Infrared Response of Impurity Doped Silicon MOSFET's: Experimental Characterization of the Infrared Response of Gold Doped Silicon MOSFET's (IRFET's)

High resolution transmission electron microscopy (HRTEM) is the effective technique for characterization of detailed structure of semiconductor materials. Oxygen is one of the important impurities in semiconductors. Detailed structure of highly oxygen doped silicon has not clearly investigated yet. This report describes detailed structure of highly oxygen doped silicon observed by HRTEM. Both samples prepared by Molecular beam epitaxy (MBE) and ion implantation were observed to investigate effects of oxygen concentration and doping methods to the crystal structure.The observed oxygen doped samples were prepared by MBE method in oxygen environment on (111) substrates. Oxygen concentration was about 1021 atoms/cm3. Another sample was silicon of (100) orientation implanted with oxygen ions at an energy of 180 keV. Oxygen concentration of this sample was about 1020 atoms/cm3 Cross-sectional specimens of (011) orientation were prepared by argon ion thinning and were observed by TEM at an accelerating voltage of 400 kV.

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Experimental characterization of the solid phase chaotic dynamics in three-phase fluidization

International Journal of Multiphase Flow ◽

10.1016/s0301-9322(97)88294-8 ◽

1996 ◽

Vol 22 ◽

pp. 113

Author(s):

M Cassanello

Keyword(s):

Chaotic Dynamics ◽

Solid Phase ◽

Experimental Characterization ◽

Three Phase

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Experimental characterization of a laminar diffusion flame in micro-gravity

Journal de Chimie Physique ◽

10.1051/jcp:1999190 ◽

1999 ◽

Vol 96 (6) ◽

pp. 1022-1030 ◽

Cited By ~ 3

Author(s):

T. Vietoris ◽

P. Joulain ◽

J. L. Torero

Keyword(s):

Diffusion Flame ◽

Experimental Characterization ◽

Laminar Diffusion Flame ◽

Laminar Diffusion ◽

Micro Gravity

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Experimental Characterization of the Reliability of 3-Terminal Dual-Damascene Copper Interconnect Trees

MRS Proceedings ◽

10.1557/proc-716-b8.13 ◽

2002 ◽

Vol 716 ◽

Cited By ~ 4

Author(s):

C. L. Gan ◽

C. V. Thompson ◽

K. L. Pey ◽

W. K. Choi ◽

F. Wei ◽

...

Keyword(s):

Stress Conditions ◽

Experimental Characterization ◽

Contact Lines ◽

Tree Structures ◽

Similar Test ◽

Dual Damascene ◽

Copper Interconnect ◽

Test Conditions

AbstractElectromigration experiments have been carried out on simple Cu dual-damascene interconnect tree structures consisting of straight via-to-via (or contact-to-contact) lines with an extra via in the middle of the line. As with Al-based interconnects, the reliability of a segment in this tree strongly depends on the stress conditions of the connected segment. Beyond this, there are important differences in the results obtained under similar test conditions for Al-based and Cu-based interconnect trees. These differences are thought to be associated with variations in the architectural schemes of the two metallizations. The absence of a conducting electromigrationresistant overlayer in Cu technology, and the possibility of liner rupture at stressed vias lead to significant differences in tree reliabilities in Cu compared to Al.

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EXPERIMENTAL CHARACTERIZATION OF VVER-440 REACTOR CONTAINMENT TYPE SPRAY NOZZLE

Atomization and Sprays ◽

10.1615/atomizspr.2015011801 ◽

2016 ◽

Vol 26 (3) ◽

pp. 235-255 ◽

Cited By ~ 1

Author(s):

Jeanne Malet ◽

Z. Parduba

Keyword(s):

Spray Nozzle ◽

Experimental Characterization

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Experimental Characterization of Mechanical Behavior of Cord-Rubber Composites

Tire Science and Technology ◽

10.2346/1.2150974 ◽

1982 ◽

Vol 10 (1) ◽

pp. 37-54 ◽

Cited By ~ 11

Author(s):

M. Kumar ◽

C. W. Bert

Keyword(s):

Response Characteristic ◽

Cord Compression ◽

Complete Characterization ◽

Strain Response ◽

Strain Gages ◽

Experimental Characterization ◽

Rubber Composites ◽

Stress Strain ◽

Strain Data

Abstract Unidirectional cord-rubber specimens in the form of tensile coupons and sandwich beams were used. Using specimens with the cords oriented at 0°, 45°, and 90° to the loading direction and appropriate data reduction, we were able to obtain complete characterization for the in-plane stress-strain response of single-ply, unidirectional cord-rubber composites. All strains were measured by means of liquid mercury strain gages, for which the nonlinear strain response characteristic was obtained by calibration. Stress-strain data were obtained for the cases of both cord tension and cord compression. Materials investigated were aramid-rubber, polyester-rubber, and steel-rubber.

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