Detection of electrostatic forces with an atomic force microscope: Analytical and experimental dynamic force curves in the nonlinear regime

2003 ◽  
Vol 68 (4) ◽  
Author(s):  
R. Dianoux ◽  
F. Martins ◽  
F. Marchi ◽  
C. Alandi ◽  
F. Comin ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Nonlinear Regime ◽  
Dynamic Force ◽  
Electrostatic Forces ◽  
Atomic Force ◽  
Force Curves

scholarly journals Interaction Between Titanium Implant Surfaces and Hydrogen Peroxide in Biologically Relevant Environments

2004 ◽  
Vol 823 ◽  
Author(s):  
Julie Muyco ◽  
Timothy Ratto ◽  
Christine Orme ◽  
Joanna McKittrick ◽  
John Frangos
Keyword(s):  
Hydrogen Peroxide ◽  
Raman Spectroscopy ◽  
Atomic Force Microscope ◽  
Titanium Implant ◽  
Dilute Solutions ◽  
Interaction Layer ◽  
Biologically Relevant ◽  
Light Passing ◽  
Atomic Force ◽  
Force Curves

AbstractTitanium was exposed to dilute solutions of hydrogen peroxide (H2O2) to better characterize the interaction at the interface between the solution and metal. The intensity of light passing through films of known thickness of titanium on quartz was measured as a function of time in contact with H2O2in concentrations of 0.3% and 1.0%. An atomic force microscope (AFM) was used to record deflection-distance (force) curves as a probe approached the interface of titanium in contact with solution containing 0.3% of H2O2. The interaction layer measured using AFM techniques was much greater than the thickness of the titanium films used in this study. Raman spectroscopy taken during interaction shows the emergence of a Ti-peroxy gel and titania after 2 hours in contact with 0.3% H2O2solution.

Mapping Local Electrostatic Forces with the Atomic Force Microscope

Langmuir ◽  
1997 ◽  
Vol 13 (10) ◽  
pp. 2825-2832 ◽  
Author(s):  
Christian Rotsch ◽  
Manfred Radmacher
Keyword(s):  
Atomic Force Microscope ◽  
Electrostatic Forces ◽  
Atomic Force

Nanomechanics of Peeling Studied Using the Atomic Force Microscope

2007 ◽  
Author(s):  
Mark C. Strus ◽  
Arvind Raman ◽  
Luis Zalamea ◽  
R. Byron Pipes ◽  
Cattien V. Nguyen
Keyword(s):  
Atomic Force Microscope ◽  
Practical Knowledge ◽  
Peel Test ◽  
Dynamic Force ◽  
Multiwalled Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nonlinear Flexure ◽  
Pulling Force ◽  
Opening And Closing

Through adaptation of an atomic force microscope, we have developed a peel test at the micro- and nanoscale level that has the capability of investigating how long flexible nanotubes, nanowires, nanofibers, proteins, and DNA adhere to various substrates. This novel atomic force microscopy (AFM) peeling mode extends existing AFM “pushing” and “pulling” force spectroscopies by offering practical knowledge about the complex interplay of nonlinear flexure, friction, and adhesion when one peels a long flexible molecule or nanostructure off a substrate. The static force peeling spectroscopies of straight multiwalled carbon nanotubes suggest that a significant amount of the total peeling energy is channeled into nanotube flexure. Meanwhile dynamic force spectroscopies offer invaluable information about the dissipative physical processes involved in opening and closing a small “crack” between the nanotube and substrate.

Single Molecule Manipulation and Sensing with the Atomic Force Microscope

2000 ◽  
Vol 6 (S2) ◽  
pp. 972-973
Author(s):  
S.M. Lindsay ◽  
S. H. Leuba ◽  
J. Zlatanova ◽  
M. A. Karymov ◽  
R. Bash ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Single Molecule ◽  
Optical Tweezer ◽  
Linker Histones ◽  
Atomic Force ◽  
Nucleosomal Dna ◽  
Order Of Magnitude ◽  
Force Curves ◽  
Histone Octamers ◽  
Glass Support

The atomic force microscope (AFM) can be used both to manipulate molecules and to make measurements on individual molecules. Here, we describe manipulation of chromatin constructs as an example of the first type of measurement, and electronic measurements on single molecules as an example of the second type.An AFM was used to both image and stretch single synthetic chromatin fibers consisting of twelve core nucleosomes with no linker histones. Peaks in the force-curves are attributed to sequential detachment of nucleosomes from the glass support (Figure 1). The short distances between peaks and reversibility of the pulling process show that the nucleosomes remain intact even at tensions on the order of 350 picoNewtons (pN). This is more than an order of magnitude larger than the force required to de-spool histone octamers from the nucleosomal DNA in laser optical tweezer measurements made with longer molecules, suggesting that loading rates and sample size are important factors in determining the force required to break inter-molecular bonds.

Direct measurement of plowing friction and wear of a polymer thin film using the atomic force microscope

2001 ◽  
Vol 16 (5) ◽  
pp. 1487-1492 ◽  
Author(s):  
Binyang Du ◽  
Mark R. VanLandingham ◽  
Qingling Zhang ◽  
Tianbai He
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
Friction And Wear ◽  
Nanometer Scale ◽  
Polymer Thin Film ◽  
Atomic Force ◽  
Nanoindentation Testing ◽  
Force Curves ◽  
Free Body ◽  
The Moment

Nanometer-scale plowing friction and wear of a polycarbonate thin film were directly measured using an atomic force microscope (AFM) with nanoscratching capabilities. During the nanoscratch tests, lateral forces caused discrepancies between the maximum forces for the initial loading prior to the scratch and the unloading after the scratch. In the case of a nanoscratch test performed parallel to the cantilever probe axis, the plowing friction added another component to the moment acting at the cantilevered end compared to the case of nanoindentation, resulting in an increased deflection of the cantilever. Using free-body diagrams for the cases of nanoindentation and nanoscratch testing, the AFM force curves were analyzed to determine the plowing friction during nanoscratch testing. From the results of this analysis, the plowing friction was found to be proportional to the applied contact force, and the coefficient of plowing friction was measured to be 0.56 ± 0.02. Also, by the combination of nanoscratch and nanoindentation testing, the energetic wear rate of the polycarbonate thin film was measured to be 0.94 ± 0.05 mm3/(N m).

Investigation of antifouling universality of polyvinyl formal (PVF) membranes utilizing atomic force microscope (AFM) force curves

RSC Advances ◽  
2015 ◽  
Vol 5 (46) ◽  
pp. 36894-36901 ◽  
Author(s):  
Yunqiang Liu ◽  
Linyan Xu ◽  
Yunpeng Song ◽  
Xing Fu ◽  
Jing Zou ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Adhesion Force ◽  
Polyvinyl Formal ◽  
Atomic Force ◽  
Force Curves

Adhesion force between proteins and PVF/F127 membranes with different ratios are measured by AFM force curves with well calibrated cantilevers.

Viscometry of single nanoliter-volume droplets using dynamic force spectroscopy

2016 ◽  
Vol 18 (39) ◽  
pp. 27684-27690 ◽  
Author(s):  
Manhee Lee ◽  
Bongsu Kim ◽  
QHwan Kim ◽  
JongGeun Hwang ◽  
Sangmin An ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Force Spectroscopy ◽  
Dynamic Force ◽  
Dynamic Force Spectroscopy ◽  
Atomic Force

We present an atomic force microscope-based platform for viscometry of ‘nanoliter' volume fluids.

scholarly journals Probing nano-scale viscoelastic response in air and in liquid with dynamic atomic force microscopy

Soft Matter ◽  
2018 ◽  
Vol 14 (19) ◽  
pp. 3998-4006 ◽  
Author(s):  
Federica Crippa ◽  
Per-Anders Thorén ◽  
Daniel Forchheimer ◽  
Riccardo Borgani ◽  
Barbara Rothen-Rutishauser ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Atomic Force Microscope ◽  
Polymer Blend ◽  
Viscoelastic Response ◽  
Dynamic Force ◽  
Force Measurements ◽  
Force Microscopy ◽  
Atomic Force ◽  
Soft Polymer

We perform a comparative study of dynamic force measurements using an Atomic Force Microscope (AFM) on the same soft polymer blend samples in both air and liquid environments.

Sign in / Sign up

Export Citation Format

Share Document