Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2012.2197427 ◽

2013 ◽

Vol 21 (5) ◽

pp. 958-970 ◽

Author(s):

Aida Todri ◽

Alberto Bosio ◽

Luigi Dilillo ◽

Patrick Girard ◽

Arnaud Virazel

Keyword(s):

Power Supply ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Power Supply Noise ◽

Supply Noise ◽

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PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.63 ◽

2008 ◽

Author(s):

Yi-Tsung Lin ◽

Meng-Fan Wu ◽

Jiun-Lang Huang

Keyword(s):

Power Supply ◽

Test Pattern ◽

Pattern Generation ◽

Huffman Coding ◽

Test Pattern Generation ◽

Scan Testing ◽

Test Compression ◽

Generation Technique ◽

Supply Noise ◽

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Power supply noise and ground bounce aware pattern generation for delay testing

2011 IEEE 9th International New Circuits and systems conference ◽

10.1109/newcas.2011.5981222 ◽

2011 ◽

Author(s):

A. Todri ◽

A. Bosio ◽

L. Dilillo ◽

P. Girard ◽

S. Pravossoudovitch ◽

...

Keyword(s):

Power Supply ◽

Pattern Generation ◽

Delay Testing ◽

Power Supply Noise ◽

Supply Noise ◽

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Power-Supply-Noise-Aware Timing Analysis and Test Pattern Regeneration

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences ◽

10.1587/transfun.e99.a.2320 ◽

2016 ◽

Vol E99.A (12) ◽

pp. 2320-2327

Author(s):

Cheng-Yu HAN ◽

Yu-Ching LI ◽

Hao-Tien KAN ◽

James Chien-Mo LI

Keyword(s):

Power Supply ◽

Test Pattern ◽

Timing Analysis ◽

Power Supply Noise ◽

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Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs *

2020 IEEE 29th Asian Test Symposium (ATS) ◽

10.1109/ats49688.2020.9301568 ◽

2020 ◽

Author(s):

Shao-Chun Hung ◽

Yi-Chen Lu ◽

Sung Kyu Lim ◽

Krishnendu Chakrabarty

Keyword(s):

Power Supply ◽

Test Pattern ◽

Power Supply Noise ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

3D Ics ◽

Scan Test ◽

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Pattern Generation for Post-Silicon Timing Validation Considering Power Supply Noise

2014 IEEE 23rd North Atlantic Test Workshop ◽

10.1109/natw.2014.21 ◽

2014 ◽

Author(s):

Tengteng Zhang ◽

Yukun Gao ◽

D.M.H. Walker

Keyword(s):

Power Supply ◽

Pattern Generation ◽

Power Supply Noise ◽

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Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce

17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems ◽

10.1109/ddecs.2014.6868791 ◽

2014 ◽

Author(s):

A. Asokan ◽

A. Todri-Sanial ◽

A. Bosio ◽

L. Dilillo ◽

P. Girard ◽

...

Keyword(s):

Power Supply ◽

Power Supply Noise ◽

Supply Noise ◽

Ground Bounce ◽

Path Delay Test

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Pattern Generation for Understanding Timing Sensitivity to Power Supply Noise

Journal of Electronic Testing ◽

10.1007/s10836-014-5502-4 ◽

2014 ◽

Vol 31 (1) ◽

pp. 99-106 ◽

Author(s):

Tengteng Zhang ◽

Yukun Gao ◽

D. M. H. Walker

Keyword(s):

Power Supply ◽

Pattern Generation ◽

Power Supply Noise ◽

Supply Noise ◽

Timing Sensitivity

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Path selection and pattern generation for dynamic timing analysis considering power supply noise effects

IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140) ◽

10.1109/iccad.2000.896521 ◽

2002 ◽

Author(s):

Jing-Jia Liou ◽

A. Krstic ◽

Yi-Min Jiang ◽

Kwang-Ting Cheng

Keyword(s):

Power Supply ◽

Timing Analysis ◽

Path Selection ◽

Pattern Generation ◽

Power Supply Noise ◽

Noise Effects ◽

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A Minimized Test Pattern Generation Method for Ground Bounce Effect and Delay Fault Detection

Computational Science and Its Applications - ICCSA 2006 - Lecture Notes in Computer Science ◽

10.1007/11751632_63 ◽

2006 ◽

pp. 577-583 ◽

Author(s):

MoonJoon Kim ◽

JeongMin Lee ◽

WonGi Hong ◽

Hoon Chang

Keyword(s):

Fault Detection ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Fault ◽

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Pattern Generation for Power Supply Noise Analysis

Nanometer Technology Designs High-Quality Delay Tests ◽

10.1007/978-0-387-75728-5_10 ◽

2008 ◽

pp. 207-221

Keyword(s):

Power Supply ◽

Noise Analysis ◽

Pattern Generation ◽

Power Supply Noise ◽

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