X-Ray Diffraction Measurements of Myofilament Lattice Spacing and Optical Measurements of Reflectance and Sarcomere Length in Commercial Pork Loins

1989 ◽  
Vol 67 (1) ◽  
pp. 152 ◽  
Author(s):  
T. C. Irving ◽  
H. J. Swatland ◽  
B. M. Millman
2013 ◽  
Vol 46 (4) ◽  
pp. 887-892 ◽  
Author(s):  
Genziana Bussone ◽  
Rüdiger Schott ◽  
Andreas Biermanns ◽  
Anton Davydok ◽  
Dirk Reuter ◽  
...  

Grazing-incidence X-ray diffraction measurements on single GaAs nanowires (NWs) grown on a (111)-oriented GaAs substrate by molecular beam epitaxy are reported. The positions of the NWs are intentionally determined by a direct implantation of Au with focused ion beams. This controlled arrangement in combination with a nanofocused X-ray beam allows the in-plane lattice parameter of single NWs to be probed, which is not possible for randomly grown NWs. Reciprocal space maps were collected at different heights along the NW to investigate the crystal structure. Simultaneously, substrate areas with different distances from the Au-implantation spots below the NWs were probed. Around the NWs, the data revealed a 0.4% decrease in the lattice spacing in the substrate compared with the expected unstrained value. This suggests the presence of a compressed region due to Au implantation.


2020 ◽  
Vol 14 (2) ◽  
pp. 113-118
Author(s):  
Daniel Ursu ◽  
Anamaria Dabici ◽  
Marinela Miclau ◽  
Nicolae Miclau

We report for the first time the fabrication of hierarchical ordered superstructure CuB2O4 with flower-like morphology via a one-step, low temperature hydrothermal method. The tetragonal structure of CuB2O4 was determined by X-ray diffraction and high-resolution transmission electron microscopy. Optical measurements attested of the quality of the fabricated CuB2O4 and high temperature X-ray diffraction confirmed its thermal stability up to 600 ?C. The oriented attachment growth and the hierarchical self-assembly of micrometer-sized platelets producing hierarchical superstructures with flower-like morphology are designed by pH of the hydrothermal solution. The excellent band gap, high thermal stability and hierarchical structure of the CuB2O4 are promising for the photovoltaic and photocatalytic applications.


Author(s):  
Wolfgang Weissflog ◽  
H.N Shreenivasa Murthy ◽  
Siegmar Diele ◽  
Gerhard Pelzl

New five-ring bent-core mesogens that possess only ester connecting groups between the aromatic rings and different lateral substituents at the central phenyl ring are presented. The mesophases have been assigned by polarizing microscopy, differential scanning calorimetry, X-ray diffraction and electro-optical measurements. It is shown that the mesophase behaviour depends strongly on the position of the lateral substituents. Compounds, which are derived from 4-cyano-, 4-chloro- and 4,6-dichloro-resorcinol, show polymorphism variants where polar phases (SmAP, SmCP) occur together with nematic and conventional smectic phases, e.g. SmA–SmAP, SmA–SmC S P A –Col ob –SmC S P A , N–SmA–SmCP A , SmA–SmC–SmCP A and SmC–SmCP A . On the basis of the behaviour of two series of materials, the occurrence of different polar-switching mechanisms could be demonstrated. Apart from the usual mechanism by director rotation around the tilt cone, the polar switching can also take place through collective rotation of the molecules around their long axes, which corresponds to a field-induced switching of the layer chirality. A remarkable finding is the polar switching in the crystalline modification of long-chain, bent-core compounds with a methyl group in 2-position, which is accompanied by a clear change of the optical texture and by a relatively high switching polarization (approx. 600 nC cm −2 ). It was found for selected bent-core compounds that, above the transition temperature of a polar to a non-polar phase, the non-polar phase can be transformed to the polar phase by application of an electric field, which was proved for the transitions isotropic–SmCP F , SmA–SmCP F and isotropic–CrII polar.


2019 ◽  
Vol 813 ◽  
pp. 147-152
Author(s):  
Hernán Gabriel Svoboda ◽  
Leonardo Nicolás Tufaro ◽  
Francisco Javier Belzunce Varela

Similar and dissimilar friction stir welds of AA5083 and AA6061 were produced modifying the location of the materials in the joint (advancing or retreating side) and travel speed (73 and 206 mm/min). Longitudinal and transverse residual stresses were evaluated by X-ray diffraction technique on the mid-length of each welded sample, in the transverse direction to the weld on a 42 mm distance. Unstrained lattice spacing (d0) and full width at half maximum (FWHM) were also measured. A peak of tension stress at the edge of stirred zone was detected, describing an “M” like profile, which were more asymmetrical for dissimilar joints. Variations in d0 and FWHM were also observed through the welded joint, which were related to microestructural changes.


1998 ◽  
Vol 533 ◽  
Author(s):  
J. Stangl ◽  
S. Zerlauth ◽  
F. Schäffler ◽  
G. Bauer ◽  
M. Berti ◽  
...  

AbstractFrom the comparison of precise determinations of the Ge and C contents of a series of Si1-x-yGexCy epilayer samples (x < 0.18, y < 0.02) by Rutherford and resonant backscattering experiments and x-ray diffraction, the variation of the Si1-x-yGexCy lattice spacing as a function of C content is determined. A significant negative deviation from Vegard's rule is observed, in agreement with theoretical predictions by Kelires.


2004 ◽  
Vol 443-444 ◽  
pp. 91-94 ◽  
Author(s):  
Thomas L. Christiansen ◽  
Marcel A.J. Somers

On evaluating lattice strain-depth or stress-depth profiles with X-ray diffraction, the variation of the information depth while combining various tilt angles, in combination with lattice spacing gradients leads to artefacts, so-called ghost or fictitious stresses. X-ray diffraction lattice-strain analysis was simulated for a model stress-depth profile combined with a composition-depth profile. Two principally different methods were investigated for the reconstruction of the actual stress and composition profiles from the simulated data: - considering the stress/strain determined at a specific depth as a weighted average over the actual stress/strain depth profile - considering the lattice spacing determined at a specific depth, for a specific value for as a weighted average over the actual lattice spacing profile for this direction. On the basis of the results it is possible to propose a preferred method for the evaluation of stress/strain and composition profiles, while minimising the risk for ghost stresses.


1990 ◽  
Vol 187 ◽  
Author(s):  
J.A. Bain ◽  
B.M. Clemens ◽  
S. Brennan

AbstractThe interfacial structure of Pt/Nb and Pt/Ni sputtered multilayer films was studied using x-ray diffraction in symmetric, asymmetric, and grazing incidence modes. The grazing incidence and asymmetric diffraction were used to distinguish alloying effects on the lattice spacing from strain in the films. This strain was shown to be consistent with semi-coherent interfaces in the Pt/Ni but not in the Pt/Nb in which another strain generating mechanism dominates.


2012 ◽  
Vol 83 (12) ◽  
pp. 125102 ◽  
Author(s):  
I. Kantor ◽  
V. Prakapenka ◽  
A. Kantor ◽  
P. Dera ◽  
A. Kurnosov ◽  
...  

2012 ◽  
Vol 510-511 ◽  
pp. 89-97
Author(s):  
G.H. Tariq ◽  
M. Anis-ur-Rehman

To overcome the naturally existing Schottky barrier problem between p-CdTe and any metal, an intermediate semiconductor thin buffer layer is a better choice prior to the final metallization for contact. Among many investigated back contact materials the ZnTe is suitable as a buffer layer. ZnTe thin films were deposited onto glass substrates by the thermal evaporation technique under vacuum ~2×10-5mbar. Undoped ZnTe thin films are highly resistive, extrinsic doping of Cu was made to improve the electrical conductivity. Films were doped by immersing in Cu NO32.5H2O solutions for Cu doping. To optimize the growth parameters the prepared films were characterized using various techniques. The structural analysis of these films was performed by X-ray diffraction (XRD) technique and optical transmission. X-ray diffraction identified the phases present in these films and also observed that the prepared films were polycrystalline. Also the spectral dependence of absorption coefficient was determined from spectrophotometer. Energy band gap index were calculated from obtained optical measurements data.


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