study of the hydrodynamic drag force in atomic force microscopy measurements undertaken in fluids

Micron ◽

10.1016/j.micron.2014.05.004 ◽

2014 ◽

Vol 66 ◽

pp. 37-46 ◽

Cited By ~ 6

Author(s):

J.V. Méndez-Méndez ◽

M.T. Alonso-Rasgado ◽

E. Correia Faria ◽

E.A. Flores-Johnson ◽

R.D. Snook

Keyword(s):

Atomic Force Microscopy ◽

Drag Force ◽

Numerical Study ◽

Hydrodynamic Drag ◽

Force Microscopy ◽

Atomic Force

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Atomic force microscope using a diamond tip: a tool for micro/nanomachining on single-crystal silicon surface

10.1117/12.444691 ◽

2001 ◽

Cited By ~ 2

Author(s):

Qingliang Zhao ◽

Tao Sun ◽

Ying-Chun Liang ◽

Shen Dong ◽

Mingjun Chen

Keyword(s):

Single Crystal ◽

Atomic Force Microscope ◽

Silicon Surface ◽

Single Crystal Silicon ◽

Crystal Silicon ◽

Atomic Force

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Solvation forces near a graphite surface measured with an atomic force microscope

Applied Physics Letters ◽

10.1063/1.107024 ◽

1992 ◽

Vol 60 (19) ◽

pp. 2356-2358 ◽

Cited By ~ 107

Author(s):

S. J. O’Shea ◽

M. E. Welland ◽

T. Rayment

Keyword(s):

Atomic Force Microscope ◽

Graphite Surface ◽

Atomic Force ◽

Solvation Forces

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Tilt of Atomic Force Microscope Cantilevers: Effect on Friction Measurements

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.353-358.742 ◽

2007 ◽

Vol 353-358 ◽

pp. 742-745

Author(s):

Fei Wang ◽

Xue Zeng Zhao

Keyword(s):

Friction Coefficient ◽

Atomic Force Microscope ◽

Tilt Angle ◽

Silicon Surface ◽

Theoretical Study ◽

Atomic Force ◽

Afm Tips ◽

Variation Range ◽

Frictional Forces ◽

Friction Measurements

The cantilevers of atomic force microscope (AFM) are mounted under a certain tilt angle, which is commonly assumed to have negligible effect on friction measurements in AFM. We present a theoretical study of the effect of the tilt angle on AFM based friction measurements. A method for correcting the friction coefficient between sample surfaces and AFM tips is also presented to minimize the effects of the tilt. The frictional forces between a silicon tip and a silicon surface at tilt angles ranging from 5 degrees to 25 degrees were measured. The results show that the measured friction coefficient increases with the tilt angle effectively, whereas the variation range of the corrected friction coefficient is within 10%.

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