scholarly journals CREATION OF SPECIAL BATCHES OF DEVICES TO IMPROVE RELIABILITY OF ELECTRONIC COMPONENTS FOR SPACE APPLICATIONS

2020 ◽  
Vol 258 (3) ◽  
pp. 65-71
Author(s):  
V.I. Kuklin ◽  
V.I. Orlov ◽  
V.V. Fedosov
Keyword(s):  
Historical Background ◽  
Quality Level ◽  
Electronic Components ◽  
Joint Work ◽  
Space Applications ◽  
Manufacturing Plants ◽  
Term Operation ◽  
Optimal Approach ◽  
Improve Reliability

In this paper we give a brief historical background of the stages of work carried out by “ITC – NPO PM” JSC aimed at ensuring the long-term operation of electronic components for space applications. It is shown that the creation of specialized testing facilities is the optimal approach to make batches of electronic components of the Space quality level. We propose a further scenario to improve reliability of electronic components for space applications, involving the joint work of specialized testing facilities and manufacturing plants to make special batches of devices.

scholarly journals Using the concepts of homogeneity in additional tests of electronic components for space applications

2020 ◽  
Vol 4 (4) ◽  
pp. 209-218
Author(s):  
S. M. Golovanov ◽  
V. I. Orlov ◽  
V. V. Fedosov
Keyword(s):  
High Reliability ◽  
Outer Space ◽  
Physical Analysis ◽  
Electronic Components ◽  
Space Applications ◽  
Term Operation ◽  
Specialized Production ◽  
The Russian Federation ◽  
Further Development

In modern conditions in the Russian Federation the equipment of spacecraft with a highly reliable electronic components is possible only through testing technical centers which act as a link between manufacturers of electronic components and their consumers. Given the lack of specialized production of electronic components of the «Space» category in our country, this is the only alternative way. Testing technical centers carry out the formation of batches of electronics for space applications by conducting additional tests of electronic components for general industrial use allowing the rejection of elements containing defects that can manifest themselves during long-term operation in outer space. A modern spacecraft contains about 100–200 thousand electronic components. Taking into account the fact that the on-board equipment of the spacecraft during its operation cannot be repaired, it is obvious that extremely high reliability requirements are imposed on the electronic components of space applications. In this regard the improvement of the methodology for increasing the reliability of the electronic components of space applications is of paramount importance for the further development of the space industry. This article outlines an approach to improving the technology of additional tests in testing technical centers, based on the use of the concepts of homogeneity of the tested batch of electronic components which makes it possible to meaningfully generate samples for destructive physical analysis and radiation resistance tests, as well as to additionally identify emission elements that are potentially unreliable elements.

Validation of a fully autonomous phosphate analyser based on a microfluidic lab-on-a-chip

2010 ◽  
Vol 61 (7) ◽  
pp. 1811-1818 ◽  
Author(s):  
C. Slater ◽  
J. Cleary ◽  
K.-T. Lau ◽  
D. Snakenborg ◽  
B. Corcoran ◽  
...  
Keyword(s):  
Waste Water Treatment ◽  
Treatment Plant ◽  
Lab On A Chip ◽  
Extended Period ◽  
Water Treatment Plant ◽  
Waste Water Treatment Plant ◽  
Electronic Components ◽  
Term Operation ◽  
Available Phosphate

This work describes the design of a phosphate analyser that utilises a microfluidic lab-on-a-chip. The analyser contains all the required chemical storage, pumping and electronic components to carry out a complete phosphate assay. The system is self-calibrating and self-cleaning, thus capable of long-term operation. This was proven by a bench top calibration of the analyser using standard solutions and also by comparing the analyser's performance to a commercially available phosphate monitor installed at a waste water treatment plant. The output of the microfluidic lab-on-a-chip analyser was shown to have sensitivity and linear range equivalent to the commercially available monitor and also the ability to operate over an extended period of time.

Analysis of crystallite size changes in a hematite and magnetite formed on steel used in the power idustry

2017 ◽  
Vol 1 (21) ◽  
pp. 65-73
Author(s):  
Monika Gwoździk
Keyword(s):  
Elevated Temperature ◽  
Oxide Layer ◽  
Cross Section ◽  
X Ray ◽  
Term Operation ◽  
Diffraction Line Profile ◽  
Crystallite Sizes ◽  
Scherrer Formula ◽  
Pipe Outlet

The paper presents results of studies on the crystallite sizes of oxide layer formed during a long-term operation on 10CrMo9-10 steel at an elevated temperature (T = 545° C, t = 200,000 h). This value was determined by a method based on analysis of the diffraction line profile, according to a Scherrer formula. The oxide layer was studied on a surface and a cross-section at the outer and inner site on the pipe outlet, at the fire and counter-fire wall of the tube. X-ray studies were carried out on the surface of a tube, then the layer’s surface was polished and the diffraction measurements repeated to reveal differences in the originated oxides layer.

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