Microwave Materials Permittivity and Permeability Measurement Methods

2020 ◽  
Vol 11 (11) ◽  
pp. 4-16
Author(s):  
Stanislav Yu. BOBROVSKIY ◽  
◽  
Andrey N. LAGAR’KOV ◽  
Konstantin N. ROZANOV ◽  
◽  
...  
Keyword(s):  
Transmission Lines ◽  
Measurement Errors ◽  
Coaxial Line ◽  
Measurement Methods ◽  
Permeability Measurement ◽  
Scalar Resonance ◽  
Permittivity And Permeability ◽  
Properties Of Materials ◽  
Microwave Materials ◽  
Microwave Permittivity

Methods for measuring the microwave permittivity and permeability of materials are considered. The specific features and applicability conditions of measurement methods in transmission lines and in free space are shown, and the measurement errors are analyzed along with the calibration procedures applied for reducing the errors. Individual sections of the articles contain descriptions of scalar, resonance, quasistatic, and quasioptic methods. It has been determined that out of many existing techniques, the NicolsonRossWeir measurement method in a coaxial line and also the method for measuring the permeability of thin ferromagnetic films with the use of a shortcircuited strip cell are most widely applied. By using these methods, the majority of matters concerned with studying the microwave properties of materials can be solved.

Microwave Materials Dielectric Measurements

1990 ◽  
Vol 189 ◽  
Author(s):  
Don Purinton ◽  
Leon Stiborek
Keyword(s):  
Transmission Lines ◽  
Magnetic Measurement ◽  
Electronic Systems ◽  
Defense Systems ◽  
Radar Systems ◽  
Microwave Absorbing Materials ◽  
Dielectric Loading ◽  
Permittivity And Permeability ◽  
Microwave Materials ◽  
And Control

ABSTRACTTexas Instruments Defense Systems and Electronics Group develops radars, missile systems, infra-red systems and electronic systems for the Defense Department. Materials having special microwave properties are needed for radar systems, missile systems that home on microwave emissions, microwave emitter locator systems, and jamming systems. The microwave materials appear in the form of antennas, lenses, radomes, windows, dielectric loading materials, potting materials, dielectric transmission lines, microwave absorbing materials, adhesives, sealants, coatings, and foams. Naturally, the complex permittivity and permeability of these materials need to be known to enhance their application and control their properties in manufacturing. Texas Instruments has a microwave materials test laboratory that includes permittivity and permeability measurements as well as physical and thermal properties. The samples come in many different forms, measurement at different frequencies are needed and the electrical properties cover a wide span (conductors to dielectrics and foams to ferrites). For this reason, many different methods of dielectric and magnetic measurement are used. These various methods will be discussed below.

scholarly journals Microwave Measurements of Electromagnetic Properties of Materials

Materials ◽  
2021 ◽  
Vol 14 (17) ◽  
pp. 5097
Author(s):  
Jerzy Krupka
Keyword(s):  
Sheet Resistance ◽  
Transmission Lines ◽  
Complex Permittivity ◽  
Practical Interest ◽  
Measurement Methods ◽  
Electromagnetic Properties ◽  
Complex Permeability ◽  
Microwave Measurements ◽  
Microwave Frequencies ◽  
Properties Of Materials

A review of measurement methods of the basic electromagnetic parameters of materials at microwave frequencies is presented. Materials under study include dielectrics, semiconductors, conductors, superconductors, and ferrites. Measurement methods of the complex permittivity, the complex permeability tensor, and the complex conductivity and related parameters, such as resistivity, the sheet resistance, and the ferromagnetic linewidth are considered. For dielectrics and ferrites, the knowledge of their complex permittivity and the complex permeability at microwave frequencies is of practical interest. Microwave measurements allow contactless measurements of their resistivity, conductivity, and sheet resistance. These days contactless conductivity measurements have become more and more important, due to the progress in materials technology and the development of new materials intended for the electronic industry such as graphene, GaN, and SiC. Some of these materials, such as GaN and SiC are not measurable with the four-point probe technique, even if they are conducting. Measurement fixtures that are described in this paper include sections of transmission lines, resonance cavities, and dielectric resonators.

scholarly journals Biasplot: A Package to Effective Plots to Assess Bias and Precision in Method Comparison Studies

2017 ◽  
Vol 17 (1) ◽  
pp. 208-221 ◽  
Author(s):  
Patrick Taffé ◽  
Mingkai Peng ◽  
Vicki Stagg ◽  
Tyler Williamson
Keyword(s):  
Measurement Errors ◽  
Measurement Method ◽  
Quantitative Characteristic ◽  
Method Comparison ◽  
Simulated Data ◽  
Worked Examples ◽  
Measurement Methods ◽  
Reference Standard ◽  
Statistical Methodology ◽  
Limits Of Agreement

Bland and Altman's (1986, Lancet 327: 307–310) limits of agreement have been used in many clinical research settings to assess agreement between two methods of measuring a quantitative characteristic. However, when the variances of the measurement errors of the two methods differ, limits of agreement can be misleading. biasplot implements a new statistical methodology that Taffé (Forthcoming, Statistical Methods in Medical Research) recently developed to circumvent this issue and assess bias and precision of the two measurement methods (one is the reference standard, and the other is the new measurement method to be evaluated). biasplot produces three new plots introduced by Taffé: the “bias plot”, “precision plot”, and “comparison plot”. These help the investigator visually evaluate the performance of the new measurement method. In this article, we introduce the user-written command biasplot and present worked examples using simulated data included with the package. Note that the Taffé method assumes there are several measurements from the reference standard and possibly as few as one measurement from the new method for each individual.

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