Microstructural Evolution and Stress Relaxation in Sputtered Tungsten Films

1993 ◽  
Vol 318 ◽  
Author(s):  
F. M. Ross ◽  
R. R. Kola ◽  
R. Hull ◽  
J. C. Bean
Keyword(s):  
Electron Microscope ◽  
Stress Relaxation ◽  
Microstructural Evolution ◽  
Transmission Electron Microscope ◽  
Specimen Geometry ◽  
Β Phase ◽  
Transmission Electron ◽  
The Relationship

ABSTRACTWe have investigated the relationship between microstructure and stress in very thin sputtered W films. We discuss features of the microstructure, in particular the presence of voids in compressively stressed films, in terms of the evolution of the structure from a metastable β-phase. By developing a novel specimen geometry for the transmission electron microscope (TEM), we present dynamic observations of the β-W→α-W transformation.

Zygospores of the Harpellales: an ultrastructural study

1977 ◽  
Vol 55 (24) ◽  
pp. 3099-3110 ◽  
Author(s):  
S. T. Moss ◽  
R. W. Lichtwardt
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Ultrastructural Study ◽  
Storage Materials ◽  
Transmission Electron ◽  
Relationship Of ◽  
The Relationship ◽  
Thickened Wall

Structure of zygospores, their zygosporophores, and conjugants in Harpella melusinae, Trichozygospora chironomidarum, Genistellospora homothallica, and Zygopolaris ephemeridarum is described from light and transmission electron microscope studies. Possession of a thickened wall, presence of storage materials, and formation after hyphal conjugation supports the interpretation of these as zygospores. The relationship of the harpellaceous zygospores to those of other members of the Zygomycotina is discussed.

Radiation Effects in Zircon, Hafnon, and Thorite: Implications for Pu Disposal

1998 ◽  
Vol 540 ◽  
Author(s):  
A. Meldrum ◽  
S.J. Zinkle ◽  
L.A. Boatner ◽  
M. Wu ◽  
R. Mu ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Optical Absorption ◽  
Single Crystal ◽  
Microstructural Evolution ◽  
Transmission Electron Microscope ◽  
Nd:Yag Laser ◽  
Radiation Effects ◽  
New Model ◽  
Transmission Electron

AbstractSynthetic ZrSiO4, HfSiO4, and ThSiO4 single-crystal specimens were irradiated by 800 keV Kr+ ions, and the microstructural evolution was observed in-situ in a transmission electron microscope. All three compounds were found to become amorphous up to temperatures in excess of 600°C. Using a new model, the activation energies for annealing were found to be in the range of 3.1 to 3.6 eV for these compounds. At temperatures above 600°C, the orthosilicates were observed to decompose into the component oxides (e.g., tetragonal ZrO2 + amorphous SiO2 in the case of zircon). A single-crystal zircon specimen was also irradiated with a pulsed picosecond Nd:YAG laser operated at 355 nm, and the resulting microstructure was investigated by optical absorption, SEM, AFM, and TEM techniques.

The flagellar apparatus in zoospores of Phytophthora, Pythium, and Halophytophthora

1992 ◽  
Vol 70 (11) ◽  
pp. 2163-2169 ◽  
Author(s):  
D. J. S. Barr ◽  
N. L. Désaulniers
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Flagellar Apparatus ◽  
Posterior Root ◽  
Transmission Electron ◽  
Structure Morphology ◽  
Cytoplasmic Microtubules ◽  
Relationship Of ◽  
The Relationship

The flagellar apparatuses of 14 species of Phytophthora, 2 of Halophytophthora, and 4 of Pythium are compared in the transmission electron microscope. Except for Phytophthora infestans and Phytophthora mirabilis there were no significant differences in fine structure morphology. There are six flagellar roots: a ribbed triplet consisting of three main microtubules and secondary microtubules; an anterior doublet; a multistranded, band-shaped root of five to nine microtubules; a posterior root of two to four microtubules; and roots consisting of arrays of cytoplasmic microtubules and nuclear-associated microtubules. In P. infestans and P. mirabilis the multistranded root is missing, the posterior root contains five or six microtubules, and the anterior ribbed root contains four main microtubules. The transitional zones in all species are similar. The relationship of the Pythiaceae with other Oomycetes is discussed. Key words: taxonomy, phytogeny, cytology, Oomycetes, Pythiaceae.

HRTEM Observation of the Age Hardening Precipitates in Mg-Gd-Sc Alloys, with Different Gd Concentrations

2011 ◽  
Vol 409 ◽  
pp. 335-338
Author(s):  
Takafumi Fujii ◽  
Kenji Matsuda ◽  
Tokimasa Kawabata ◽  
Susumu Ikeno
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Age Hardening ◽  
Number Density ◽  
Maximum Hardness ◽  
Β Phase ◽  
Transmission Electron ◽  
Hrtem Observation

High resolution transmission electron microscope (HRTEM) observations were performed to investigate the age hardening precipitates in Mg-Gd-Sc alloys. The maximum hardness of these alloys increased with Gd content. The precipitates with the features of β” phase and β’ phase in Mg-Gd alloy were observed in Mg-15Gd-6.4Sc and Mg-10Gd-6.4Sc alloys. Maximum hardness and number density of precipitate in Mg-15Gd-6.4Sc alloy were higher than that in Mg-10Gd-6.4Sc alloy, and the finer precipitates with higher number of density were contributed to the maximum hardness in Mg-Gd-Sc alloys.

A Reproducible Selective Stain for Cardiac Sarcoplasmic Reticulum

1974 ◽  
Vol 32 ◽  
pp. 214-215
Author(s):  
R. A. Waugh ◽  
J. R. Sommer
Keyword(s):  
Complex System ◽  
Electron Microscope ◽  
Sarcoplasmic Reticulum ◽  
Transmission Electron Microscope ◽  
Electron Microscopic ◽  
Cardiac Sarcoplasmic Reticulum ◽  
Transmission Electron

Cardiac sarcoplasmic reticulum (SR) is a complex system of intracellular tubules that, due to their small size and juxtaposition to such electron-dense structures as mitochondria and myofibrils, are often inconspicuous in conventionally prepared electron microscopic material. This study reports a method with which the SR is selectively “stained” which facilitates visualizationwith the transmission electron microscope.

Surface Structure of the Spores of Glugea Weissenbergi

1969 ◽  
Vol 27 ◽  
pp. 238-239
Author(s):  
Sanford H. Vernick ◽  
Anastasios Tousimis ◽  
Victor Sprague
Keyword(s):  
Electron Microscope ◽  
Surface Structure ◽  
Transmission Electron Microscope ◽  
Mature Spore ◽  
Spore Surface ◽  
Sectioned Material ◽  
Transmission Electron ◽  
Surface Detail

Recent electron microscope studies have greatly expanded our knowledge of the structure of the Microsporida, particularly of the developing and mature spore. Since these studies involved mainly sectioned material, they have revealed much internal detail of the spores but relatively little surface detail. This report concerns observations on the spore surface by means of the transmission electron microscope.

A New High Resolution Transmission Electron Microscope with Second-Zone Objective Lens

1969 ◽  
Vol 27 ◽  
pp. 176-177 ◽  
Author(s):  
H. Tochigi ◽  
H. Uchida ◽  
S. Shirai ◽  
K. Akashi ◽  
D. J. Evins ◽  
...  
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Objective Lens ◽  
High Excitation ◽  
Transmission Electron ◽  
New Instrument

A New High Excitation Objective Lens (Second-Zone Objective Lens) was discussed at Twenty-Sixth Annual EMSA Meeting. A new commercially available Transmission Electron Microscope incorporating this new lens has been completed.Major advantages of the new instrument allow an extremely small beam to be produced on the specimen plane which minimizes specimen beam damages, reduces contamination and drift.

X-ray microanalysis of thin specimens in the transmission electron microscope at voltages up to 1000 Kv.

1978 ◽  
Vol 36 (1) ◽  
pp. 540-541
Author(s):  
G. Cliff ◽  
M.J. Nasir ◽  
G.W. Lorimer ◽  
N. Ridley
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Weight Fraction ◽  
Present Series ◽  
Constant Independent ◽  
X Ray ◽  
Transmission Electron ◽  
Series Of Experiments ◽  
Image Position ◽  
X Ray Absorption

In a specimen which is transmission thin to 100 kV electrons - a sample in which X-ray absorption is so insignificant that it can be neglected and where fluorescence effects can generally be ignored (1,2) - a ratio of characteristic X-ray intensities, I1/I2 can be converted into a weight fraction ratio, C1/C2, using the equationwhere k12 is, at a given voltage, a constant independent of composition or thickness, k12 values can be determined experimentally from thin standards (3) or calculated (4,6). Both experimental and calculated k12 values have been obtained for K(11<Z>19),kα(Z>19) and some Lα radiation (3,6) at 100 kV. The object of the present series of experiments was to experimentally determine k12 values at voltages between 200 and 1000 kV and to compare these with calculated values.The experiments were carried out on an AEI-EM7 HVEM fitted with an energy dispersive X-ray detector.

Aspects of microanalysis in a transmission electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 510-511
Author(s):  
R. Sinclair ◽  
B.E. Jacobson
Keyword(s):  
Grain Size ◽  
Electron Beam ◽  
Electron Microscope ◽  
Chemical Analysis ◽  
Transmission Electron Microscope ◽  
Vapor Deposition ◽  
Critical Currents ◽  
X Ray ◽  
Fine Grain ◽  
Transmission Electron

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).

The direct determination of magnetic domain wall profiles using a split detector STEM

1978 ◽  
Vol 36 (1) ◽  
pp. 466-467
Author(s):  
J.N. Chapman ◽  
P.E. Batson ◽  
E.M. Waddell ◽  
R.P. Ferrier
Keyword(s):  
Electron Microscope ◽  
Domain Wall ◽  
Transmission Electron Microscope ◽  
Domain Walls ◽  
Photographic Plate ◽  
Magnetic Domain ◽  
Direct Determination ◽  
Quantitative Information ◽  
Scanning Transmission Electron Microscope ◽  
Transmission Electron

By far the most commonly used mode of Lorentz microscopy in the examination of ferromagnetic thin films is the Fresnel or defocus mode. Use of this mode in the conventional transmission electron microscope (CTEM) is straightforward and immediately reveals the existence of all domain walls present. However, if such quantitative information as the domain wall profile is required, the technique suffers from several disadvantages. These include the inability to directly observe fine image detail on the viewing screen because of the stringent illumination coherence requirements, the difficulty of accurately translating part of a photographic plate into quantitative electron intensity data, and, perhaps most severe, the difficulty of interpreting this data. One solution to the first-named problem is to use a CTEM equipped with a field emission gun (FEG) (Inoue, Harada and Yamamoto 1977) whilst a second is to use the equivalent mode of image formation in a scanning transmission electron microscope (STEM) (Chapman, Batson, Waddell, Ferrier and Craven 1977), a technique which largely overcomes the second-named problem as well.

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