scholarly journals Discrimination of Falsified Erectile Dysfunction Medicines by Use of an Ultra-Compact Raman Scattering Spectrometer

Pharmacy ◽  
2020 ◽  
Vol 9 (1) ◽  
pp. 3
Author(s):  
Tomoko Sanada ◽  
Naoko Yoshida ◽  
Kazuko Kimura ◽  
Hirohito Tsuboi
Keyword(s):  
Raman Scattering ◽  
Raman Spectra ◽  
Principal Component ◽  
Detection Methods ◽  
Score Plot ◽  
Raman Scattering Spectroscopy ◽  
Standard Product ◽  
Destructive Analysis ◽  
Falsified Medicines ◽  
Non Destructive

Substandard and falsified medicines are often reported worldwide. An accurate and rapid detection method for falsified medicines is needed to prevent human health hazards. Raman scattering spectroscopy has emerged as a non-destructive analysis method for the detection of falsified medicines. In this laboratory study, Raman spectroscopy was performed to evaluate the applicability of the ultra-compact Raman scattering spectrometer (C13560). Principal component analysis (PCA) was also performed on the Raman spectra. This study analyzed tadalafil (Cialis), vardenafil (Levitra), and sildenafil (Viagra) tablets. We tested the standard product and products purchased from the internet (genuine or falsified). For Cialis and Levitra, all falsified tablets were identified by the Raman spectra and PCA score plot. For Viagra, the Raman spectra of some falsified tablets were almost comparable to the standard tablet. The PCA score plots of falsified tablets were dispersed, and some plots of falsified tablets were close to the standard tablet. In conclusion, C13560 was useful for the discrimination of falsified Cialis and Levitra tablets, whereas some falsified Viagra tablets had Raman spectra similar to that of the standard tablet. The development of detection methods that can be introduced in various settings may help prevent the spread of falsified products.

Non Destructive Optical Analysis of Implanted Layers in GaAs by Raman Scattering and Spectroscopic Ellipsometry

1982 ◽  
Vol 14 ◽  
Author(s):  
Joseph Biellmann ◽  
Bernard Prevot ◽  
Claude Schwab ◽  
Jean-Bernard Theeten ◽  
Marko Erman
Keyword(s):  
Raman Scattering ◽  
Dielectric Function ◽  
Imaginary Part ◽  
Depth Profile ◽  
Spectroscopic Ellipsometry ◽  
Intensity Ratio ◽  
Optical Analysis ◽  
Lattice Potential ◽  
Destructive Analysis ◽  
Non Destructive

ABSTRACTNon destructive analysis by Raman Scattering (RS) and Spectroscopic Ellipsometry (SE) is demonstrated on B+- and Se+ shallow implanted GaAs. Qualitative informations are obtained from 1st and 2nd order RS spectra. The former are analysed using the intensity ratio of the T0 and L0 modes, which defines a lattice potential perfection scale. The SE analysis of the E1, E1 +Δ1 structure in the imaginary part of the dielectric function confirms the RS results and its multilayer analysis yields the depth profile of the implanted ions.

Raman Scattering Spectroscopy of GeSi/Si Strained Layer Superlattice

1993 ◽  
Vol 298 ◽  
Author(s):  
Zhang Rong ◽  
Zheng Youdou ◽  
Gu Shulin ◽  
Hu Liqun
Keyword(s):  
Raman Scattering ◽  
Frequency Shift ◽  
Raman Spectra ◽  
Strain Distribution ◽  
Phonon Frequency ◽  
New Method ◽  
Raman Scattering Spectroscopy ◽  
Scattering Measurements ◽  
Optic Phonon ◽  
Strained Layer Superlattice

AbstractRaman scattering measurements have been carried out on Si1-xGex/Si SLS. It is found that the Ge–Ge optic phonon frequency shift is proportional to strain in the SiGe film, and the Ge–Ge strain shift coefficient is 408cm−1. Based on these study a new method for analyzing the Raman spectra of SiGe/Si SLS has been proposed. Using the new method we can obtain the composition of the alloy sublayers as well as the strain in SLS. The strain distribution in the SiGe/Si SLS has been discussed, and strain in both SiGe and Si sublayers of the SLS have been calculated.

scholarly journals Integrated Interpretation of pXRF Data on Ancient Nephrite Artifacts Excavated from Tomb No.1 in Yuehe Town, Henan Province, China

2021 ◽  
Author(s):  
Dian Chen ◽  
Yimin Yang ◽  
Baotong Qiao ◽  
Jingpu Li ◽  
Wugan Luo
Keyword(s):  
Principal Component ◽  
Henan Province ◽  
Central China ◽  
Test Environment ◽  
Destructive Analysis ◽  
Elemental Data ◽  
Integrated Interpretation ◽  
Non Destructive ◽  
Mineral Identification

Abstract Previous studies of ancient jade using portable X-ray fluorescence (pXRF) have mostly focused on mineral identification, alteration status and provenance determination. It is usually used as an auxiliary instrument for spectroscopic detection with finer resolution. However, there is no substitute for the efficiency and stability of pXRF in-situ non-destructive analysis, which is less affected by the test environment. The scale of the data from the pXRF analysis did not allow for a more in-depth interpretation of ancient jade in the past. In this study, pXRF has been carried out for a total of 112 pieces of nephrite artifacts unearthed from the Yuehe tomb No.1 in Nanyang City, Henan Province, Central China. Certain patterns become clearer as the size of the data increases. The coefficient of variation, cluster analysis and correlation analysis can be used to separate elements into different assemblages, revealing whether the elements are from the primary and impurity minerals of nephrite itself, from the burial microenvironment in the soil, or even from other specific sources. In addition, most of the secondary whitening occurring in the batch of nephrite are accompanied by an increase in Ca content, confirming the previously refuted theory of calcification. More importantly, the principal component analysis of the twin nephrite artifacts suggests visually indistinguishable elemental changes caused by secondary changes, which may lead to misjudgment of ancient nephrite provenance using elemental data.

scholarly journals Integrated interpretation of pXRF data on ancient nephrite artifacts excavated from Tomb No.1 in Yuehe Town, Henan Province, China

2022 ◽  
Vol 10 (1) ◽  
Author(s):  
Dian Chen ◽  
Yimin Yang ◽  
Baotong Qiao ◽  
Jingpu Li ◽  
Wugan Luo
Keyword(s):  
Principal Component ◽  
Henan Province ◽  
Central China ◽  
Test Environment ◽  
Destructive Analysis ◽  
Elemental Data ◽  
Integrated Interpretation ◽  
Non Destructive ◽  
Mineral Identification

AbstractPrevious studies of ancient jade using portable X-ray fluorescence (pXRF) have mostly focused on mineral identification, alteration status and provenance determination. It is usually used as an auxiliary instrument for spectroscopic detection with finer resolution. However, there is no substitute for the efficiency and stability of pXRF in-situ non-destructive analysis, which is less affected by the test environment. The scale of the data from the pXRF analysis did not allow for a more in-depth interpretation of ancient jade in the past. In this study, pXRF has been carried out for a total of 112 pieces of nephrite artifacts unearthed from the Yuehe tomb No.1 in Nanyang City, Henan Province, Central China. Certain patterns become clearer as the size of the data increases. The coefficient of variation, cluster analysis and correlation analysis can be used to separate elements into different assemblages, revealing whether the elements are from the primary and impurity minerals of nephrite itself, from the burial microenvironment in the soil, or even from other specific sources. In addition, most of the secondary whitening occurring in the batch of nephrite are accompanied by an increase in Ca content, confirming the previously refuted theory of calcification. More importantly, the principal component analysis of the twin nephrite artifacts suggests visually indistinguishable elemental changes caused by secondary changes, which may lead to misjudgment of ancient nephrite provenance using elemental data.

scholarly journals Quality assessment of Diflucan® tablets distributed online: Diflucan® distributed online

2021 ◽  
Vol 5 ◽  
pp. 239920262110020
Author(s):  
Tomoko Sanada ◽  
Myu Ohnishi ◽  
Naoko Yoshida ◽  
Kazuko Kimura ◽  
Hirohito Tsuboi
Keyword(s):  
Raman Scattering ◽  
Near Infrared ◽  
Health Hazard ◽  
Active Pharmaceutical Ingredient ◽  
Visual Observation ◽  
The Internet ◽  
Content Uniformity ◽  
Potential Health ◽  
Raman Scattering Spectroscopy ◽  
Falsified Medicines

Background: Falsified medical products have been reported worldwide. Falsified medicines with poor quality are a potential health hazard. Some Internet sites advertise fluconazole (Diflucan®), an antifungal medicine used to treat deep mycoses, as “female Viagra®.” Aim: The aim of this study was to investigate the authenticity and quality of Diflucan® tablets distributed on the Internet. Methods: We ordered Diflucan® tablets via the Internet and evaluated them by visual observation, authenticity investigation, quality evaluation (quantity of the active pharmaceutical ingredient, content uniformity, and dissolution), and near-infrared and Raman scattering spectroscopy. Results: We obtained 11 samples of Diflucan® tablets from all 11 Japanese Internet sites identified in our search. Of 11 sites, 7 advertised fluconazole as having effects on female sexual function. Ten of the Diflucan® samples were confirmed as genuine and one sample was falsified. The genuine Diflucan® samples met the specifications of all quality evaluations. The packaging, size, and color of the falsified Diflucan® sample obtained in this study differed from the authentic Diflucan® tablet. The falsified Diflucan® sample obtained in this study did not contain fluconazole and instead contained what appeared to be sildenafil citrate. The spectra of the falsified Diflucan® tablet obtained in this study differed from the authentic Diflucan® tablet in near-infrared and Raman scattering spectroscopy. Conclusion: We confirmed that one falsified Diflucan® tablet was distributed online. Thus, continued measures against falsified medicines are required.

Local Crystal Orientation in Laser Annealed Silicon Using a Raman Microprobe

1983 ◽  
Vol 29 ◽  
Author(s):  
L. A. Farrow ◽  
J.B. Hopkins ◽  
G J Fisanick
Keyword(s):  
Crystal Structure ◽  
Raman Scattering ◽  
Crystal Orientation ◽  
Polarization Angle ◽  
Substrate Plane ◽  
Si Substrate ◽  
Intensity Measurements ◽  
Raman Microprobe ◽  
Destructive Analysis ◽  
Non Destructive

ABSTRACTIn this paper, we discuss the application of polarization selective Raman microprobe spectroscopy to the detailed, non-destructive analysis of the local crystal orientation of a polysilicon sample grown over SiO 2 pads and laser annealed. Intensity measurements taken as a function of input polarization angle are fit to an expression derived from the Raman scattering selection rules to calculate the angles by which the crystal structure is twisted within the original substrate plane, as well as the degree of tipping of the crystal plane away from the plane of the Si substrate. The results give some indication as to the direction of seeding during recrystallization.

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