scholarly journals Contact Resonance Atomic Force Microscopy Using Long, Massive Tips

Sensors ◽  
2019 ◽  
Vol 19 (22) ◽  
pp. 4990 ◽  
Author(s):  
Tony Jaquez-Moreno ◽  
Matteo Aureli ◽  
and Ryan C. Tung
Keyword(s):  
Atomic Force Microscopy ◽  
Beam Theory ◽  
Element Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Proposed Model ◽  
Resonance Frequencies ◽  
Modes Of Vibration ◽  
Inertia Properties ◽  
Contact Resonance

In this work, we present a new theoretical model for use in contact resonance atomic force microscopy. This model incorporates the effects of a long, massive sensing tip and is especially useful to interpret operation in the so-called trolling mode. The model is based on traditional Euler–Bernoulli beam theory, whereby the effect of the tip as well as of the sample in contact, modeled as an elastic substrate, are captured by appropriate boundary conditions. A novel interpretation of the flexural and torsional modes of vibration of the cantilever, when not in contact with the sample, is used to estimate the inertia properties of the long, massive tip. Using this information, sample elastic properties are then estimated from the in-contact resonance frequencies of the system. The predictive capability of the proposed model is verified via finite element analysis. Different combinations of cantilever geometry, tip geometry, and sample stiffness are investigated. The model’s accurate predictive ranges are discussed and shown to outperform those of other popular models currently used in contact resonance atomic force microscopy.

Stick-to-sliding transition in contact-resonance atomic force microscopy

2018 ◽  
Vol 113 (8) ◽  
pp. 083102
Author(s):  
C. Ma ◽  
V. Pfahl ◽  
Z. Wang ◽  
Y. Chen ◽  
J. Chu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Contact Resonance

Plate geometries for contact resonance atomic force microscopy: Modeling, optimization, and verification

2018 ◽  
Vol 124 (1) ◽  
pp. 014503 ◽  
Author(s):  
Matteo Aureli ◽  
Syed N. Ahsan ◽  
Rafiul H. Shihab ◽  
Ryan C. Tung
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Contact Resonance

Phase Contrast Imaging in Atomic Force Microscopy

1997 ◽  
Vol 3 (S2) ◽  
pp. 1275-1276
Author(s):  
Sergei Magonov
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Contrast ◽  
Phase Changes ◽  
Phase Imaging ◽  
Phase Detection ◽  
Contrast Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Soft Samples

Phase detection in TappingMode™ enhances capabilities of Atomic Force Microscopy (AFM) for soft samples (polymers and biological materials). Changes of amplitude and phase changes of a fast oscillating probe are caused by tip-sample force interactions. Height images reflect the amplitude changes, and in most cases they present a sample topography. Phase images show local differences between phases of free-oscillating probe and of probe interacting with a sample surface. These differences are related to the change of the resonance frequency of the probe either by attractive or repulsive tip-sample forces. Therefore phase detection helps to choose attractive or repulsive force regime for surface imaging and to minimize tip-sample force. For heterogeneous materials the phase imaging allows to distinguish individual components and to visualize their distribution due to differences in phase contrast. This is typically achieved in moderate tapping, when set-point amplitude, Asp, is about half of the amplitude of free-oscillating cantilever, Ao. In contrast, light tapping with Asp close to Ao is best suited for recording a true topography of the topmost surface layer of soft samples. Examples of phase imaging of polymers obtained with a scanning probe microscope Nanoscope® IIIa (Digital Instruments). Si probes (225 μk long, resonance frequencies 150-200 kHz) were used.

scholarly journals Scanning speed phenomenon in contact-resonance atomic force microscopy

2018 ◽  
Vol 9 ◽  
pp. 945-952 ◽  
Author(s):  
Christopher C Glover ◽  
Jason P Killgore ◽  
Ryan C Tung
Keyword(s):  
Atomic Force Microscopy ◽  
Hydrodynamic Theory ◽  
Squeeze Film ◽  
Resonance Spectroscopy ◽  
Related Phenomenon ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scan Speed ◽  
Contact Resonance

This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon. Above a critical scan speed, a monotonic decrease in the recorded contact-resonance frequency is observed with increasing scan speed. Proper characterization and understanding of this phenomenon is necessary to conduct accurate quantitative imaging using contact-resonance AFM, and other contact-mode AFM techniques, at higher scan speeds. A squeeze film hydrodynamic theory is proposed to explain this phenomenon, and model predictions are compared against the experimental data.

A Plate-Like Sensor for the Identification of Sample Viscoelastic Properties Using Contact Resonance Atomic Force Microscopy

2021 ◽  
pp. 1-9
Author(s):  
Matteo Aureli ◽  
Ryan Tung
Keyword(s):  
Atomic Force Microscopy ◽  
Viscoelastic Properties ◽  
Ritz Method ◽  
Theoretical Derivation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Modal Damping ◽  
Stiffness And Damping ◽  
Data Estimation ◽  
Contact Resonance

Abstract In this paper, we present a new contact resonance atomic force microscopy based method utilizing a square, plate-like microsensor to accurately estimate viscoelastic sample properties. A theoretical derivation, based on Rayleigh-Ritz method and on an “unconventional” generalized eigenvalue problem, is presented and a numerical experiment is devised to verify the method. We present an updated sensitivity criterion that allows users, given a set of measured in-contact eigenfrequencies and modal damping ratios, to select the best eigenfrequency for accurate data estimation. The verification results are then presented and discussed. Results show that the proposed method performs extremely well in the identification of viscoelastic properties over broad ranges of non-dimensional sample stiffness and damping values.

scholarly journals Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

2019 ◽  
Vol 10 ◽  
pp. 1636-1647 ◽  
Author(s):  
Wenting Wang ◽  
Chengfu Ma ◽  
Yuhang Chen ◽  
Lei Zheng ◽  
Huarong Liu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Theoretical Calculations ◽  
Contact Stiffness ◽  
Metal Layer ◽  
Experimental Results ◽  
Subsurface Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Cover Thickness ◽  
Contact Resonance

Subsurface imaging of Au circuit structures embedded in poly(methyl methacrylate) (PMMA) thin films with a cover thickness ranging from 52 to 653 nm was carried out by using contact resonance atomic force microscopy (CR-AFM). The mechanical difference of the embedded metal layer leads to an obvious CR-AFM frequency shift and therefore its unambiguous differentiation from the polymer matrix. The contact stiffness contrast, determined from the tracked frequency images, was employed for quantitative evaluation. The influence of various parameter settings and sample properties was systematically investigated by combining experimental results with theoretical analysis from finite element simulations. The results show that imaging with a softer cantilever and a lower eigenmode will improve the subsurface contrast. The experimental results and theoretical calculations provide a guide to optimizing parameter settings for the nondestructive diagnosis of flexible circuits. Defect detection of the embedded circuit pattern was also carried out, which indicates the capability of imaging tiny subsurface structures smaller than 100 nm by using CR-AFM.

Measurement of undercut etching by contact resonance atomic force microscopy

2020 ◽  
Vol 117 (2) ◽  
pp. 023103
Author(s):  
Wenting Wang ◽  
Chengfu Ma ◽  
Yuhang Chen
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Contact Resonance
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