Broad Bandwidth, Electrically Small, Non-Foster Element-Augmented Antenna Designs, Analyses, and Measurements

2013 ◽  
Vol E96.B (10) ◽  
pp. 2399-2409 ◽  
Author(s):  
Ning ZHU ◽  
Richard W. ZIOLKOWSKI
Keyword(s):  
Broad Bandwidth

Interface Engineering To Boost Photoresponse Performance of Self-Powered, Broad-Bandwidth PEDOT:PSS/Si Heterojunction Photodetector

2016 ◽  
Vol 8 (29) ◽  
pp. 19158-19167 ◽  
Author(s):  
Zhimin Liang ◽  
Pingyang Zeng ◽  
Pengyi Liu ◽  
Chuanxi Zhao ◽  
Weiguang Xie ◽  
...  
Keyword(s):  
Interface Engineering ◽  
Broad Bandwidth ◽  
Self Powered

scholarly journals Coherence tomography with broad bandwidth extreme ultraviolet and soft X-ray radiation

2021 ◽  
Vol 127 (4) ◽  
Author(s):  
S. Skruszewicz ◽  
S. Fuchs ◽  
J. J. Abel ◽  
J. Nathanael ◽  
J. Reinhard ◽  
...  
Keyword(s):  
Optical Coherence Tomography ◽  
Near Infrared ◽  
Extreme Ultraviolet ◽  
Infrared Light ◽  
Imaging Method ◽  
Optical Coherence ◽  
Axial Resolution ◽  
Cross Sectional ◽  
X Ray ◽  
Broad Bandwidth

AbstractWe present an overview of recent results on optical coherence tomography with the use of extreme ultraviolet and soft X-ray radiation (XCT). XCT is a cross-sectional imaging method that has emerged as a derivative of optical coherence tomography (OCT). In contrast to OCT, which typically uses near-infrared light, XCT utilizes broad bandwidth extreme ultraviolet (XUV) and soft X-ray (SXR) radiation (Fuchs et al in Sci Rep 6:20658, 2016). As in OCT, XCT’s axial resolution only scales with the coherence length of the light source. Thus, an axial resolution down to the nanometer range can be achieved. This is an improvement of up to three orders of magnitude in comparison to OCT. XCT measures the reflected spectrum in a common-path interferometric setup to retrieve the axial structure of nanometer-sized samples. The technique has been demonstrated with broad bandwidth XUV/SXR radiation from synchrotron facilities and recently with compact laboratory-based laser-driven sources. Axial resolutions down to 2.2 nm have been achieved experimentally. XCT has potential applications in three-dimensional imaging of silicon-based semiconductors, lithography masks, and layered structures like XUV mirrors and solar cells.

scholarly journals Broadband metamaterials and metasurfaces: a review from the perspectives of materials and devices

Nanophotonics ◽  
2020 ◽  
Vol 9 (10) ◽  
pp. 3165-3196 ◽  
Author(s):  
Joonkyo Jung ◽  
Hyeonjin Park ◽  
Junhyung Park ◽  
Taeyong Chang ◽  
Jonghwa Shin
Keyword(s):  
Material Properties ◽  
Frequency Bandwidth ◽  
Broad Bandwidth ◽  
Practical Applications ◽  
Effective Material Properties

AbstractMetamaterials can possess extraordinary properties not readily available in nature. While most of the early metamaterials had narrow frequency bandwidth of operation, many recent works have focused on how to implement exotic properties and functions over broad bandwidth for practical applications. Here, we provide two definitions of broadband operation in terms of effective material properties and device functionality, suitable for describing materials and devices, respectively, and overview existing broadband metamaterial designs in such two categories. Broadband metamaterials with nearly constant effective material properties are discussed in the materials part, and broadband absorbers, lens, and hologram devices based on metamaterials and metasurfaces are discussed in the devices part.

Estimating transmitted wavefronts in a broad bandwidth based on Zernike coefficients

2019 ◽  
Vol 21 (9) ◽  
pp. 095601 ◽  
Author(s):  
Qiyuan Zhang ◽  
Haoyu Wang ◽  
Peng Wu ◽  
Yuegang Fu ◽  
Xueyuan Li ◽  
...  
Keyword(s):  
Broad Bandwidth

scholarly journals Beam tilt and angular dispersion in broad-bandwidth, nanosecond optical parametric oscillators

1999 ◽  
Vol 16 (9) ◽  
pp. 1525 ◽  
Author(s):  
W. J. Alford ◽  
Russell J. Gehr ◽  
R. L. Schmitt ◽  
A. V. Smith ◽  
Gunnar Arisholm
Keyword(s):  
Optical Parametric Oscillators ◽  
Angular Dispersion ◽  
Broad Bandwidth ◽  
Parametric Oscillators ◽  
Optical Parametric

scholarly journals Nanometer resolution optical coherence tomography using broad bandwidth XUV and soft x-ray radiation

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Silvio Fuchs ◽  
Christian Rödel ◽  
Alexander Blinne ◽  
Ulf Zastrau ◽  
Martin Wünsche ◽  
...  
Keyword(s):  
Optical Coherence Tomography ◽  
Optical Coherence ◽  
Nanometer Resolution ◽  
X Ray ◽  
Broad Bandwidth
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