The Electronic Structure pf Σ5 Grain Boundaries in CU
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ABSTRACTWe present first-principles calculations of the densities of states (DOS's) of unrelaxed and relaxed twist and tilt grain boundaries (GB's) in Cu. The relaxed configurations were obtained through the use of the Embedded Atom Method (EAM), while the DOS's were calculated using the real-space multiplescattering theory (RSMST) approach recently introduced in the literature. The DOS's of GB's are compared against those of bulk materials as well as against one another. Although the RSMST calculations are still not self-consistent, these comparisons allow us to verify certain expected trends in the DOS's, and to verify the usefulness and reliability of our method.
1990 ◽
Vol 51
(C1)
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pp. C1-335-C1-340
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2011 ◽
Vol 320
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pp. 415-420
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1999 ◽
Vol 13
(04)
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pp. 389-396
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Electronic Structure and X-ray Absorption Spectra of Rutile TiO2 Using First-Principles Calculations
2014 ◽
Vol 52
(12)
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pp. 1025-1029
Keyword(s):
X Ray
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2019 ◽
Vol 7
(9)
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pp. 4971-4976
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