Studies on the Contamination Status of the Danube River Basin Waters, Measures of Protection, and Rational Exploitation of the Water Resources

The water quality of the surface and ground waters, and the characteristics of the aquatic organism communities of the Yugoslav stretch of the River Danube were investigated. River flow rates were estimated according to recorded water levels and the hydrodynamic and morphological characteristics of certain profiles, and by using a mathematical model which included operation of the Djerdap Hydroelectric Power Station (HEPS). During May 1986, water flow rates were 3200 to 6000 m3/s, and in September they were two, times slower. All physical and chemical parameters were determined using standard Yugoslav and German methods (DEV). Regarding the 14 metals analysed, the water samples were satisfactory, while the contents of metals in the pelitic fraction (i.e., diameter ≤ 2 µm) of the sediments indicated the existence of pollution. The pelitic fraction of the sediments was subjected to trace element analysis by an emission spectrographic technique using germanium as the internal standard. The overall precision was ± 12%. Water ecosystem saprobity was estimated according to Pantle-Buck and Roth-schein. The saprobity ranged from beta to alpha-betamesosaprobity. The contents of trace elements in the water, sediment, and aquatic communities indicated the transfer of pollutants between the various ecosystem compartments.

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TRACE ELEMENT ANALYSIS IN FLOUR

International Journal of PIXE ◽

10.1142/s0129083595000113 ◽

1995 ◽

Vol 05 (02n03) ◽

pp. 79-84 ◽

Cited By ~ 1

Author(s):

YOICHI HARUYAMA ◽

MANABU SAITO ◽

KOJI YOSHIDA

Keyword(s):

Trace Elements ◽

Nitric Acid ◽

Trace Element Analysis ◽

Internal Standard ◽

Microwave Oven ◽

Element Analysis ◽

Target Preparation ◽

Wet Ashing ◽

Standard Solution ◽

Made In

Trace elements in five kinds of flour which were made in Japan. America and Canada, have been measured by means of in-air PIXE. Twelve kinds of trace elements were detected, such as Cl, K, Ca, Sc, Cr, Mn, Fe, Co, Ni, Cu, Zn and Br. The concentration of these elements varied depending on the place where they were made. In order to check the target preparation procedure, two types of sample preparation have been used, such as wet ashing by nitric acid in a microwave oven and making a paste by an internal standard solution. Comparisons of the results of both samples ensures that bromine was not lost during micro-wave oven heating. Analytic fitting of PIXE spectra by a personal computer and a commercial apllication software was successfully used.

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An improved interference correction for trace element analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100132868 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1646-1647

Author(s):

John J. Donovan ◽

Donald A. Snyder ◽

Mark L. Rivers

Keyword(s):

Trace Element Analysis ◽

Accurate Estimate ◽

Simple Expression ◽

Standard Reference Materials ◽

Characteristic Line ◽

Analytical Line ◽

Element Analysis ◽

Electron Probe Analysis ◽

Calculated Concentration ◽

X Ray

We present a simple expression for the quantitative treatment of interference corrections in x-ray analysis. WDS electron probe analysis of standard reference materials illustrate the success of the technique.For the analytical line of wavelength λ of any element A which lies near or on any characteristic line of another element B, the observed x-ray counts at We use to denote x-ray counts excited by element i in matrix j (u=unknown; s=analytical standard; ŝ=interference standard) at the wavelength of the analytical line of A, λA (Fig. 1). Quantitative analysis of A requires an accurate estimate of These counts can be estimated from the ZAF calculated concentration of B in the unknown C,Bu measured counts at λA in an interference standard of known concentration of B (and containing no A), and ZAF correction parameters for the matrices of both the unknown and the interference standard at It can be shown that:

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Trace Element Analysis in Biological Specimens

10.1016/s0167-9244(08)x7008-8 ◽

1994 ◽

Keyword(s):

Trace Element ◽

Trace Element Analysis ◽

Element Analysis

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Reconstructing sea turtle ontogenetic habitat shifts through trace element analysis of bone tissue

Marine Ecology Progress Series ◽

10.3354/meps12796 ◽

2019 ◽

Vol 608 ◽

pp. 247-262 ◽

Cited By ~ 2

Author(s):

MD Ramirez ◽

JA Miller ◽

E Parks ◽

L Avens ◽

LR Goshe ◽

...

Keyword(s):

Trace Element ◽

Bone Tissue ◽

Trace Element Analysis ◽

Sea Turtle ◽

Element Analysis ◽

Ontogenetic Habitat Shifts

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Method of Detecting Trace Metal Contamination in Thick-Film SOI Device

ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2005p0220 ◽

2005 ◽

Author(s):

Yasunori Goto ◽

Hiroomi Eguchi ◽

Masaru Iida

Keyword(s):

Trace Metal ◽

Thick Film ◽

Metal Contamination ◽

Semiconductor Device ◽

Trace Element Analysis ◽

Silicon On Insulator ◽

Element Analysis ◽

Trace Metal Contamination ◽

Trace Metal Elements ◽

Output Characteristics

Abstract In the automotive IC using thick-film silicon on insulator (SOI) semiconductor device, if the gettering capability of a SOI wafer is inadequate, electrical characteristics degradation by metal contamination arises and the yield falls. At this time, an automotive IC was made experimentally for evaluation of the gettering capability as one of the purposes. In this IC, one of the output characteristics varied from the standard, therefore failure analysis was performed, which found trace metal elements as one of the causes. By making full use of 3D perspective, it is possible to fabricate a site-specific sample into 0.1 micrometre in thickness without missing a failure point that has very minute quantities of contaminant in a semiconductor device. Using energy dispersive X-ray, it is possible to detect trace metal contamination at levels 1E12 atoms per sq cm. that are conventionally detected only by trace element analysis.

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