Direct Comparison of Structural and Electrical Properties of Epitaxial (001)-, (116)-, and (103)-Oriented SrBi2Ta2O9 Thin Films on SrTiO3 and Silicon Substrates

AbstractAnisotropies of the properties of the bismuth-layered perovskite SrBi2Ta2O9 (SBT) have been investigated using epitaxial thin films grown by pulsed laser deposition both on conducting Nb-doped SrTiO3 (STO) single crystal substrates and on Si(100) substrates. It has been found that the three-dimensional epitaxy relationship SBT(001)∥STO(001); SBT [110] ∥STO[100] can be applied to all SBT thin films on STO substrates of (001), (011), and (111) orientations. An about 1.7 times larger remanent polarization was obtained in (103)-oriented SBT films than in that of (116) orientation, while the (001)-oriented SBT films revealed no ferroelectricity along their c-axis. Non-c-axis-oriented SBT films with a well-defined (116) orientation were also grown on silicon substrates for the first time. They were deposited on Si(100) covered with a conducting SrRuO3 (110) bottom electrode on a YSZ(100) buffer layer.

Download Full-text

Structural and electrical properties of lanthanum copper oxide epitaxial thin films with different domain morphologies

CrystEngComm ◽

10.1039/c8ce00777b ◽

2018 ◽

Vol 20 (34) ◽

pp. 5012-5016 ◽

Cited By ~ 1

Author(s):

Tomoya Onozuka ◽

Akira Chikamatsu ◽

Yasushi Hirose ◽

Tetsuya Hasegawa

Keyword(s):

Thin Films ◽

Electrical Properties ◽

Copper Oxide ◽

Pulsed Laser Deposition ◽

Pulsed Laser ◽

Laser Deposition ◽

Epitaxial Thin Films ◽

Lanthanum Copper Oxide ◽

Structural And Electrical Properties

Herein, we investigated the domain morphologies of defect-perovskite LaCuOx (2.5 ≤ x ≤ 3.0) thin films grown on cubic SrTiO3 (100) and orthorhombic NdGaO3 (110) substrates by pulsed-laser deposition.

Download Full-text

Growth, characterization, and electrical properties of PbZr0.52Ti0.48O3 thin films on buffered silicon substrates using pulsed laser deposition

Journal of Materials Research ◽

10.1557/jmr.2003.0016 ◽

2003 ◽

Vol 18 (1) ◽

pp. 111-114 ◽

Cited By ~ 11

Author(s):

Walter M. Gilmore ◽

Soma Chattopadhyay ◽

Alex Kvit ◽

A. K. Sharma ◽

C. B. Lee ◽

...

Keyword(s):

Thin Films ◽

Pulsed Laser Deposition ◽

Pulsed Laser ◽

Laser Deposition ◽

Silicon Substrates ◽

Epitaxial Thin Films ◽

Deposition Parameters ◽

Growth Characterization ◽

Transmission Electron ◽

Ag Electrodes

Epitaxial thin films of PbZr0.52Ti0.48O3 (PZT) were synthesized successfully on SrRuO3/SrTiO3/MgO/TiN/Si heterostructures by pulsed laser deposition. The films were single phase and had (001) orientation. The deposition parameters were varied to obtain the best epitaxial layer for each of the compounds. Transmission electron microscopy indicated good epitaxy for the entire heterostructure and sharp interfaces between the epilayers. Dielectric and P–E hysteresis loop measurements were carried out with evaporated Ag electrodes. The dielectric constant for the films was found to be between 400–450. The value of saturation polarization Ps was between 55–60 μC/cm2, and the coercive field Ec varied from 60–70 kV/cm. Integration of PZT films with silicon will be useful for future memory and micromechanical devices.

Download Full-text

Low-energy femtosecond pulsed laser deposition of cerium (IV) oxide thin films on silicon substrates

Journal of Crystal Growth ◽

10.1016/j.jcrysgro.2021.126323 ◽

2021 ◽

pp. 126323

Author(s):

Joseph A. De Mesa ◽

Angelo P. Rillera ◽

Melvin John F. Empizo ◽

Nobuhiko Sarukura ◽

Roland V. Sarmago ◽

...

Keyword(s):

Thin Films ◽

Pulsed Laser Deposition ◽

Pulsed Laser ◽

Low Energy ◽

Laser Deposition ◽

Silicon Substrates ◽

Oxide Thin Films ◽

Femtosecond Pulsed Laser

Download Full-text

TbMnO3 epitaxial thin films by pulsed-laser deposition

Solid State Communications ◽

10.1016/j.ssc.2005.01.002 ◽

2005 ◽

Vol 133 (10) ◽

pp. 641-645 ◽

Cited By ~ 36

Author(s):

Yimin Cui ◽

Chunchang Wang ◽

Bisong Cao

Keyword(s):

Thin Films ◽

Pulsed Laser Deposition ◽

Pulsed Laser ◽

Laser Deposition ◽

Epitaxial Thin Films

Download Full-text

Ferroelectric Properties and Microstructures of Bi4-xDyxTi3O12 Thin Films

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.633.378 ◽

2014 ◽

Vol 633 ◽

pp. 378-381

Author(s):

Bei Li ◽

X.B. Liu ◽

M. Chen ◽

X.A. Mei

Keyword(s):

Thin Films ◽

Electrical Properties ◽

Layered Structure ◽

Remanent Polarization ◽

Single Phase ◽

Ferroelectric Properties ◽

Pulsed Laser ◽

Laser Deposition ◽

Deposition Technique ◽

Si Substrates

Dy-doped Bi4Ti3O12 thin films were fabricated on Pt/Ti/SiO2/Si substrates by pulsed laser deposition technique, and the structures and electrical properties of the films were investigated. XRD results indicated that all of Bi4-xDyxTi3O12 films consisted of single phase of a bismuth-layered structure with well-developed rod-like grains. The remanent polarization ( Pr ) and coercive field (Ec) of the Bi4-xDyxTi3O12 Film with x=0.75 were 25μC/cm2 and 85KV/cm , respectively.

Download Full-text

Y(Ni, Mn)O3 epitaxial thin films prepared by pulsed laser deposition

phys stat sol (a) ◽

10.1002/pssa.200304911 ◽

2004 ◽

Vol 201 (10) ◽

pp. 2385-2389 ◽

Cited By ~ 5

Author(s):

Yanwei Ma ◽

M. Guilloux-Viry ◽

O. Pena ◽

C. Moure

Keyword(s):

Thin Films ◽

Pulsed Laser Deposition ◽

Pulsed Laser ◽

Laser Deposition ◽

Epitaxial Thin Films

Download Full-text

Structural and electrical properties of 0.1BiYbO3–0.9PbTiO3 piezoelectric thin films grown by pulsed laser deposition

Ceramics International ◽

10.1016/j.ceramint.2015.03.198 ◽

2015 ◽

Vol 41 ◽

pp. S202-S205 ◽

Cited By ~ 1

Author(s):

Yajian Li ◽

Peng Shi ◽

Xiaoqing Wu ◽

Wei Ren

Keyword(s):

Thin Films ◽

Electrical Properties ◽

Pulsed Laser Deposition ◽

Pulsed Laser ◽

Laser Deposition ◽

Piezoelectric Thin Films ◽

Structural And Electrical Properties

Download Full-text

Effects of Tb doping on structural and electrical properties of 47(Ba0.7Ca0.3)TiO3–0.53Ba(Zr0.2Ti0.8)O3 thin films at various annealing temperature by pulsed laser deposition

Ceramics International ◽

10.1016/j.ceramint.2018.01.051 ◽

2018 ◽

Vol 44 (6) ◽

pp. 6514-6519 ◽

Cited By ~ 4

Author(s):

Haowei Lu ◽

Lizhu Liu ◽

Jiaqi Lin ◽

Wenlong Yang ◽

Ling Weng ◽

...

Keyword(s):

Thin Films ◽

Electrical Properties ◽

Pulsed Laser Deposition ◽

Annealing Temperature ◽

Pulsed Laser ◽

Laser Deposition ◽

Structural And Electrical Properties

Download Full-text

Large thermoelectric power variations in epitaxial thin films of layered perovskite GdBaCo2O5.5±δ with a different preferred orientation and strain

Journal of Materials Chemistry A ◽

10.1039/d0ta04781c ◽

2020 ◽

Vol 8 (38) ◽

pp. 19975-19983

Author(s):

Arindom Chatterjee ◽

Emigdio Chavez-Angel ◽

Belén Ballesteros ◽

José Manuel Caicedo ◽

Jessica Padilla-Pantoja ◽

...

Keyword(s):

Thin Films ◽

Thermoelectric Power ◽

Thermoelectric Properties ◽

Tensile Strain ◽

Preferred Orientation ◽

Oxygen Stoichiometry ◽

Layered Perovskite ◽

Epitaxial Thin Films ◽

P Type

Oxygen stoichiometry in epitaxial GdBaCo2O5.5±δ films accommodates the strain, which substantially affects thermoelectric properties, bringing the material from p-type (tensile strain c⊥-oriented on STO) to n-type thermopower (compressive b⊥ on LAO).

Download Full-text