Amorphization of PLZT Material by 1.5 MeV Krypton Ion Irradiation with In Situ TEM Observation
Keyword(s):
ABSTRACTPLZT 9/65/35 single crystals were irradiated with 1.5 MeV krypton ions at 25–450°C in the HVEM-Tandem Facility at Argonne National Laboratory. In-situ TEM was performed during irradiation in order to determine the critical amorphization dose. At room temperature, the material was completely amorphized after a dose of only 1.9×1014 ions/cm2, less than one fifth of the critical amorphization dose for silicon (1×1015 ions/cm2). The critical amorphization dose for the PLZT material increased with increasing irradiation temperature. At 450°C, amorphization was not observed after a dose of 1.1×10 15ions/cm2.
1990 ◽
Vol 48
(4)
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pp. 536-537
1989 ◽
Vol 47
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pp. 652-653
1996 ◽
Vol 54
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pp. 722-723