Foul WX Underground: The Dynamics of Resistance and the Analog Logic of Communication during a Digital Blackout

2009 ◽  
Author(s):  
Michael D. Parsons
Keyword(s):  

Author(s):  
M.A. Massetti ◽  
E.D. Johnson ◽  
D.L. Mariano ◽  
L.D. Smith ◽  
D.R. Willmott ◽  
...  


1971 ◽  
Vol 3 (2) ◽  
pp. 114-114
Author(s):  
Lloyd J. Frei
Keyword(s):  


SIMULATION ◽  
1969 ◽  
Vol 12 (4) ◽  
pp. 201-204
Author(s):  
K. Søe Højberg

Two types of continuously working hybrid integrators with analog input and digital output have been realized by means of standard analog computer equipment. The basic units are voltage-to-frequency converters. The in tegral is measured in quanta determined by the reference voltage and a pulse width (clock controlled) or the size of a capacitor.



SIMULATION ◽  
1967 ◽  
Vol 8 (5) ◽  
pp. 255-257 ◽  
Author(s):  
Willard A. Gilly

Several methods have been devised for generating Bode diagrams on an analog computer. All of them, or at least all of them that we are familiar with, are either imprecise or they are excessively laborious. And the method most commonly used by analog pro grammers -graphical comparison of variables on a strip chart recording-combines both disadvantages. These can be largely avoided by a method we have found quite convenient, using analog logic and memory equipment. Our method yields phase and gain information directly and requires no manual adjustments by the computer operator other than to change the frequency of the input signal and to adjust the abscissa of the X-Y plotter. The method can be used for both open-loop and closed-loop systems and is especially useful for obtaining the open-loop response of a closed-loop system, as in figure 1. Here is how it works:



2016 ◽  
Vol 111 ◽  
pp. 1-6 ◽  
Author(s):  
Qi Chen ◽  
Si-Youl Yoo ◽  
Yong-Ho Chung ◽  
Ji-Young Lee ◽  
Junhong Min ◽  
...  


Author(s):  
Magdalena Sienkiewicz ◽  
Kevin Sanchez ◽  
Abdellatif Firiti ◽  
Olivier Crepel ◽  
Philippe Perdu ◽  
...  

Abstract Soft defect localization techniques based on laser stimulation have become key techniques for a wide range of FA/debug issues. In this paper, we demonstrate the ability of these techniques to solve critical design issue in mixed-mode device for automotive application which includes analog, logic, RF and power. Utilizing a wide range of laser stimulation techniques, we have determined the most efficient approach for this device to achieve the shortest cycle time. We have established a clear link between fault isolation by laser stimulation techniques and the abnormal behavior of the device with relevant and complete simulation at transistor level.



Author(s):  
Kailiang Chen ◽  
Jonathan Leu ◽  
Neil Gershenfeld
Keyword(s):  




1978 ◽  
Vol 157 (2) ◽  
pp. 401-403 ◽  
Author(s):  
Charles A. Rey ◽  
Richard J. Wojslaw ◽  
John A. Poirier ◽  
James T. Volk


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