scholarly journals Microchannel Fabrication Using A Photo-Patternable Adhesive Material for Recording Conformational Changes of KcsA Channel with the Diffracted X-ray Tracking Method

Proceedings ◽  
2018 ◽  
Vol 2 (13) ◽  
pp. 972 ◽  
Author(s):  
Yoshikazu Hirai ◽  
Yasuaki Mori ◽  
Tomoki Tabuchi ◽  
Hirofumi Shimizu ◽  
Toshiyuki Tsuchiya ◽  
...  
Keyword(s):  
Conformational Changes ◽  
Diffraction Spot ◽  
High Resolution Imaging ◽  
Potassium Ion Channel ◽  
Adhesive Material ◽  
Tracking Method ◽  
X Ray ◽  
Sin Membrane ◽  
Resolution Imaging ◽  
Gold Nanocrystal

Diffracted X-ray tracking (DXT) method can trace conformational changes of KcsA potassium ion channel during gating by recording position of diffraction spot from a gold nanocrystal attached to the channel as a movie. For high-resolution imaging under controlled microenvironments for KcsA channels, we report a microfluidic device consisting of two SiN membrane windows bonded with a photo patternable adhesive material. The reduced signal-to-background ratio as well as suitable adhesive material thickness for the microchannel are discussed in the experiment at the synchrotron radiation facility.

Extended Core Edge Fine Structure in the E.M.

1980 ◽  
Vol 38 ◽  
pp. 120-121
Author(s):  
R.D. Leapman
Keyword(s):  
Fine Structure ◽  
Electron Scattering ◽  
Inelastic Electron ◽  
High Resolution Imaging ◽  
X Ray ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Core Electrons ◽  
Resolution Imaging ◽  
X Ray Absorption

Extended X-ray Absorption Fine Structure (EXAFS) analysis makes use of synchrotron radiaion to measure modulations in the absorption coefficient above core edges and hence to obtain information about local atomic environments. EXAFS arises when ejected core electrons are backscattered by surrounding atoms and interfere with the outgoing waves. Recently, interest has also been shown in using inelastic electron scattering1-4. Some advantages of Extended X-ray-edge Energy Loss Fine Structure (EXELFS) are: a) small probes formed by the analytical electron microscope give spectra from μm to nm sized areas, compared with mm diameter areas for the X-ray technique, b) EXELFS can be combined with other techniques such as electron diffraction or high resolution imaging, and c) EXELFS is sensitive to low Z elements with K edges from ˜200 eV to ˜ 3000 eV (B to Cl).

Laboratory X-ray microscopy for high-resolution imaging of environmental colloid structure

2012 ◽  
Vol 329 ◽  
pp. 26-31 ◽  
Author(s):  
H.M. Hertz ◽  
M. Bertilson ◽  
O. v. Hofsten ◽  
S.-C. Gleber ◽  
J. Sedlmair ◽  
...  
Keyword(s):  
High Resolution ◽  
High Resolution Imaging ◽  
X Ray ◽  
Resolution Imaging

High Resolution Imaging and X-Ray Microanalysis with STEM in the FE-SEM

2012 ◽  
Vol 18 (S2) ◽  
pp. 390-391
Author(s):  
R. Gauvin ◽  
P. Michaud ◽  
N. Brodusch ◽  
M.L. Trudeau
Keyword(s):  
High Resolution ◽  
High Resolution Imaging ◽  
X Ray ◽  
Resolution Imaging

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

scholarly journals Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer

2010 ◽  
Vol 2010 ◽  
pp. 1-10 ◽  
Author(s):  
Michael J. Haugh ◽  
Richard Stewart
Keyword(s):  
High Resolution ◽  
Resolving Power ◽  
Inertial Confinement ◽  
High Resolution Imaging ◽  
Doppler Broadening ◽  
X Ray Diffraction ◽  
High Quality ◽  
Reflectivity Curve ◽  
X Ray ◽  
Resolution Imaging

This paper describes the design, crystal selection, and crystal testing for a vertical Johann spectrometer operating in the 13 keV range to measure ion Doppler broadening in inertial confinement plasmas. The spectrometer is designed to use thin, curved, mica crystals to achieve a resolving power of E/ΔE>2000. A number of natural mica crystals were screened for flatness and X-ray diffraction width to find samples of sufficient perfection for use in the instrument. Procedures to select and mount high quality mica samples are discussed. A diode-type X-ray source coupled to a dual goniometer arrangement was used to measure the crystal reflectivity curve. A procedure was developed for evaluating the goniometer performance using a set of diffraction grade Si crystals. This goniometer system was invaluable for identifying the best original crystals for further use and developing the techniques to select satisfactory curved crystals for the spectrometer.

scholarly journals High-resolution imaging of warm x-ray sources with a Wolter optic on the Z Machine.

2020 ◽  
Author(s):  
Jeffrey Fein ◽  
David Ampleford ◽  
J. Vogel ◽  
B. Kozioziemski ◽  
C. Walton ◽  
...  
Keyword(s):  
High Resolution ◽  
High Resolution Imaging ◽  
X Ray ◽  
Resolution Imaging

Modeling of dissolution and resolution in contact x-ray microscopy

1994 ◽  
Vol 52 ◽  
pp. 62-63
Author(s):  
Y. Wang ◽  
C. Jacobsen
Keyword(s):  
High Resolution ◽  
Numerical Modelling ◽  
Short Pulse ◽  
Water Layer ◽  
Black Body ◽  
High Resolution Imaging ◽  
Finite Sample ◽  
X Ray ◽  
Resolution Imaging ◽  
Different Diameters

Contact x-ray microscopy or microradiography offers a simple-to-use approach to high resolution imaging of wet, thick biological specimens. One great advantage of the technique is that it can be usedwith short pulse, incoherent x-ray sources such as laser produced plasmas, and polymer replicas or direct AFM viewing are promising new approaches to image readout. However, it has long been pointed outthat issues such as diffraction blurring over finite sample-to-resist spacing, shot noise in the exposure, and sidecutting during development must be considered in evaluating contact x-ray microradiographs.We present here the results of numerical modelling of contact x-ray microscopy using photoresists. We assume a phantom consisting of protein rods and balls of different diameters, all embedded in a water layer. We assume that the x-ray exposure is provided by a black body source with temperature kBT = 100 eV (such as in a laser-produced plasma), and that the black bodyspectrum is then modified by x-ray transmission in 0.1/μm of Al2O3, 0.1μm of Si3N4, and 5μm of water.

High‐resolution imaging x‐ray detector

1976 ◽  
Vol 47 (3) ◽  
pp. 282-290 ◽  
Author(s):  
E. Kellogg ◽  
P. Henry ◽  
S. Murray ◽  
L. Van Speybroeck ◽  
P. Bjorkholm
Keyword(s):  
High Resolution ◽  
High Resolution Imaging ◽  
X Ray ◽  
Resolution Imaging
Sign in / Sign up

Export Citation Format

Share Document