scholarly journals Development of Chemiluminescence Resonance Test System Using SiPM Front-end ASIC to Detect Na and K Ions in Urine

2021 ◽  
Vol 11 (3) ◽  
pp. 1172
Author(s):  
Hojong Chang ◽  
KyungDon Choi ◽  
Byunghun Han ◽  
Hyunduk Kim ◽  
Jaeho Ko ◽  
...  
Keyword(s):  
Test System ◽  
Front End ◽  
Resonance Test

STAR TIME OF FLIGHT READOUT ELECTRONICS, DAQ, AND COSMIC RAY TEST STAND

2007 ◽  
Vol 16 (07n08) ◽  
pp. 2496-2502 ◽  
Author(s):  
J. SCHAMBACH ◽  
G. HOFFMANN ◽  
K. KAJIMOTO ◽  
L. BRIDGES ◽  
G. EPPLEY ◽  
...  
Keyword(s):  
Time Of Flight ◽  
Cosmic Ray ◽  
Test System ◽  
Digital Information ◽  
Readout Electronics ◽  
Timing Resolution ◽  
Front End ◽  
Analog Front End ◽  
Plastic Scintillators ◽  
Resistive Plate Chambers

The new Time-of-Flight (TOF) subsystem for STAR at RHIC will have 3840 6-pad Multigap Resistive Plate Chambers (MRPC) distributed over 120 trays. Each tray contains 192 channels and three types of electronics cards: “TINO”, “TDIG” and “TCPU”. Every 30 trays send data to a “THUB” card that interfaces to STAR trigger and transmits data over fiber to a STAR DAQ fiber receiver. TINO contains analog front end electronics based on the CERN/LAA NINO custom IC. TDIG digitizes the data using the CERN HPTDC ASIC. TCPU formats and buffers the digital information. A cosmic ray test system comprised of three plastic scintillators, 4 MRPC modules, and TOF prototype electronics is used to determine the timing resolution to be achieved for the entire TOF system. Overall timing resolution of 80 – 110 ps has been achieved.

A test system for the front-end electronics of the PADME charged particle detector system

2017 ◽  
Author(s):  
Iveta Antonova ◽  
Sergio Ceravolo ◽  
Giovanni Corradi ◽  
Georgi Georgiev ◽  
Venelin Kozhuharov ◽  
...  
Keyword(s):  
Charged Particle ◽  
Test System ◽  
Detector System ◽  
Particle Detector ◽  
Front End

scholarly journals Spectral Signature Analysis – BIST for RF Front-Ends

2003 ◽  
Vol 1 ◽  
pp. 155-160 ◽  
Author(s):  
D. Lupea ◽  
U. Pursche ◽  
H.-J. Jentschel
Keyword(s):  
Frequency Response ◽  
Building Blocks ◽  
Test System ◽  
System Level ◽  
Spectral Signature ◽  
Signature Analysis ◽  
Response Evaluation ◽  
Front End ◽  
Rf Front End ◽  
Self Test

Abstract. In this paper, the Spectral Signature Analysis is presented as a concept for an integrable self-test system (Built-In Self-Test – BIST) for RF front-ends is presented. It is based on modelling the whole RF front-end (transmitter and receiver) on system level, on generating of a Spectral Signature and of evaluating of the Signature Response. Because of using multi-carrier signal as the test signature, the concept is especially useful for tests of linearity and frequency response of front-ends. Due to the presented method of signature response evaluation, this concept can be used for Built-In Self-Correction (BISC) at critical building blocks.

scholarly journals ASIC wafer test system for the ATLAS Semiconductor Tracker front-end chip

2005 ◽  
Author(s):  
F. Anghinolfi ◽  
W. Bialas ◽  
N. Busek ◽  
A. Ciocio ◽  
D. Cosgrove ◽  
...  
Keyword(s):  
Test System ◽  
Front End ◽  
Wafer Test

scholarly journals A High Throughput Production Scale Front-End Hybrid Test System for the CMS Phase-2 Tracker Upgrade

2020 ◽  
Author(s):  
Mark Istvan Kovacs ◽  
G. Blanchot ◽  
R. Gajanec ◽  
N. Rasevic ◽  
A. Zografos ◽  
...  
Keyword(s):  
High Throughput ◽  
Test System ◽  
Phase 2 ◽  
Production Scale ◽  
Front End ◽  
Hybrid Test

scholarly journals ALMA North American Integration Center Front-End Test System

2010 ◽  
Vol 31 (10) ◽  
pp. 1182-1204 ◽  
Author(s):  
Geoffrey A. Ediss ◽  
Joshua Crabtree ◽  
Kirk Crady ◽  
Erik Gaines ◽  
Morgan McLeod ◽  
...  
Keyword(s):  
North American ◽  
Test System ◽  
Front End
Sign in / Sign up

Export Citation Format

Share Document