scholarly journals A Comparative Study of Features of Sorption of N-Buthylxanthate and Dibuthyldixanthogen Onto Metallic Supports and Rutile Using in situ Atomic Force Spectroscopy

2019 ◽  
pp. 336-346
Author(s):  
Anton A. Karacharov ◽  
Maxim N. Likhatski
Keyword(s):  
Sessile Drop ◽  
Force Spectroscopy ◽  
Surface Force ◽  
Sample Surface ◽  
Adhesive Force ◽  
Atomic Force Spectroscopy ◽  
Hydrophobic Force ◽  
Force Magnitude ◽  
Atomic Force

An interaction of potassium buthylxanthate and of dibuthyldixanthogen with metallic Ti, stainless steel and α-TiO2 surfaces was studied. Contact angle measurements by sessile drop technique showed that the treatment of initial substrate surfaces with potassium buthylxanthate aqueous solution or with dibuthyldixanthogen emulsion render them more hydrophobic. Using in situ atomic force spectroscopy, the sorption of surface active substances was shown to give rise to an increase in both adhesive force magnitude and the range within it acts at the approach of cantilever tip to the surface of both hydrophobic and hydrophilic samples. The maximum of both adhesive force and their range, up to 150 nm, took place in case of retract of cantilever tip from sample surface. Force curves are steeper, which related with the formation of nanobubbles on the surfaces of samples under study arising the longrange hydrophobic force of capillary origin. Dibuthyldixanthogen exhibited highly-active reagent properties inducing the formation of nanoscale gas structures on both hydrophobic and, in less extent, hydrophilic surfaces

scholarly journals DETERMINATION OF THE ADHESION PROPERTIES OF MICA VIA ATOMIC FORCE SPECTROSCOPY

2012 ◽  
Vol 05 ◽  
pp. 33-40
Author(s):  
Tina Shadloo ◽  
Sadegh Firoozi ◽  
Pirooz Marashi ◽  
Alireza Zolfaghari Hesari ◽  
Masih Rezaee ◽  
...  
Keyword(s):  
Force Constant ◽  
Adhesion Force ◽  
Force Measurement ◽  
Piezoelectric Element ◽  
Force Spectroscopy ◽  
Surface Force ◽  
Distance Curve ◽  
Atomic Force Spectroscopy ◽  
Adhesion Properties ◽  
Atomic Force

This paper addresses the Adhesion of mica surface employing Atomic Force Microscope (AFM) as a surface force apparatus. AFM is commonly used for atomic and nano-scale surface measurements. Based on the relations between cantilever responses and tip–sample interaction, methods for quantitative evaluation of a sample's mechanical parameters are described and issues concerning the use of AFM are discussed. The measurement of the Force-Distance curve was performed implementing Atomic Force Spectroscopy (AFS). During these measurements, the static deflection of the cantilever is monitored as a function of piezoelectric element displacement. The recorded plot is then used to quantitatively measure the mechanical properties like adhesion and elastic modulus. Forces were measured by multiplying the distance by force constant of the cantilever thorough Hook's law. It was necessary to calibrate the force constant of the cantilever to perform a precise force measurement. Force-Distance curves were obtained in three different points on the surface of mica and Distant Dependant Measurement (DDM) was conducted 10 times per each point by 1.5s interval. Adhesion force was then calculated in every single curve and the final data was the mean of thirty different curves.

Effect of Sample Topography on Adhesive Force in Atomic Force Spectroscopy Measurements in Air

Langmuir ◽  
2000 ◽  
Vol 16 (20) ◽  
pp. 7796-7800 ◽  
Author(s):  
Lucel Sirghi ◽  
Nobuyuki Nakagiri ◽  
Katsumi Sugisaki ◽  
Hiroyuki Sugimura ◽  
Osamu Takai
Keyword(s):  
Force Spectroscopy ◽  
Adhesive Force ◽  
Atomic Force Spectroscopy ◽  
Atomic Force

Dysfunction of endothelial cells exposed to nanomaterials assessed by atomic force spectroscopy

Micron ◽  
2021 ◽  
Vol 145 ◽  
pp. 103062
Author(s):  
Agnieszka Maria Kolodziejczyk ◽  
Paulina Sokolowska ◽  
Aleksandra Zimon ◽  
Magdalena Grala ◽  
Marcin Rosowski ◽  
...  
Keyword(s):  
Endothelial Cells ◽  
Force Spectroscopy ◽  
Atomic Force Spectroscopy ◽  
Atomic Force

scholarly journals Concurrent atomic force spectroscopy

2019 ◽  
Vol 2 (1) ◽  
Author(s):  
Carolina Pimenta-Lopes ◽  
Carmen Suay-Corredera ◽  
Diana Velázquez-Carreras ◽  
David Sánchez-Ortiz ◽  
Jorge Alegre-Cebollada
Keyword(s):  
Force Spectroscopy ◽  
Atomic Force Spectroscopy ◽  
Atomic Force

Evaluation of Cell Membrane-Modulating Properties of Non-Ionic Surfactants with the use of Atomic Force Spectroscopy

2015 ◽  
Vol 5 (2) ◽  
pp. 91-96
Author(s):  
Oksana V. Bondar ◽  
Denis V. Lebedev ◽  
Vesta D. Shevchenko ◽  
Anastas A. Bukharaev ◽  
Yury N. Osin ◽  
...  
Keyword(s):  
Cell Membrane ◽  
Force Spectroscopy ◽  
Ionic Surfactants ◽  
Atomic Force Spectroscopy ◽  
Atomic Force

scholarly journals Atomic Force Spectroscopy on Ionic Liquids

2019 ◽  
Vol 9 (11) ◽  
pp. 2207 ◽  
Author(s):  
Christian Rodenbücher ◽  
Klaus Wippermann ◽  
Carsten Korte
Keyword(s):  
Ionic Liquid ◽  
Ionic Liquids ◽  
Electrical Potential ◽  
Force Spectroscopy ◽  
Interface Structure ◽  
Layer Model ◽  
Atomic Force Spectroscopy ◽  
Atomic Force ◽  
Double Layer Model ◽  
Electrified Interface

Ionic liquids have become of significant relevance in chemistry, as they can serve as environmentally-friendly solvents, electrolytes, and lubricants with bespoke properties. In particular for electrochemical applications, an understanding of the interface structure between the ionic liquid and an electrified interface is needed to model and optimize the reactions taking place on the solid surface. As with ionic liquids, the interplay between electrostatic forces and steric effects leads to an intrinsic heterogeneity, as the structure of the ionic liquid above an electrified interface cannot be described by the classical electrical double layer model. Instead, a layered solvation layer is present with a structure that depends on the material combination of the ionic liquid and substrate. In order to experimentally monitor this structure, atomic force spectroscopy (AFS) has become the method of choice. By measuring the force acting on a sharp microfabricated tip while approaching the surface in an ionic liquid, it has become possible to map the solvation layers with sub-nanometer resolution. In this review, we provide an overview of the AFS studies on ionic liquids published in recent years that illustrate how the interface is formed and how it can be modified by applying electrical potential or by adding impurities and solvents.

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