A Plate-Like Sensor for the Identification of Sample Viscoelastic Properties Using Contact Resonance Atomic Force Microscopy

2021 ◽  
pp. 1-9
Author(s):  
Matteo Aureli ◽  
Ryan Tung
Keyword(s):  
Atomic Force Microscopy ◽  
Viscoelastic Properties ◽  
Ritz Method ◽  
Theoretical Derivation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Modal Damping ◽  
Stiffness And Damping ◽  
Data Estimation ◽  
Contact Resonance

Abstract In this paper, we present a new contact resonance atomic force microscopy based method utilizing a square, plate-like microsensor to accurately estimate viscoelastic sample properties. A theoretical derivation, based on Rayleigh-Ritz method and on an “unconventional” generalized eigenvalue problem, is presented and a numerical experiment is devised to verify the method. We present an updated sensitivity criterion that allows users, given a set of measured in-contact eigenfrequencies and modal damping ratios, to select the best eigenfrequency for accurate data estimation. The verification results are then presented and discussed. Results show that the proposed method performs extremely well in the identification of viscoelastic properties over broad ranges of non-dimensional sample stiffness and damping values.

Lorentz Contact Resonance Imaging for Atomic Force Microscopes: Probing Mechanical and Thermal Properties on the Nanoscale

2013 ◽  
Vol 21 (6) ◽  
pp. 18-24 ◽  
Author(s):  
Eoghan Dillon ◽  
Kevin Kjoller ◽  
Craig Prater
Keyword(s):  
Viscoelastic Properties ◽  
Contact Stiffness ◽  
Mechanical And Thermal Properties ◽  
Resonance Modes ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Other Information ◽  
Afm Cantilever ◽  
Stiffness And Damping ◽  
Contact Resonance

Atomic force microscopy (AFM) has been widely used in both industry and academia for imaging the surface topography of a material with nanoscale resolution. However, often little other information is obtained. Contact resonance AFM (CR-AFM) is a technique that can provide information about the viscoelastic properties of a material in contact with an AFM probe by measuring the contact stiffness between the probe and sample. In CR-AFM, an AFM cantilever is oscillated, and the amplitude and frequency of the resonance modes of the cantilever are monitored. When a probe or sample is oscillated, the tip sample interaction can be approximated as an ideal spring-dashpot system using the Voigt-Kelvin model shown in Figure 1. Contact resonance frequencies of the AFM cantilever will shift depending on the contact stiffness, k, between the tip and sample. The damping effect on the system comes from dissipative tip sample forces such as viscosity and adhesion. Damping, η, is observed in a CR-AFM system by monitoring the amplitude and Q factor of the resonant modes of the cantilever. This contact stiffness and damping information can then be used to obtain information about the viscoelastic properties of the material when fit to an applicable model.

scholarly journals 3P-311 Viscoelastic Properties of Many Living Cells Investigated by Atomic Force Microscopy(The 46th Annual Meeting of the Biophysical Society of Japan)

2008 ◽  
Vol 48 (supplement) ◽  
pp. S175
Author(s):  
Shinichiro Hiratsuka ◽  
Yusuke Mizutani ◽  
Masahiro Tsuchiya ◽  
Koichi Kawahara ◽  
Hiroshi Tokumoto ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Annual Meeting ◽  
Viscoelastic Properties ◽  
Living Cells ◽  
Force Microscopy ◽  
Atomic Force ◽  
Biophysical Society

Stick-to-sliding transition in contact-resonance atomic force microscopy

2018 ◽  
Vol 113 (8) ◽  
pp. 083102
Author(s):  
C. Ma ◽  
V. Pfahl ◽  
Z. Wang ◽  
Y. Chen ◽  
J. Chu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Contact Resonance

Plate geometries for contact resonance atomic force microscopy: Modeling, optimization, and verification

2018 ◽  
Vol 124 (1) ◽  
pp. 014503 ◽  
Author(s):  
Matteo Aureli ◽  
Syed N. Ahsan ◽  
Rafiul H. Shihab ◽  
Ryan C. Tung
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Contact Resonance

Viscoelastic properties of doxorubicin-treated HT-29 cancer cells by atomic force microscopy: the fractional Zener model as an optimal viscoelastic model for cells

2019 ◽  
Vol 19 (3) ◽  
pp. 801-813 ◽  
Author(s):  
Maricela Rodríguez-Nieto ◽  
Priscila Mendoza-Flores ◽  
David García-Ortiz ◽  
Luis M. Montes-de-Oca ◽  
Marco Mendoza-Villa ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Cancer Cells ◽  
Viscoelastic Properties ◽  
Viscoelastic Model ◽  
Zener Model ◽  
Force Microscopy ◽  
Atomic Force ◽  
Fractional Zener Model ◽  
Ht 29

scholarly journals Scanning speed phenomenon in contact-resonance atomic force microscopy

2018 ◽  
Vol 9 ◽  
pp. 945-952 ◽  
Author(s):  
Christopher C Glover ◽  
Jason P Killgore ◽  
Ryan C Tung
Keyword(s):  
Atomic Force Microscopy ◽  
Hydrodynamic Theory ◽  
Squeeze Film ◽  
Resonance Spectroscopy ◽  
Related Phenomenon ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scan Speed ◽  
Contact Resonance

This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon. Above a critical scan speed, a monotonic decrease in the recorded contact-resonance frequency is observed with increasing scan speed. Proper characterization and understanding of this phenomenon is necessary to conduct accurate quantitative imaging using contact-resonance AFM, and other contact-mode AFM techniques, at higher scan speeds. A squeeze film hydrodynamic theory is proposed to explain this phenomenon, and model predictions are compared against the experimental data.

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