scholarly journals Interaction Between Titanium Implant Surfaces and Hydrogen Peroxide in Biologically Relevant Environments

2004 ◽  
Vol 823 ◽  
Author(s):  
Julie Muyco ◽  
Timothy Ratto ◽  
Christine Orme ◽  
Joanna McKittrick ◽  
John Frangos
Keyword(s):  
Hydrogen Peroxide ◽  
Raman Spectroscopy ◽  
Atomic Force Microscope ◽  
Titanium Implant ◽  
Dilute Solutions ◽  
Interaction Layer ◽  
Biologically Relevant ◽  
Light Passing ◽  
Atomic Force ◽  
Force Curves

AbstractTitanium was exposed to dilute solutions of hydrogen peroxide (H2O2) to better characterize the interaction at the interface between the solution and metal. The intensity of light passing through films of known thickness of titanium on quartz was measured as a function of time in contact with H2O2in concentrations of 0.3% and 1.0%. An atomic force microscope (AFM) was used to record deflection-distance (force) curves as a probe approached the interface of titanium in contact with solution containing 0.3% of H2O2. The interaction layer measured using AFM techniques was much greater than the thickness of the titanium films used in this study. Raman spectroscopy taken during interaction shows the emergence of a Ti-peroxy gel and titania after 2 hours in contact with 0.3% H2O2solution.

CHARACTERIZING LOCALIZED STRAIN OF IN0.83Al0.17As/In0.83Ga0.17As DETECTOR USING LOW FREQUENCY ATOMIC FORCE ACOUSTIC MICROSCOPE

2016 ◽  
Vol 23 (01) ◽  
pp. 1550110
Author(s):  
WEITAO SU ◽  
HONGLEI DOU ◽  
DEXUAN HUO ◽  
GUOLIN YU ◽  
NING DAI
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscope ◽  
Spatial Resolution ◽  
Low Frequency ◽  
Surface Strain ◽  
Strain Accumulation ◽  
Acoustic Microscope ◽  
Atomic Force

Localized strain accumulation and related defects strongly affect the performance of optoelectronic detectors. However, characterizing distribution of the localized strain and defects still challenges usability and spatial resolution of many measurements. In current study, the defects and surface strain accumulation of In[Formula: see text]Al[Formula: see text]As/In[Formula: see text]Ga[Formula: see text]As multilayer detectors are investigated using low-frequency atomic force acoustic microscope (AFAM) and Raman spectroscopy. With AFAM, the strain accumulation and defects can be easily identified and measured with spatial resolution as good as that of atomic force microscope (AFM).

Single Molecule Manipulation and Sensing with the Atomic Force Microscope

2000 ◽  
Vol 6 (S2) ◽  
pp. 972-973
Author(s):  
S.M. Lindsay ◽  
S. H. Leuba ◽  
J. Zlatanova ◽  
M. A. Karymov ◽  
R. Bash ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Single Molecule ◽  
Optical Tweezer ◽  
Linker Histones ◽  
Atomic Force ◽  
Nucleosomal Dna ◽  
Order Of Magnitude ◽  
Force Curves ◽  
Histone Octamers ◽  
Glass Support

The atomic force microscope (AFM) can be used both to manipulate molecules and to make measurements on individual molecules. Here, we describe manipulation of chromatin constructs as an example of the first type of measurement, and electronic measurements on single molecules as an example of the second type.An AFM was used to both image and stretch single synthetic chromatin fibers consisting of twelve core nucleosomes with no linker histones. Peaks in the force-curves are attributed to sequential detachment of nucleosomes from the glass support (Figure 1). The short distances between peaks and reversibility of the pulling process show that the nucleosomes remain intact even at tensions on the order of 350 picoNewtons (pN). This is more than an order of magnitude larger than the force required to de-spool histone octamers from the nucleosomal DNA in laser optical tweezer measurements made with longer molecules, suggesting that loading rates and sample size are important factors in determining the force required to break inter-molecular bonds.

Dielectrophoretic positioning of single nanoparticles on atomic force microscope tips for tip-enhanced Raman spectroscopy

2015 ◽  
Vol 36 (9-10) ◽  
pp. 1142-1148 ◽  
Author(s):  
Christian Leiterer ◽  
Tanja Deckert-Gaudig ◽  
Prabha Singh ◽  
Janina Wirth ◽  
Volker Deckert ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscope ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy

Direct measurement of plowing friction and wear of a polymer thin film using the atomic force microscope

2001 ◽  
Vol 16 (5) ◽  
pp. 1487-1492 ◽  
Author(s):  
Binyang Du ◽  
Mark R. VanLandingham ◽  
Qingling Zhang ◽  
Tianbai He
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
Friction And Wear ◽  
Nanometer Scale ◽  
Polymer Thin Film ◽  
Atomic Force ◽  
Nanoindentation Testing ◽  
Force Curves ◽  
Free Body ◽  
The Moment

Nanometer-scale plowing friction and wear of a polycarbonate thin film were directly measured using an atomic force microscope (AFM) with nanoscratching capabilities. During the nanoscratch tests, lateral forces caused discrepancies between the maximum forces for the initial loading prior to the scratch and the unloading after the scratch. In the case of a nanoscratch test performed parallel to the cantilever probe axis, the plowing friction added another component to the moment acting at the cantilevered end compared to the case of nanoindentation, resulting in an increased deflection of the cantilever. Using free-body diagrams for the cases of nanoindentation and nanoscratch testing, the AFM force curves were analyzed to determine the plowing friction during nanoscratch testing. From the results of this analysis, the plowing friction was found to be proportional to the applied contact force, and the coefficient of plowing friction was measured to be 0.56 ± 0.02. Also, by the combination of nanoscratch and nanoindentation testing, the energetic wear rate of the polycarbonate thin film was measured to be 0.94 ± 0.05 mm3/(N m).

Investigation of antifouling universality of polyvinyl formal (PVF) membranes utilizing atomic force microscope (AFM) force curves

RSC Advances ◽  
2015 ◽  
Vol 5 (46) ◽  
pp. 36894-36901 ◽  
Author(s):  
Yunqiang Liu ◽  
Linyan Xu ◽  
Yunpeng Song ◽  
Xing Fu ◽  
Jing Zou ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Adhesion Force ◽  
Polyvinyl Formal ◽  
Atomic Force ◽  
Force Curves

Adhesion force between proteins and PVF/F127 membranes with different ratios are measured by AFM force curves with well calibrated cantilevers.

Raman Spectroscopy of Folded Tetralayer Graphenes Prepared by Atomic Force Microscope

2018 ◽  
Vol 122 (49) ◽  
pp. 28362-28367
Author(s):  
Jia Liu ◽  
Xiao Hu ◽  
Xiannian Chi ◽  
Junyi Yue ◽  
Jinzhong Cai ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscope ◽  
Atomic Force

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

1989 ◽  
Vol 47 ◽  
pp. 32-33
Author(s):  
S.A.C. Gould ◽  
B. Drake ◽  
C.B. Prater ◽  
A.L. Weisenhorn ◽  
S.M. Lindsay ◽  
...  
Keyword(s):  
Amino Acids ◽  
Dna Sequencing ◽  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Piezoelectric Crystal ◽  
Atomic Force ◽  
Structure Of Molecules ◽  
Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

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