Comparison of Evaluation Results of Nailed Joints in Shear Properties Obtained by Two Methods

2019 ◽  
Vol 51 (4) ◽  
pp. 441-447
Author(s):  
K. Ogawa
Keyword(s):  
2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Jianguo Cui ◽  
Keke Zhang ◽  
Di Zhao ◽  
Yibo Pan

AbstractThrough ultrasonic wave assisted Sn2.5Ag0.7Cu0.1RExNi/Cu (x = 0, 0.05, 0.1) soldering test and − 40 to 125 °C thermal shock test, the microstructure and shear properties of Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints under thermal cycling were studied by the SEM, EDS and XRD. The results show that the Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints with high quality and high reliability can be obtained by ultrasonic assistance. When the ultrasonic vibration power is 88 W, the ultrasonic-assisted Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu solder joints exhibits the optimized performance. During the thermal cycling process, the shear strength of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints had a linear relationship with the thickness of interfacial intermetallic compound (IMC). Under the thermal cycling, the interfacial IMC layer of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints consisted of (Cu,Ni)6Sn5 and Cu3Sn. The thickness of interfacial IMC of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints was linearly related to the square root of equivalent time. The growth of interfacial IMC of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints had an incubation period, and the growth of IMC was slow within 300 cycles. And after 300 cycles, the IMC grew rapidly, the granular IMC began to merge, and the thickness and roughness of IMC increased obviously, which led to a sharp decrease in the shear strength of the solder joints. The 0.05 wt% Ni could inhibit the excessive growth of IMC, improve the shear strength of solder joints and improve the reliability of solder joints. The fracture mechanism of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints changed from the ductile–brittle mixed fracture in the solder/IMC transition zone to the brittle fracture in the interfacial IMC.


2021 ◽  
Vol 216 ◽  
pp. 231-249
Author(s):  
Massimo Paradiso ◽  
Salvatore Sessa ◽  
Nicolò Vaiana ◽  
Francesco Marmo ◽  
Luciano Rosati

2017 ◽  
Vol 61 ◽  
pp. 396-403 ◽  
Author(s):  
Aswani Kumar Bandaru ◽  
Vijay Kumar Mittal ◽  
Suhail Ahmad ◽  
Naresh Bhatnagar

2014 ◽  
Vol 73 ◽  
pp. 178-185 ◽  
Author(s):  
Zhang Lu ◽  
Lv Jianguo

1977 ◽  
Vol 20 (2) ◽  
pp. 152-160 ◽  
Author(s):  
J. K. A. Amuzu ◽  
B. J. Briscoe ◽  
D. Tabor

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