scholarly journals Scanning electron microscopy of hyphal interaction between Streptomyces griseoviridis and some plant pathogenic fungi

1991 ◽  
Vol 63 (5) ◽  
pp. 435-441
Author(s):  
Eeva Tapio ◽  
Arja Pohto-Lahdenperä
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Pathogenic Fungi ◽  
Pythium Ultimum ◽  
Alternaria Brassicicola ◽  
Plant Pathogenic Fungi ◽  
Turnip Rape ◽  
Phomopsis Sclerotioides ◽  
Streptomyces Griseoviridis ◽  
Scanning Electron

The interaction between Streptomyces griseoviridis and the pathogens Alternaria brassicicola, Botrytis cinerea, Fusarium oxysporum, Mycocentrospora acerina, Rhizoctonia solani and Sclerotinia sclerotiorum was studied by SEM both on autoclaved seeds and living seedlings of turnip rape and carrot and the fungi Phomopsis sclerotioides and Pythium ultimum on cucumber seedlings. The samples were prepared by the standard method for examination by scanning electron microscope. The hyperparasitism of S. griseoviridis was clearly shown. S. griseoviridis tightly wound around Alternaria conidia and Sclerotinia hyphae, eventually disintegrating them. It grew along the hyphae of B. cinerea, P. sclerotioides and M. acerina, dissolving them. The hypha of F. oxysporum seemed to be slightly affected, and its conidia not at all. The hyperparasite grew only loosely on the hypha of R. solani and on the mycelium and oogonia of Pythium which seemed not to sustain much injury.

Scanning electron microscopy of perithecial development in a species of Phyllactinia on oak

1974 ◽  
Vol 52 (10) ◽  
pp. 2175-2179 ◽  
Author(s):  
James L. Harris ◽  
Ivan L. Roth
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Surface Structure ◽  
Pathogenic Fungi ◽  
Plant Pathogenic Fungi ◽  
Fruiting Bodies ◽  
Scanning Electron ◽  
Study Development

A species of Phyllactinia on oak was examined by scanning electron microscopy. The naturally dried fungus was minimally manipulated in preparation for study. Development was followed by examining various stages from initial to mature perithecium. Immature perithecial appendages were found to be less rigid than those which had matured. The sticky apical mucilage droplet on the maturing perithecium was observed, but the penicillate cells that form the droplet were not easily seen. As the appendages dried they lifted the perithecium off the surrounding surface. Some perithecia were found that had overturned and adhered to the hyphae-covered leaf by means of the mucilage droplet. This study has resulted in visualization of Phyllactinia surface structure in more detail than heretofore reported. Other plant pathogenic fungi, especially those producing naturally dry mature fruiting bodies, should be amenable to study by this method.

Detection of Calcium in the Adhesive Material Obtained from the Plant Pathogen Colletotrichum Graminicola'. X Ray Microanalysis (Eds) Evidences

2000 ◽  
Vol 6 (S2) ◽  
pp. 698-699
Author(s):  
B. Leite ◽  
M.L. Ishida ◽  
E. Alves ◽  
S.F. Pascholati ◽  
J.A. Sugui
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Vacuum ◽  
Pathogenic Fungi ◽  
Colletotrichum Graminicola ◽  
Adhesive Material ◽  
X Ray ◽  
Artificial Surface ◽  
Appressoria Formation ◽  
Scanning Electron

The appressoria formation of Colletotrichum graminicola was monitored by scanning electron microscopy (SEM) coupled with an X Ray microanalysis system (EDS - Oxford Instrument LINK ISIS). Recently formed appressoria, an infection structure of plant pathogenic fungi, firmly glues itself to an artificial surface (polystyrene) as a consequence of the production of an adhesive material (AM). The nature of this material was already demonstrated to be mainly constituted of a glycoprotein (Sugui et al, PMPP, 1998). The objective of this work was to verify the involvement of divalent ions, specially calcium, in the process as whole.The AM was isolated and purified from conidia that germinated on polystyrene Petri dishes. The primary AM was dialyzed against three liters of distilled water before being lyophilized. Subsequently, the material was placed on top of a carbon tape and observed by scanning electron microscopy under high vacuum (Fig. 1 and 2A). On the other hand, the same material was submitted to X Ray microanalysis without coating.

Application of Scanning Electron Microscopy to paraffin-embedded plant tissues to study invasive processes of plant-pathogenic fungi

1986 ◽  
Vol 44 ◽  
pp. 282-283
Author(s):  
E. G. Kokko ◽  
D. A. Gaudet
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Light Microscopy ◽  
Pathogenic Fungus ◽  
Three Dimensional ◽  
Pathogenic Fungi ◽  
Great Depth ◽  
Development Processes ◽  
Wheat Leaves ◽  
Scanning Electron

Scanning electron microscopy (SEM) applied to paraffin-embedded tissue section is compared with the traditional techniques of light microscopy (LM) and surface SEM for the study of invasion by a plant-pathogenic fungus. SEM of paraffin-embedded sections of wheat leaves infected by Coprinus psychromorbidus consistently yielded high-quality micrographs showing three-dimensional views of both internal and external disease development processes. When the orientation of the specimen in the SEM is manipulated, the specimen can be viewed from different perspectives. The technique is simple and inexpensive and combines the advantages of great depth of focus and high resolution of the SEM with the simple preparatory techniques employed for light microscopy.

Pathogenesis of Human Hair Defects

1974 ◽  
Vol 32 ◽  
pp. 12-13
Author(s):  
P.S. Porter ◽  
T. Aoyagi ◽  
R. Matta
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Human Hair ◽  
Standard Techniques ◽  
Scanning Electron

Using standard techniques of scanning electron microscopy (SEM), over 1000 human hair defects have been studied. In several of the defects, the pathogenesis of the abnormality has been clarified using these techniques. It is the purpose of this paper to present several distinct morphologic abnormalities of hair and to discuss their pathogenesis as elucidated through techniques of scanning electron microscopy.

Ultrastructural Analysis of the Salivary Glands of Gromphadorhina Portentosa (Schaum)

1977 ◽  
Vol 35 ◽  
pp. 638-639
Author(s):  
P.J. Dailey
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Salivary Glands ◽  
Secretory Vesicles ◽  
The Past ◽  
Transmission Electron ◽  
Means Of Transmission ◽  
Gromphadorhina Portentosa ◽  
Scanning Electron ◽  
Topographical Relief

The structure of insect salivary glands has been extensively investigated during the past decade; however, none have attempted scanning electron microscopy (SEM) in ultrastructural examinations of these secretory organs. This study correlates fine structure by means of SEM cryofractography with that of thin-sectioned epoxy embedded material observed by means of transmission electron microscopy (TEM).Salivary glands of Gromphadorhina portentosa were excised and immediately submerged in cold (4°C) paraformaldehyde-glutaraldehyde fixative1 for 2 hr, washed and post-fixed in 1 per cent 0s04 in phosphosphate buffer (4°C for 2 hr). After ethanolic dehydration half of the samples were embedded in Epon 812 for TEM and half cryofractured and subsequently critical point dried for SEM. Dried specimens were mounted on aluminum stubs and coated with approximately 150 Å of gold in a cold sputtering apparatus.Figure 1 shows a cryofractured plane through a salivary acinus revealing topographical relief of secretory vesicles.

Two- or three-way observations of the identical cell elements within the same sections by LM, TEM and/or SEM

1978 ◽  
Vol 36 (2) ◽  
pp. 82-83 ◽  
Author(s):  
Nakazo Watari ◽  
Yasuaki Hotta ◽  
Yoshio Mabuchi
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Fine Structure ◽  
Light Microscopy ◽  
Thin Sections ◽  
Transmission Electron ◽  
Identical Cell ◽  
Electron Microscopes ◽  
Scanning Electron

It is very useful if we can observe the identical cell elements within the same sections by light microscopy (LM), transmission electron microscopy (TEM) and/or scanning electron microscopy (SEM) sequentially, because, the cell fine structure can not be indicated by LM, while the color is; on the other hand, the cell fine structure can be very easily observed by EM, although its color properties may not. However, there is one problem in that LM requires thick sections of over 1 μm, while EM needs very thin sections of under 100 nm. Recently, we have developed a new method to observe the same cell elements within the same plastic sections using both light and transmission (conventional or high-voltage) electron microscopes.In this paper, we have developed two new observation methods for the identical cell elements within the same sections, both plastic-embedded and paraffin-embedded, using light microscopy, transmission electron microscopy and/or scanning electron microscopy (Fig. 1).

Spontaneous Cataract in Nude Athymic Mice

1977 ◽  
Vol 35 ◽  
pp. 512-513
Author(s):  
Ronald H. Bradley ◽  
R. S. Berk ◽  
L. D. Hazlett
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Nude Mouse ◽  
Cellular Immunity ◽  
Phosphate Buffer ◽  
Osmium Tetroxide ◽  
Athymic Mice ◽  
Transmission Microscopy ◽  
Mouse Lens ◽  
Scanning Electron

The nude mouse is a hairless mutant (homozygous for the mutation nude, nu/nu), which is born lacking a thymus and possesses a severe defect in cellular immunity. Spontaneous unilateral cataractous lesions were noted (during ocular examination using a stereomicroscope at 40X) in 14 of a series of 60 animals (20%). This transmission and scanning microscopic study characterizes the morphology of this cataract and contrasts these data with normal nude mouse lens.All animals were sacrificed by an ether overdose. Eyes were enucleated and immersed in a mixed fixative (1% osmium tetroxide and 6% glutaraldehyde in Sorenson's phosphate buffer pH 7.4 at 0-4°C) for 3 hours, dehydrated in graded ethanols and embedded in Epon-Araldite for transmission microscopy. Specimens for scanning electron microscopy were fixed similarly, dehydrated in graded ethanols, then to graded changes of Freon 113 and ethanol to 100% Freon 113 and critically point dried in a Bomar critical point dryer using Freon 13 as the transition fluid.

Scanning and Transmission Microscopy of Nematocyst Batteries in Epitheliomuscular Cells of Hydra

1971 ◽  
Vol 29 ◽  
pp. 410-411 ◽  
Author(s):  
Jane A. Westfall ◽  
S. Yamataka ◽  
Paul D. Enos
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Osmium Tetroxide ◽  
External Surface ◽  
Three Dimensional ◽  
Surface Structures ◽  
Transmission Microscopy ◽  
Transmission Electron ◽  
Freeze Dried ◽  
Scanning Electron

Scanning electron microscopy (SEM) provides three dimensional details of external surface structures and supplements ultrastructural information provided by transmission electron microscopy (TEM). Animals composed of watery jellylike tissues such as hydras and other coelenterates have not been considered suitable for SEM studies because of the difficulty in preserving such organisms in a normal state. This study demonstrates 1) the successful use of SEM on such tissue, and 2) the unique arrangement of batteries of nematocysts within large epitheliomuscular cells on tentacles of Hydra littoralis.Whole specimens of Hydra were prepared for SEM (Figs. 1 and 2) by the fix, freeze-dry, coat technique of Small and Màrszalek. The specimens were fixed in osmium tetroxide and mercuric chloride, freeze-dried in vacuo on a prechilled 1 Kg brass block, and coated with gold-palladium. Tissues for TEM (Figs. 3 and 4) were fixed in glutaraldehyde followed by osmium tetroxide. Scanning micrographs were taken on a Cambridge Stereoscan Mark II A microscope at 10 KV and transmission micrographs were taken on an RCA EMU 3G microscope (Fig. 3) or on a Hitachi HU 11B microscope (Fig. 4).

Microbulldozing and Microchiseling

1969 ◽  
Vol 27 ◽  
pp. 134-135
Author(s):  
J.N. Ramsey ◽  
D.P. Cameron ◽  
F.W. Schneider
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Material Handling ◽  
Microprobe Analysis ◽  
Foreign Matter ◽  
Specific Location ◽  
Potential Problems ◽  
Knoop Indenter ◽  
Scanning Electron ◽  
Microhardness Tester

As computer components become smaller the analytical methods used to examine them and the material handling techniques must become more sensitive, and more sophisticated. We have used microbulldozing and microchiseling in conjunction with scanning electron microscopy, replica electron microscopy, and microprobe analysis for studying actual and potential problems with developmental and pilot line devices. Foreign matter, corrosion, etc, in specific locations are mechanically loosened from their substrates and removed by “extraction replication,” and examined in the appropriate instrument. The mechanical loosening is done in a controlled manner by using a microhardness tester—we use the attachment designed for our Reichert metallograph. The working tool is a pyramid shaped diamond (a Knoop indenter) which can be pushed into the specimen with a controlled pressure and in a specific location.

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