Characterization of SiO2 Nanoparticles by Single Particle - Inductively Coupled Plasma – Tandem Mass Spectroscopy
Keyword(s):
Icp Ms
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This work uses the tandem ICP-MS (ICPMS/MS) for obtaining interference-freeconditions to characterize SiO2 nanoparticles ranging between 80 and 400nm. These NPs have been detected and accurately characterized. For SiO2 NPs >100 nm, it was possible to provide accurateresults in a straightforward way, as theirsignal distributions are well resolved fromthat of the background.
2017 ◽
Vol 32
(11)
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pp. 2140-2152
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2016 ◽
Vol 31
(7)
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pp. 1549-1555
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2017 ◽
Vol 32
(7)
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pp. 1348-1358
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2017 ◽
Vol 409
(20)
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pp. 4839-4848
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2003 ◽
Vol 217
(1-3)
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pp. 137-142
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Keyword(s):