scholarly journals Распределение кластеров, сформированных sp-=SUP=-2-=/SUP=-- и sp-=SUP=-3-=/SUP=--связями, в углеродной алмазоподобной тонкой пленке

2021 ◽  
Vol 91 (4) ◽  
pp. 615
Author(s):  
В.А. Плотников ◽  
С.В. Макаров ◽  
О.О. Еремеенкова ◽  
А.А. Шуткин

Diamond-like thin films obtained by condensation on carbon metal substrates from a vapor-gas phase are presented. Graphite targets were evaporated by defocused laser radiation. Using the hardware-software complex of a scanning probe microscope in the tunnel current mode, the distribution of regions with sp2 and sp3 bonds in a diamond-like film is analyzed. It is shown that the structure of a diamond-like film consists of large diamond non-conducting fragments with sp3 bonds, along the boundaries of which current regions with sp2 bonds are localized.

Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.


Author(s):  
Andrey Anatiljevich Malakhov ◽  
Elena V. Smirnova ◽  
Nikolay Vishnyakov ◽  
Tatiana Kholomina ◽  
Peter Willmot

The chapter is devoted to the development of an analytical methodology of forming future engineers' meta-competences (interdisciplinary, meta-creative, and meta-cognitive) when he/she works on unique scientific equipment. The authors research a hypothesis about the possibility of estimating quality of education and identifying competences in engineering courses by measurement of students' activities as well as outcomes. An example is described of the criterion revealing during laboratory work with a scanning probe microscope “Nanoeducator.” The experiment is a part of a multifunctional scientific complex for the development and research of thin films. Results of the parameter evaluation are shown in graphs using MATLAB software. This chapter is a new direction towards discovering methods and algorithms to define and evaluate future engineers' meta-competence.


2000 ◽  
Vol 47 (4) ◽  
pp. 801-807 ◽  
Author(s):  
Hyunjung Shin ◽  
Kyung-Mee Lee ◽  
Won-Kyu Moon ◽  
Jong Up Jeon ◽  
Geunbae Lim ◽  
...  

2007 ◽  
Vol 51 (92) ◽  
pp. 655 ◽  
Author(s):  
J. Y. Son ◽  
Seongsik Min ◽  
C. H. Kim ◽  
Bog G. Kim ◽  
J. H. Cho

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