Power-Supply-Noise-Aware Timing Analysis and Test Pattern Regeneration

2016 ◽  
Vol E99.A (12) ◽  
pp. 2320-2327
Author(s):  
Cheng-Yu HAN ◽  
Yu-Ching LI ◽  
Hao-Tien KAN ◽  
James Chien-Mo LI
Keyword(s):  
Power Supply ◽  
Test Pattern ◽  
Timing Analysis ◽  
Power Supply Noise ◽  
Supply Noise

Research on Timing of on-Chip Power Supply Noise with Analysis of Scientific Data Materials

2013 ◽  
Vol 310 ◽  
pp. 494-497
Author(s):  
Xiao Guang Li
Keyword(s):  
Power Supply ◽  
Supply Voltage ◽  
Timing Analysis ◽  
Logic Gates ◽  
Scientific Data ◽  
New Method ◽  
Power Supply Noise ◽  
Supply Noise ◽  
On Chip

Aiming at the problems of the influence in power-supply variations on timing analysis, this paper presents a new method to assign a supply-dependent hold margin based on analysis of scientific data materials, which describe a method to accurately characterize logic gates for the sensitivity of delay on supply-voltage variations, and then the method use a commercial microcontroller as a design example. Experiment results shows that the new method with analysis of scientific materials can get a good performance, even under the existing noise.

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