A Diffuse Interface Method for the Coupling of Solid and Gaseous Phases in a 1D Verification Problem for Combustion of AP/HTPB

This paper presents the application of an adaptive stencil diffuse interface method to the simulation of dam break problem. The adaptive stencil diffuse interface method is the combination of the diffuse interface method and a stencil adaptive algorithm, where the diffuse interface method is used as the solver, and the adaptive stencil refinement scheme is applied to improve the resolution around the interface so that the fine-scale interface behavior can be captured. In this paper, we use this method to simulate the dam break problem, study the dam height and leading edge position, and compare our results with the experiment data available in the literature. It is shown that the results using the adaptive stencil diffuse interface method agree very well with the experimental results.

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A comparison of molecular dynamics and diffuse interface model predictions of Lennard-Jones fluid evaporation

10.1063/1.4902688 ◽

2014 ◽

Cited By ~ 3

Author(s):

Paolo Barbante ◽

Aldo Frezzotti ◽

Livio Gibelli

Keyword(s):

Molecular Dynamics ◽

Diffuse Interface ◽

Interface Model ◽

Diffuse Interface Model ◽

Lennard Jones ◽

Model Predictions

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Cylindrical Geometry Verification Problem for Enclosure Radiation

Journal of Thermophysics and Heat Transfer ◽

10.2514/1.39861 ◽

2009 ◽

Vol 23 (4) ◽

pp. 711-715 ◽

Cited By ~ 4

Author(s):

Ben Blackwell ◽

Kevin Dowding ◽

Michael Modest

Keyword(s):

Cylindrical Geometry ◽

Verification Problem

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High Resolution Transmission Electron Microscopy of Metallic Film/Laser-Irradiated Alumina Couples.

MRS Proceedings ◽

10.1557/proc-357-53 ◽

1994 ◽

Vol 357 ◽

Cited By ~ 1

Author(s):

A. J. Pedraza ◽

Siqi Cao ◽

L. F. Allard ◽

D. H. Lowndes

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Copper Film ◽

Interfacial Structure ◽

Diffuse Interface ◽

Cross Sectional ◽

Polycrystalline Alumina ◽

Near Surface ◽

Transmission Electron

AbstractA near-surface thin layer is melted when single crystal alumina (sapphire) is pulsed laserirradiated in an Ar-4%H2 atmosphere. γ-alumina grows epitaxially from the (0001) face of axalumina (sapphire) during the rapid solidification of this layer that occurs once the laser pulse is over. Cross sectional high resolution transmission electron microscopy (HRTEM) reveals that the interface between unmelted sapphire and γ-alumina is atomistically flat with steps of one to a few close-packed oxygen layers; however, pronounced lattice distortions exist in the resolidified γ-alumina. HRTEM also is used to study the metal-ceramic interface of a copper film deposited on a laser-irradiated alumina substrate. The observed changes of the interfacial structure relative to that of unexposed substrates are correlated with the strong enhancement of film-substrate bonding promoted by laser irradiation. HRTEM shows that a thin amorphous film is produced after irradiation of 99.6% polycrystalline alumina. Formation of a diffuse interface and atomic rearrangements that can take place in metastable phases contribute to enhance the bonding strength of copper to laser-irradiated alumina.

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