scholarly journals Development of a Mathematical Model of Electrical Polarization Switching in a Ferroelectric Capacitor

2021 ◽  
Vol 155 (2) ◽  
pp. 126-135
Author(s):  
V. M. Kychak ◽  
◽  
I. O. Baraban ◽  
2021 ◽  
Vol 13 (1) ◽  
Author(s):  
Chuanchuan Liu ◽  
Yuchen Wang ◽  
Haoyang Sun ◽  
Chao Ma ◽  
Zhen Luo ◽  
...  

AbstractFerroelectricity can reduce the subthreshold swing (SS) of metal-oxide-semiconductor field-effect transistors (MOSFETs) to below the room-temperature Boltzmann limit of ~60 mV/dec and provides an important strategy to achieve a steeper SS. Surprisingly, by carefully tuning the polarization switching dynamics of BiFeO3 ferroelectric capacitors the SS of a commercial power MOSFET can even be tuned to zero or a negative value, i.e., the drain current increases with a constant or decreasing gate voltage. In particular, in addition to the positive SS of lower than 60 mV/dec, the zero and negative SS can be established with a drain current spanning for over seven orders of magnitude. These intriguing phenomena are explained by the ferroelectric polarization switching dynamics, which change the charge redistributions and accordingly affect the voltage drops across the ferroelectric capacitor and MOSFET. This study provides deep insights into understanding the steep SS in ferroelectric MOSFETs, which could be promising for designing advanced MOSFETs with an ultralow and tunable SS.


2000 ◽  
Vol 655 ◽  
Author(s):  
Oliver Lohse ◽  
Michael Grossmann ◽  
Dierk Bolten ◽  
Ulrich Boettger ◽  
Rainer Waser

AbstractThe understanding of the polarization switching process of ferroelectric capacitors is highly relevant for the development and optimization of FeRAM devices. We report on the characterization of Pb(Zr,Ti)O3 thin films which have been studied by means of dedicated rectangle pulse measurements. Decreasing the voltage level of the excitation pulses decelerates the polarization switching significantly to the range of milliseconds and reduces the switchable polarization. In this work the influence of niobium (Nb) doping on the switching properties of PZT thin films prepared by CSD are investigated to reach the aspired conditions of low voltage operation, read and write access pulses in the range of nanoseconds. For the implementation of the transient behavior of ferroelectric capacitors in circuit design and simulation tools it is necessary to develop a model which precisely describes the polarization hysteresis, the pulse switching behavior as well as the small signal capacitance. The fundamental considerations for this model are presented, based on an ideal ferroelectric capacitor, taking into account the Curie-von Schweidler behavior. The latter is observed in non-ferroelectric high-K materials as well as in ferroelectric thin films.


2004 ◽  
Vol 64 (1) ◽  
pp. 101-111 ◽  
Author(s):  
CHAO-GANG WEI ◽  
TIAN-LING REN ◽  
JUN ZHU ◽  
LI-TIAN LIU

2008 ◽  
Author(s):  
Ishii Akira ◽  
Yoshida Narihiko ◽  
Hayashi Takafumi ◽  
Umemura Sanae ◽  
Nakagawa Takeshi
Keyword(s):  

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