scholarly journals Textile Display with AMOLED Using a Stacked-Pixel Structure on a Polyethylene Terephthalate Fabric Substrate

Materials ◽  
2019 ◽  
Vol 12 (12) ◽  
pp. 2000 ◽  
Author(s):  
Jae Seon Kim ◽  
Chung Kun Song

An active-mode organic light-emitting diode (AMOLED) display on a fabric substrate is expected to be a prominent textile display for e-textile applications. However, the large surface roughness of the fabric substrate limits the aperture ratio—the area ratio of the organic light-emitting diode (OLED) to the total pixel area. In this study, the aperture ratio of the AMOLED panel fabricated on the polyethylene terephthalate fabric substrate was enhanced by applying a stacked-pixel structure, in which the OLED was deposited above the organic thin-film transistor (OTFT) pixel circuit layer. The stacked pixels were achieved using the following three key technologies. First, the planarization process of the fabric substrate was performed by sequentially depositing a polyurethane and photo-acryl layer, improving the surface roughness from 10 μm to 0.3 μm. Second, a protection layer consisting of three polymer layers, a water-soluble poly-vinyl alcohol, dichromated-polyvinylalcohol (PVA), and photo acryl, formed by a spin-coating processes was inserted between the OTFT circuit and the OLED layer. Third, a high mobility of 0.98 cm2/V∙s was achieved at the panel scale by using hybrid carbon nano-tube (CNT)/Au (5 nm) electrodes for the S/D contacts and the photo-acryl (PA) for the gate dielectric, enabling the supply of a sufficiently large current (40 μA @ VGS = −10 V) to the OLED. The aperture ratio of the AMOLED panel using the stacked-pixel structure was improved to 48%, which was about two times larger than the 19% of the side-by-side pixel, placing the OLED just beside the OTFTs on the same plane.

2006 ◽  
Vol 99 (6) ◽  
pp. 064506 ◽  
Author(s):  
Kazuhito Tsukagoshi ◽  
Jun Tanabe ◽  
Iwao Yagi ◽  
Kunji Shigeto ◽  
Keiichi Yanagisawa ◽  
...  

2001 ◽  
Vol 708 ◽  
Author(s):  
Ki-Beom Kim ◽  
Yoon-Heung Tak ◽  
Hyoung-Guen Park ◽  
Kwang-Ho Lee ◽  
Jong-Ram Lee

ABSTRACTSurface roughness of ITO (Indium Tin Oxide) was measured by AFM (Atomic Force Microscope) and the existence of spikes was verified. Then OLED (Organic Light Emitting Diode) devices made from those substrates were fabricated and their electrical properties were measured with an I-V measurement system. There is considerable difference in the reverse leakage current of OLEDs depending on the surface roughness of the substrate. We observed a good correlation of reverse leakage current with Rpv (Peak-to-Valley roughness), but the correlations between reverse leakage current and Ra (Average roughness) and Rrms (Root-Mean-Square roughness) are not as good.


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