scholarly journals Artificial Intelligence in Obstetric Ultrasound: An Update and Future Applications

2021 ◽  
Vol 8 ◽  
Author(s):  
Zhiyi Chen ◽  
Zhenyu Liu ◽  
Meng Du ◽  
Ziyao Wang

Artificial intelligence (AI) can support clinical decisions and provide quality assurance for images. Although ultrasonography is commonly used in the field of obstetrics and gynecology, the use of AI is still in a stage of infancy. Nevertheless, in repetitive ultrasound examinations, such as those involving automatic positioning and identification of fetal structures, prediction of gestational age (GA), and real-time image quality assurance, AI has great potential. To realize its application, it is necessary to promote interdisciplinary communication between AI developers and sonographers. In this review, we outlined the benefits of AI technology in obstetric ultrasound diagnosis by optimizing image acquisition, quantification, segmentation, and location identification, which can be helpful for obstetric ultrasound diagnosis in different periods of pregnancy.

2019 ◽  
Vol 64 (10) ◽  
pp. 105021 ◽  
Author(s):  
Saree Alnaghy ◽  
Andre Kyme ◽  
Vincent Caillet ◽  
Doan Trang Nguyen ◽  
Ricky O’Brien ◽  
...  

2021 ◽  
Author(s):  
Joerg Poggenborg ◽  
Andre Yaroshenko ◽  
Nataly Wieberneit ◽  
Tim Harder ◽  
Axel Gossmann

Purpose To implement a tool for real time image quality feedback for chest radiographs into the clinical routine and to evaluate the effect of the system on the image quality of the acquired radiographs. Materials and Methods A real time Artificial Intelligence (AI) image quality feedback tool is developed that analyzes chest PA x-rays right after the completion of the examination at the x-ray system and provides visual feedback to the system operator with respect to adherence to desired standards of collimation, patient rotation and inspiration. In order to track image quality changes over time, results were compared to image quality assessment for images, acquired prior to system implementation. Results Compared to the image quality prior to the installation of the real time image quality feedback solution, it is shown that a relative increase of images with optimal image quality with respect to collimation, patient rotation and inspiration is achieved by 30% (p<0.01). A relative improvement of 28% (p<0.01) is observed for the increase of images with optimal collimation, followed by a relative increase of 4% (p<0.01) of images with optimal inspiration. Finally, a detailed analysis is presented that shows that the average unnecessarily exposed area is reduced by 34% (p<0.01). Discussion This study shows that it is possible to significantly improve image quality using a real time AI-based image quality feedback tool. The developed tool not only provides objective and impartial criticism and helps x-ray operators identify areas for improvement, but also gives positive feedback.


Author(s):  
Lee H. Veneklasen

This paper discusses some of the unique aspects of a spectroscopic emission microscope now being tested in Clausthal. The instrument is designed for the direct parallel imaging of both elastic and inelastic electrons from flat surfaces. Elastic contrast modes of the familiar LEEM include large and small angle LEED, mirror microscopy, backscatter diffraction contrast (for imaging of surface structure), and phase contrast (for imaging of step dynamics)(1). Inelastic modes include topology sensitive secondary, and work function sensitive photoemission. Most important, the new instrument will also allow analytical imaging using characteristic Auger or soft X-ray emissions. The basic instrument has been described by Bauer and Telieps (2). This configuration has been redesigned to include an airlock, and a LaB6 gun, triple condensor lens, magnetic objective lens, a double focussing separator field, an imaging energy analyzer, and a real time image processor.Fig. 1 shows the new configuration. The basic beam voltage supply Vo = 20 KV, upon which separate supplies for the gun Vg, specimen Vs, lens electrode Vf, and analyzer bias Vb float. The incident energy at the sample can be varied from Vs = 0-1 KV for elastic imaging, or from Vg + Vs = (3 + Vs) KV for inelastic imaging. The image energy window Vs±V/2 may be varied without readjusting either the illumation, or imaging/analyzer optics. The diagram shows conjugate diffraction and image planes. The apertures defining incoming Humiliation and outgoing image angles are placed below the separator magnet to allow for their independent optimization. The instrument can illuminate and image 0.5-100 μm fields at 0-1 keV emission energies with an energy window down to 0.2 eV.


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