Real-space cathodoluminescence imaging on an integrated correlative light and electron microscope

2021 ◽  
Author(s):  
Sangeetha Hari ◽  
Keyword(s):  
Electron Microscope ◽  
Real Space ◽  
Cathodoluminescence Imaging

Identification of site-specific isotopic labels by vibrational spectroscopy in the electron microscope

Science ◽  
2019 ◽  
Vol 363 (6426) ◽  
pp. 525-528 ◽  
Author(s):  
Jordan A. Hachtel ◽  
Jingsong Huang ◽  
Ilja Popovs ◽  
Santa Jansone-Popova ◽  
Jong K. Keum ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Spatial Resolution ◽  
Theoretical Calculations ◽  
Scanning Transmission Electron Microscope ◽  
Real Space ◽  
Site Specific ◽  
Spatially Resolved ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Isotopic Labels

The identification of isotopic labels by conventional macroscopic techniques lacks spatial resolution and requires relatively large quantities of material for measurements. We recorded the vibrational spectra of an α amino acid, l-alanine, with damage-free “aloof” electron energy-loss spectroscopy in a scanning transmission electron microscope to directly resolve carbon-site–specific isotopic labels in real space with nanoscale spatial resolution. An isotopic red shift of 4.8 ± 0.4 milli–electron volts in C–O asymmetric stretching modes was observed for 13C-labeled l-alanine at the carboxylate carbon site, which was confirmed by macroscopic infrared spectroscopy and theoretical calculations. The accurate measurement of this shift opens the door to nondestructive, site-specific, spatially resolved identification of isotopically labeled molecules with the electron microscope.

Image processing of nonperiodic electron micrographs

1987 ◽  
Vol 45 ◽  
pp. 102-103
Author(s):  
S. McKernan
Keyword(s):  
Image Processing ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Real Space ◽  
Lattice Position ◽  
Transmission Electron ◽  
Fourier Filtering ◽  
Unit Cells ◽  
Lattice Images ◽  
Many Sources

The information contained in transmission electron microscope (TEM) images originates from many sources. It is the aim of image processing to extract those details of the image that arise from features of interest in the specimen, and to supress the remaining details. For periodic micrographs (lattice images of perfect crystals for example) this has been accomplished typically by either averaging over many unit cells in real space or through the use of Fourier filtering techniques in reciprocal space. Both of these techniques rely on the fact that useful information occurs periodically (i.e. at each lattice position) so that departures from this periodicity are a result of image degradation only. Obviously if there are departures from perfect regularity in the image, as at a stacking fault or a twin boundary for example, supressing the non-periodic information will not reveal much about the nature of the faults.

scholarly journals The Photon Detector and the Variable-Pressure Scanning Electron Microscope An Alternative Method for Cathodoluminescence Imaging of Geologic Materials

2006 ◽  
Vol 12 (S02) ◽  
pp. 1530-1531 ◽  
Author(s):  
T Williams ◽  
F Bailey
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Variable Pressure ◽  
Photon Detector ◽  
Geologic Materials ◽  
Alternative Method ◽  
Cathodoluminescence Imaging ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois

2010 ◽  
Vol 16 (2) ◽  
pp. 183-193 ◽  
Author(s):  
Jianguo Wen ◽  
James Mabon ◽  
Changhui Lei ◽  
Steve Burdin ◽  
Ernie Sammann ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Transmission Electron Microscope ◽  
Spherical Aberration ◽  
Real Space ◽  
Dark Field ◽  
Atomic Scale ◽  
Transmission Electron ◽  
Scanning Transmission

AbstractWe evaluate the probe forming capability of a JEOL 2200FS transmission electron microscope equipped with a spherical aberration (Cs) probe corrector. The achievement of a real space sub-Angstrom (0.1 nm) probe for scanning transmission electron microscopy (STEM) imaging is demonstrated by acquisition and modeling of high-angle annular dark-field STEM images. We show that by optimizing the illumination system, large probe currents and large collection angles for electron energy loss spectroscopy (EELS) can be combined to yield EELS fine structure data spatially resolved to the atomic scale. We demonstrate the probe forming flexibility provided by the additional lenses in the probe corrector in several ways, including the formation of nanometer-sized parallel beams for nanoarea electron diffraction, and the formation of focused probes for convergent beam electron diffraction with a range of convergence angles. The different probes that can be formed using the probe corrected STEM opens up new applications for electron microscopy and diffraction.

scholarly journals A NEW DEVELOPMENT IN THE REAL SPACE HIGH RESOLU-TION ELECTRON MICROSCOPE SIMULATION METHOD

1989 ◽  
Vol 38 (9) ◽  
pp. 1521
Author(s):  
WANG YUAN-MING ◽  
CHEN JIANG-HUA ◽  
HU TIAN-BAO
Keyword(s):  
Electron Microscope ◽  
Simulation Method ◽  
Real Space ◽  
The Real ◽  
New Development
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