Synchrotron X-Ray Topography of Dislocation Arrays
Keyword(s):
X Ray
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ABSTRACTThe application of relatively low resolution x-ray topography methods, typically ∿ 1 micrometer, is limited in studies which involve large scale dislocation networks. However, the ability to non-destructively image wide areas for “thick” specimens at high intensity with a tunable x-ray source makes the synchrotron an ideal probe for a range of problems previously inaccessible by other methods. Some examples will be discussed such as: (a) crack initiation and propagation in fatigued bicrystals, (b) real-time in situ plastic deformation studies in strain-annealed Mo crystals, and (c) strain distributions in vapor deposited and LPE thin films on Si and GaAs substrates.
2020 ◽
Vol 822
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pp. 153608
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2003 ◽
Vol 36
(2)
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pp. 109-119
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2020 ◽
Vol 197
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pp. 108244
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2006 ◽
Vol 86
(11)
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pp. 1581-1596
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2017 ◽
Vol 375
(2098)
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pp. 20160410
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2017 ◽
Vol 712
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pp. 69-75
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