scholarly journals Down-Sizing in Analytical Chemistry. Portable X-ray fluorescence spectrometer system containing a low-level radioisotope and its application to the non-destructive analysis of inorganic colorants used for the traditional Japanese votive picture.

2000 ◽  
Vol 49 (12) ◽  
pp. 1015-1021 ◽  
Author(s):  
Susumu SHIMOYAMA ◽  
Yasuko NODA
Keyword(s):  
Analytical Chemistry ◽  
X Ray ◽  
Low Level ◽  
Destructive Analysis ◽  
Spectrometer System ◽  
Fluorescence Spectrometer ◽  
Non Destructive

scholarly journals Portable X-ray fluorescence spectrometer system using a low-level radioisotope 55Fe.

2002 ◽  
Vol 51 (11) ◽  
pp. 1045-1047
Author(s):  
Susumu SHIMOYAMA ◽  
Yasuko NODA ◽  
Nobuaki KUCHITSU
Keyword(s):  
X Ray ◽  
Low Level ◽  
Spectrometer System ◽  
Fluorescence Spectrometer

scholarly journals Elements Identification in Golden Strawberries (Physalis Peruviana L.) using Wavelength Dispersive X-Ray Fluorescence

2019 ◽  
Vol 7 (6) ◽  
pp. 851
Author(s):  
Uğur Akbaba
Keyword(s):  
Weight Loss ◽  
Functional Food ◽  
Medical Field ◽  
X Ray ◽  
Physalis Peruviana ◽  
Food Properties ◽  
Wide Range ◽  
Important Health ◽  
Fluorescence Spectrometer ◽  
Non Destructive

Physalis peruviana (PP) is a popular exotic fruit due to its functional food properties. This product has a wide range of uses in the medical field, including treatments for cancer, malaria, hepatitis, dermatitis, rheumatism, weight loss, and diabetes. In this study, the PP element concentrations were investigated using a Wave Dispersive X-ray Fluorescence Spectrometer (WDXRF). Al, Ca, Fe, Mn, P, S, Zn, Cl, K, Mg, Na, F, Si, and B were detected, and the Ca, Fe, Zn, P, Na, Mg elements were found in significant amounts. Therefore, PP has some important health elements. For example, Mg and Mn may be associated with diabetes control. WDXRF is a cheap, quick, and non-destructive technique used in the elemental analysis of plant samples.

Colouration mechanism of underglaze copper-red decoration porcelain (AD 13th–14th century), China

2014 ◽  
Vol 21 (4) ◽  
pp. 751-755 ◽  
Author(s):  
Jian Zhu ◽  
Huiping Duan ◽  
Yimin Yang ◽  
Li Guan ◽  
Wei Xu ◽  
...  
Keyword(s):  
Copper Content ◽  
X Ray ◽  
Content Difference ◽  
Valence States ◽  
Scattering Effects ◽  
Orange Region ◽  
Destructive Analysis ◽  
Colour Generation ◽  
X Ray Absorption ◽  
Non Destructive

Underglaze copper-red decoration,i.e.the copper colourant used to paint diversified patterns on the surface of a body and then covered by transparent glaze and fired at high temperature in a reductive firing environment, is famous all over the world. However, the red colouration mechanism generated by underglaze copper remains unclear. In particular, the fact that the edges of the red patterns are orange has been ignored in previous research. Here, non-destructive analysis has been carried out on a precious fragment of early underglaze red porcelain using synchrotron radiation X-ray fluorescence, X-ray absorption near-edge spectroscopy (XANES) and reflection spectrometry techniques. The results suggest that the copper content in the red region is higher than that in the orange region, and other colour generation elements do not have obvious content difference, indicating that the colour generation effect of the underglaze red product is related to the copper content. XANES analysis shows that the valence states of copper in the red and orange regions are similar and metal copper contributes to their hues. The results of reflection spectrometry demonstrate that tiny orange hues could be attributed to the Mie scatting effect. Therefore, light-scattering effects should be considered when researching the colouration mechanism of underglaze red.

Sxes Study of Transition Metal Silicide Films and their Contacts to Semiconductors

1990 ◽  
Vol 187 ◽  
Author(s):  
H. Watabe ◽  
M. Iwami ◽  
M. Hirai ◽  
M. Kusaka ◽  
M. Kubota ◽  
...  
Keyword(s):  
Transition Metal ◽  
Single Crystals ◽  
Emission Spectroscopy ◽  
Primary Electron ◽  
Contact System ◽  
Metal Silicide ◽  
X Ray ◽  
Atomic Structures ◽  
Destructive Analysis ◽  
Non Destructive

AbstractSpectra obtained by a new soft x-ray emission spectroscopy(SXES) apparatus again exhibited clear differences among Si-compounds and Si crystal. A non-destructive analysis of an annealed transition metal(TMSi:film)/Si(111) contact system was carried out using either the distinct differences of Si L2, 3 SXES spectra between TMSi's and Si single crystals or the fad that the soft x-ray production depth increases in a solid with the energy of the primary electron, Ep. It was shown that the apparatus was capable of exploring electronic and atomic structures of a multi-layered contact system grown on a Si(111) substrate.

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