scholarly journals A Comparison of Uric Acid Optical Detection Using as Sensitive Materials an Amino-Substituted Porphyrin and Its Nanomaterials with CuNPs, PtNPs and Pt@CuNPs

Processes ◽  
2021 ◽  
Vol 9 (11) ◽  
pp. 2072
Author(s):  
Camelia Epuran ◽  
Ion Fratilescu ◽  
Diana Anghel ◽  
Mihaela Birdeanu ◽  
Corina Orha ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Uric Acid ◽  
Copper Nanoparticles ◽  
Hybrid Material ◽  
Human Environment ◽  
Detection Range ◽  
Force Microscopy ◽  
Atomic Force ◽  
High Concentrations ◽  
Very High

Hybrid nanomaterials consisting in 5,10,15,20-tetrakis(4-amino-phenyl)-porphyrin (TAmPP) and copper nanoparticles (CuNPs), platinum nanoparticles (PtNPs), or both types (Pt@CuNPs) were obtained and tested for their capacity to optically detect uric acid from solutions. The introduction of diverse metal nanoparticles into the hybrid material proved their capacity to improve the detection range. The detection was monitored by using UV-Vis spectrophotometry, and differences between morphology of the materials were performed using atomic force microscopy (AFM). The hybrid material formed between porphyrin and PtNPs hasthe best and most stable response for uric acid detection in the range of 6.1958 × 10−6–1.5763 × 10−5 M, even in the presence of very high concentrations of the interference species present in human environment.

Study of Silver and Copper Nanoparticles by Electron and Atomic Force Microscopy

2019 ◽  
Vol 58 (5-6) ◽  
pp. 257-264
Author(s):  
L. D. Kisterska ◽  
O. B. Loginova ◽  
S. O. Lysovenko ◽  
V. M. Tkach
Keyword(s):  
Atomic Force Microscopy ◽  
Copper Nanoparticles ◽  
Force Microscopy ◽  
Atomic Force

Straining Effects in Silica-Filled Elastomers Investigated by Atomic Force Microscopy: From Macroscopic Stretching to Nanoscale Strainfield

2003 ◽  
Vol 76 (1) ◽  
pp. 60-81 ◽  
Author(s):  
A. Lapra ◽  
F. Clément ◽  
L. Bokobza ◽  
L. Monnerie
Keyword(s):  
Atomic Force Microscopy ◽  
Strain Field ◽  
Local Concentration ◽  
Macroscopic Strain ◽  
Precise Description ◽  
Force Microscopy ◽  
Filled Elastomers ◽  
Atomic Force ◽  
Different Strains ◽  
Very High

Abstract Understanding the way fillers can reinforce elastomers requires, among other things, requires a precise description of the behavior of filler aggregates when a macroscopic strain is applied. In this study, Atomic Force Microscopy was used to investigate samples of SBR and PDMS filled with silica. The samples were stretched uniaxially at different strain values (up to 145%) and imaged by Atomic Force Microscopy. The distances between aggregates were followed at the different strains, which allowed calculation of the local strains and comparison of the values obtained with the macroscopic strain value. The main results are (i) that the strain field is highly heterogeneous, depending on the local concentration of filler and (ii) that the strain undergone by elastomer chains can be very high locally, in the regions where distances between aggregates are very short.

Small Amplitude Frequency Modulation Atomic Force Microscopy of Lead Phthalocyanine Molecules Using Cantilever with Very High Spring Constant

2008 ◽  
Vol 47 (7) ◽  
pp. 6125-6127 ◽  
Author(s):  
Yoshihiro Hosokawa ◽  
Takashi Ichii ◽  
Kei Kobayashi ◽  
Kazumi Matsushige ◽  
Hirofumi Yamada
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Small Amplitude ◽  
Spring Constant ◽  
Force Microscopy ◽  
Atomic Force ◽  
Very High

Development of the UHV-STM

1990 ◽  
Vol 48 (1) ◽  
pp. 322-323
Author(s):  
M. Iwatsuki ◽  
S. Kitamura ◽  
A. Mogami
Keyword(s):  
Surface Science ◽  
Real Space ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Great Promise ◽  
Force Microscopy ◽  
Atomic Force ◽  
Stm Image ◽  
Surface Construction ◽  
Very High

Since Binnig, Rohrer and associates observed real-space topographic images of Si(111)-7×7 and invented the scanning tunneling microscope (STM),1) the STM has been accepted as a powerful surface science instrument.Recently, many application areas for the STM have been opened up, such as atomic force microscopy (AFM), magnetic force microscopy (MFM) and others. So, the STM technology holds a great promise for the future.The great advantages of the STM are its high spatial resolution in the lateral and vertical directions on the atomic scale. However, the STM has difficulty in identifying atomic images in a desired area because it uses piezoelectric (PZT) elements as a scanner.On the other hand, the demand to observe specimens under UHV condition has grown, along with the advent of the STM technology. The requirment of UHV-STM is especially very high in to study of surface construction of semiconductors and superconducting materials on the atomic scale. In order to improve the STM image quality by keeping the specimen and tip surfaces clean, we have built a new UHV-STM (JSTM-4000XV) system which is provided with other surface analysis capability.

Sign in / Sign up

Export Citation Format

Share Document