Model Testing in Radioligand/Receptor Interaction by Monte Carlo Simulation

1983 ◽  
Vol 3 (1-2) ◽  
pp. 261-281 ◽  
Author(s):  
Ernst Bürgisser
2020 ◽  
Author(s):  
Pedro Velloso Gomes Batista ◽  
J Patrick Laceby ◽  
Jessica Davies ◽  
Teotônio Soares de Carvalho ◽  
Diego Tassinari ◽  
...  

<p>Evaluating the usefulness of spatially-distributed soil erosion and sediment delivery models is inherently difficult. Complications stem from the uncertainty in models and measurements of system responses, as well as from the scarcity of commensurable spatial data for model testing. Here, we present an approach for evaluating distributed soil erosion and sediment delivery models, which incorporates sediment source fingerprinting into model testing within a stochastic framework. We applied the Generalized Likelihood Uncertainty Estimation (GLUE) methodology to the Sediment Delivery Distributed (SEDD) model for the Mortes River catchment (~6600 km²) in Southeast Brazil. Sediment concentration measurements were used to estimate long-term sediment loads with a sediment rating curve. Regression uncertainty was propagated with posterior simulations of model coefficients. A Monte Carlo simulation was used to generate SEDD model realizations, which were compared against limits of acceptability of model errors derived from the uncertainty in the curve-estimated sediment loads. The models usefulness for identifying the sediment sources in the catchment was assessed by evaluating behavioral model realizations against sediment fingerprinting source apportionments. Accordingly, we developed a hierarchical tributary sampling design, in which sink sediments were sampled from multiple nodes in the main river channel. The relative contributions of the main sub-catchments in the basin were subsequently estimated by solving the fingerprinting un-mixing model with a Monte Carlo simulation. Results indicated that gauging station measurements of sediment loads were fairly uncertain (average annual specific sediment yields = 0.47 – 11.95 ton ha<sup>-1</sup> yr<sup>-1</sup>). This led to 23.4 % of SEDD model realizations being considered behavioral system representations. Spatially-distributed estimates of sediment delivery to water courses were also highly uncertain, as grid-based absolute errors of SEDD results were hundredfold the median of the predictions. A comparison of SEDD outputs and fingerprinting source apportionments revealed an overall agreement between modeled contributions from individual sub-catchments to sediment loads, although some large discrepancies were found in a specific tributary. From a falsificationist perspective, the SEDD model could not be rejected, as many model realizations were behavioral. The partial agreement between fingerprinting and SEDD results provide some conditional corroboration of the models capability to identify the sources of sediments in the catchment, at least with some degree of spatial aggregation. However, the uncertainty in the grid-based outputs might dispute the models usefulness for actually quantifying sediment dynamics under the testing conditions. For management purposes, both SEDD and fingerprinting results indicated that most of the sediments reaching the hydroelectric power plant reservoir located at the outlet of the Mortes River originated from mid and upper catchment tributaries. The convergence of model results therefore evince that reducing reservoir sedimentation rates requires widespread soil conservation efforts throughout the catchment, instead of local/proximal interventions. Ultimately, we have shown how sediment source fingerprinting can be incorporated into the evaluation of spatially-distributed soil erosion and sediment delivery models while considering the uncertainty in both models and observational data.</p>


Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.


Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.


Sign in / Sign up

Export Citation Format

Share Document