Structural Properties of Microcrystalline Si Solar Cells

2001 ◽  
Vol 664 ◽  
Author(s):  
M. Luysberg ◽  
C. Scholten ◽  
L. Houben ◽  
R. Carius ◽  
F. Finger ◽  
...  

ABSTRACTThe structural properties of nip-µc-Si:H solar cells are investigated by transmission electron microscopy, X-ray diffraction and Raman spectroscopy. Different structural compositions are obtained by variation of the gas mixture during preparation by plasma enhanced chemical vapour deposition. Nucleation and growth of the n-layer onto textured TCO substrate was found to be similar to the growth on glass substrates. The growth of the i-layer follows a local epitaxy. This implies that the structure of the n-layer is of special importance regarding the control of the microstructure in microcrystalline Si nip solar cells.

2010 ◽  
Vol 97-101 ◽  
pp. 4213-4216
Author(s):  
Jian Xiong Liu ◽  
Zheng Yu Wu ◽  
Guo Wen Meng ◽  
Zhao Lin Zhan

Novel single-crystalline SnO2 zigzag nanoribbons have been successfully synthesized by chemical vapour deposition. Sn powder in a ceramic boat covered with Si plates was heated at 1100°C in a flowing argon atmosphere to get deposits on a Si wafers. The main part of deposits is SnO2 zigzag nanoribbons. They were characterized by means of X-ray diffraction (XRD), field-emission scanning electron microscopy (FE-SEM), energy-dispersive X-ray spectroscopy (EDX), transmission electron microscopy (TEM) and selected-area electron diffraction (SAED). SEM observations reveal that the SnO2 zigzag nanoribbons are almost uniform, with lengths near to several hundred micrometers and have a good periodically tuned microstructure as the same zigzag angle and growth directions. Possible growth mechanism of these zigzag nanoribbons was discussed. A room temperature PL spectrum of the zigzag nanoribbons shows three peaks at 373nm, 421nm and 477nm.The novel zigzag microstructures will provide a new candidate for potential application.


1990 ◽  
Vol 202 ◽  
Author(s):  
L. H. Chou ◽  
M. C. Kuo

ABSTRACTThin Sb films have been prepared on glass substrates by rapid thermal evaporation. Films with thicknesses varied from 260 Å to 1300Å were used for the study. X-ray diffraction data showed that for films deposited at room substrate temperature, an almost random grain orientation was observed for films of 1300 Å thick and a tendency for preferred grain orientation was observed as films got thinner. For films of 260 Å thick, only two x-ray diffraction peaks--(003) and (006) were observed. After thermal annealing, secondary grains grew to show preferred orientation in all the films. This phenomenon was explained by surface-energy-driven secondary grain growth. This paper reports the effects of annealing time and film thickness on the secondary grain growth and the evolution of thin Sb film microstmctures. Transmission electron microscopy (TEM) and x-ray diffraction were used to characterize the films.


2020 ◽  
Vol 405 ◽  
pp. 33-39
Author(s):  
Elisabeth Rauchenwald ◽  
Mario Lessiak ◽  
Ronald Weissenbacher ◽  
Sabine Schwarz ◽  
Roland Haubner

Chemical vapour deposited HfN can be utilised as a component of multilayer systems in protective coatings on cutting tools. In this study, related AlHfN coatings were synthesized through a reaction of metallic hafnium and aluminium with HCl gas forming gaseous HfCl4 and AlCl3, which were subsequently transported into a heated coating reactor. Via high temperatures and separately introduced NH3 and N2 as reaction gases, AlHfN coatings were deposited on hardmetal inserts. By varying the ratio between AlCl3 and HfCl4, compositionally different AlHfN coatings were examined. Additionally, surface morphology, composition as well as crystalline phases of the obtained coatings were analysed by scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray diffraction. Finally, the microstructure of the cross section of a coating was investigated via transmission electron microscopy. The observations revealed a great impact of the gas composition on the morphology and crystal structures of the coatings. Within the layer, the growth of columnar microstructures was detected. Additionally, the formation of an amorphous HfN intermediate layer between the substrate and the AlHfN with a thickness of approximately 2 nm was found.


Open Physics ◽  
2016 ◽  
Vol 14 (1) ◽  
pp. 159-165
Author(s):  
Leszek A. Dobrzański ◽  
Marek Szindler ◽  
Mirosława Pawlyta ◽  
Magdalena M. Szindler ◽  
Paulina Boryło ◽  
...  

AbstractThe following paper presents the possibility of formation of Pt nanowires, achieved by a three-step method consisting of conformal deposition of a carbon nanotube and conformal coverage with platinum by physical vapour deposition, followed by removal of the carbonaceous template. The characterization of this new nanostructure was carried out through scanning electron microscopy (SEM), transmission electron microscopy (TEM) and X-ray diffraction (XRD).


2013 ◽  
Vol 591 ◽  
pp. 297-300
Author(s):  
Huan Ke ◽  
Shu Wang Duo ◽  
Ting Zhi Liu ◽  
Hao Zhang ◽  
Xiao Yan Fei

ZnS films have been deposited on glass substrates by chemical bath deposition (CBD). The optical and structural properties were analyzed by UV-VIS spectrophotometer and X-ray diffraction (XRD). The results showed that the prepared thin films from the solution using N2H4 as second complexing agent were thicker than those from the solution without adding N2H4 in; this is due to using second complexing agent of N2H4, the deposition mechanisms change which is conductive to heterogeneous deposition. When using N2H4 as second complexing agent, the crystallinity of ZnS thin films improved with a significant peak at 2θ=28.96°which can be assigned to the (111) reflection of the sphalerite structure. The transmittances of the prepared films from the solution adding N2H4 in as second complexing agent were over 85%, compared to those from the solution without N2H4 (over 95%). The band gaps of the ZnS films from the solution using N2H4 as second complexing agent were larger (about 4.0eV) than that from those from the solution without N2H4 (about 3.98eV), which indicated that the prepared ZnS films from the solution adding N2H4 in as second complexing agent were better used as buffer layer of solar cells with adequate optical properties. In short, using N2H4 as second complexing agent, can greatly improve the optical and structural properties of the ZnS thin films.


2013 ◽  
Vol 385-386 ◽  
pp. 7-10
Author(s):  
Ling Fang Jin ◽  
Hong Zhuang

Nonepitaxially grown double-layered films were synthesized with a FePt: C composite layer on top of continuous FePt underlayer. The thickness of FePt was changed from 2 nm to 14 nm. Nanostructures, crystalline orientations and the effect of FePt underlayer on the ordering, orientation and magnetic properties of the thin films were investigated by transmission electron microscopy (TEM) and x-ray diffraction (XRD). XRD confirmed the formation of the ordered L10phase for 5 nm FePt: C film with FePt thickness decreased to 5 nm. TEM studies of FePt:C composite L10phase and double-layered deposition FePt:C/FePt were presented.


2011 ◽  
Vol 2011 ◽  
pp. 1-6 ◽  
Author(s):  
Zeng Chen ◽  
Shengjun Li ◽  
Weifeng Zhang

Bismuth titanate (Bi4Ti3O12) particles were synthesized by hydrothermal treatment and nanoporous thin films were prepared on conducting glass substrates. The structures and morphologies of the samples were examined with X-ray diffraction and scanning electron microscope (SEM). Significant absorbance spectra emerged in visible region which indicated the efficient sensitization of Bi4Ti3O12with N3 dye. Surface photovoltaic properties of the samples were investigated by surface photovoltage. The results further indicate that N3 can extend the photovoltaic response range of Bi4Ti3O12nanoparticles to the visible region, which shows potential application in dye-sensitized solar cell. As a working electrode in dye-sensitized solar cells (DSSCs), the overall efficiency reached 0.48% after TiO2modification.


1993 ◽  
Vol 310 ◽  
Author(s):  
Lynnette D. Madsen ◽  
Louise Weaver

AbstractSingle oxides (with titanium or lead) deposited as thin films by low pressure metalorganic chemical vapour deposition were investigated by x-ray diffraction and Raman spectroscopy. Examination of mixed oxides (titanates) and silicates were also carried out using these techniques. The crystallographic nature of these thin films were examined and comparisons made to their bulk counterparts. The deposition and anneal conditions 600 for producing cubic PbTiO3 films are discussed briefly.


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