scholarly journals Non-destructive and Quantitative Viscoelastic-Mapping of Cellulose Nanofibrils Using Low-Total-Force Contact Resonance Force Microscopy (LTF-CRFM)1

Author(s):  
Kristen M. Hess ◽  
Jason P. Killgore ◽  
Wil V. Sr

Abstract Low-total-force contact resonance force microscopy (LTF-CRFM), an atomic force microscopy method, is introduced as a non-destructive means to quantify the local viscoelastic loss tangent (δ) of cellulose nanofibrils (CNFs). The method limits static and dynamic forces during measurement to minimize substrate and geometry effects and to reduce the potential for stress-induced CNF damage. LTF-CRFM uses Brownian motion to achieve the thermally-limited lowest dynamic force, while approaching adhesive pull-off to achieve the low static force. LTF-CRFM measurements were shown to generate analyzable data without evidence of nonlinear artifacts and without damage to the CNF over static forces ranging from 11.6 nN to 84.6 nN. The measured δ of CNFs was 0.015 ± 0.0094, which is the first reported δ measurement of an isolated CNF. Finally, LTF-CRFM successfully mapped δ along the length of CNFs to determine that kink defects along the CNF do not impart a local viscoelastic property change at the length scale of the measurement.

2013 ◽  
Vol 829 ◽  
pp. 534-538 ◽  
Author(s):  
Alireza Shakeri ◽  
Sattar Radmanesh

Cellulose nanofibrils ( NF ) have several advantages such as biodegradability and safety toward human health. Zein is a biodegradable polymer with potential use in food packaging applications. It appears that polymer nanocomposites are one of the most promising applications of zein films. Cellulose NF were prepared from starting material Microcrystalline cellulose (MCC) by an application of a high-pressure homogenizer at 20,000 psi and treatment consisting of 15 passes. Methods such as atomic force microscopy were used for confirmation of nanoscale size production of cellulose. The average diameter 45 nm were observed. Zeincellulose NF nanocomposite films were prepared by casting ethanol suspensions of Zein with different amounts of cellulose NF in the 0% to 5%wt. The nanocomposites were characterized by using Fourier transform infrared spectroscopy ( FTIR ), Atomic force microscopy ( AFM ) and X-ray diffraction ( XRD ) analysis. From the FTIR spectra the various groups present in the Zein blend were monitored. The homogeneity, morphology and crystallinity of the blends were ascertained from the AFM and XRD data, respectively. The thermal resistant of the zein nanocomposite films improved as the nanocellulose content increased. These obtained materials are transparent, flexible and present significantly better physical properties than the corresponding unfilled Zein films.


2018 ◽  
Vol 113 (8) ◽  
pp. 083102
Author(s):  
C. Ma ◽  
V. Pfahl ◽  
Z. Wang ◽  
Y. Chen ◽  
J. Chu ◽  
...  

2018 ◽  
Vol 124 (1) ◽  
pp. 014503 ◽  
Author(s):  
Matteo Aureli ◽  
Syed N. Ahsan ◽  
Rafiul H. Shihab ◽  
Ryan C. Tung

Author(s):  
C. Julian Chen

This chapter discusses atomic force microscopy (AFM), focusing on the methods for atomic force detection. Although the force detection always requires a cantilever, there are two types of modes: the static mode and the dynamic mode. The general design and the typical method of manufacturing of the cantilevers are discussed. Two popular methods of static force detection are presented. The popular dynamic-force detection method, the tapping mode is described, especially the methods in liquids. The non-contact AFM, which has achieved atomic resolution in the weak attractive force regime, is discussed in detail. An elementary and transparent analysis of the principles, including the frequency shift, the second harmonics, and the average tunneling current, is presented. It requires only Newton’s equation and Fourier analysis, and the final results are analyzed over the entire range of vibrational amplitude. The implementation is briefly discussed.


2006 ◽  
Vol 100 (7) ◽  
pp. 074315 ◽  
Author(s):  
Osamu Takeuchi ◽  
Takaaki Miyakoshi ◽  
Atsushi Taninaka ◽  
Katsunori Tanaka ◽  
Daichi Cho ◽  
...  

2018 ◽  
Vol 9 ◽  
pp. 945-952 ◽  
Author(s):  
Christopher C Glover ◽  
Jason P Killgore ◽  
Ryan C Tung

This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon. Above a critical scan speed, a monotonic decrease in the recorded contact-resonance frequency is observed with increasing scan speed. Proper characterization and understanding of this phenomenon is necessary to conduct accurate quantitative imaging using contact-resonance AFM, and other contact-mode AFM techniques, at higher scan speeds. A squeeze film hydrodynamic theory is proposed to explain this phenomenon, and model predictions are compared against the experimental data.


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