Method for Measuring Package to Board Interconnection Shear Strength for Area Array, Fine Pitch Packages
Abstract The package to board interconnection shear strength (PBISS) test method yields an amalgamated measure of pad peel strength, solder/pad interfacial strength and bulk solder shear strength. This measure mirrors the reliability of the actual product better than any single component strength value. Using a novel fixture that ensures pure shear stresses on the package, the shear strengths of two different ball grid array packages with Sn62PbAg2 solder balls are characterized as a function of pad finish and board build-up layer type. The tests can be performed relatively quickly (< 15 minutes for an entire package on board) with good repeatability. Results indicate that the component shear test is sensitive to the variables studied and attractive as a candidate technique for quantifying solder joint quality and integrity on actual production samples for a variety of package types and sizes. Potential applications of this method are for materials/process/vendor evaluation during product development phase and as a production/supplier quality assessment tool in the factory. Key words: interconnection strength, shear test, area array package, solder joint, pad surface finish