scholarly journals The memory effect of nanoscale memristors investigated by conducting scanning probe microscopy methods

2012 ◽  
Vol 3 ◽  
pp. 722-730 ◽  
Author(s):  
César Moreno ◽  
Carmen Munuera ◽  
Xavier Obradors ◽  
Carmen Ocal
Keyword(s):  
Memory Effect ◽  
Scanning Probe Microscopy ◽  
Electrical Characterization ◽  
Scanning Force Microscopy ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Versatile Tool ◽  
Scanning Force ◽  
Memristor Device

We report on the use of scanning force microscopy as a versatile tool for the electrical characterization of nanoscale memristors fabricated on ultrathin La0.7Sr0.3MnO3 (LSMO) films. Combining conventional conductive imaging and nanoscale lithography, reversible switching between low-resistive (ON) and high-resistive (OFF) states was locally achieved by applying voltages within the range of a few volts. Retention times of several months were tested for both ON and OFF states. Spectroscopy modes were used to investigate the I–V characteristics of the different resistive states. This permitted the correlation of device rectification (reset) with the voltage employed to induce each particular state. Analytical simulations by using a nonlinear dopant drift within a memristor device explain the experimental I–V bipolar cycles.

scholarly journals Nanomechanical Probing With Scanning Force Microscopy

2001 ◽  
Vol 9 (1) ◽  
pp. 8-15 ◽  
Author(s):  
V. V. Tsukruk ◽  
V. V. Gorbunov
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Force Microscopy ◽  
Scanning Probe ◽  
Static Force ◽  
Local Surface ◽  
Materials Properties ◽  
Force Microscopy ◽  
Nanomechanical Properties ◽  
Scanning Force ◽  
Magnetic And Electric Properties

Highly localized probing of surface nanomechanical properties with a submicron resolution can be accomplished with scanning probe microscopy (SPM). The SPM ability to probe local surface topography in conjunction with mechanical, adhesive, friction, thermal, magnetic, and electric properties is unique.1 However, the quantitative probing of the nanomechanical materials properties is still a challenge and only a few examples have been published to date.In this note, we briefly review the latest developments in the nanomechanical probing of compliant materials (predominantly polymers). We solely focus our analysis of SPM-based approach in a so-called static force spectroscopy (SFS) mode.

The Effect of -Cyclodextrin Inclusion on the Morphology of [Ru(bpy)2Cl(BPEB)](PF6) Films by Scanning Force Microscopy

2005 ◽  
Vol 11 (S03) ◽  
pp. 142-145
Author(s):  
S. H. Toma ◽  
M. Nakamura ◽  
H. E. Toma
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Force Microscopy ◽  
Recognition Site ◽  
Van Der Waals Interactions ◽  
Scanning Probe ◽  
Guest Molecules ◽  
Force Microscopy ◽  
Scanning Force ◽  
Great Relevance ◽  
Macrocyclic Molecules

Molecular level organization has been a subject of great relevance in supramolecular chemistry and nanotechnology. Supramolecular chemists count on the ability of molecules to form several kinds of organization, allowing the development of nanoscaled devices. In this way, the scanning probe microscopy provides a great tool for characterization, manipulation and interfacing such devices [1]. Regarding the ruthenium complexes [Ru(bpy)2Cl(BPEB)](PF6) and {[Ru(bpy)2Cl]2(BPEB)}(PF6)2, where bpy = 2,2'-bipyridine, the presence of the BPEB (1,4-bis[4-pyridyl)ethenyl]benzene) ligand has an important role as a recognition site for van der Waals interactions (Figure 1). On the other hand, cyclodextrins are macrocyclic molecules bearing a hydrophobic cavity that can support several types of guest molecules [2-3]. In this work we are showing the influence of the recognition site of the BPEB ligand and the formation of an inclusion compound in the patterning structures of films deposited over mica substrates, by SFM microscopy.

Ferroelectric Domain Engineering in Stoichiometric LiNbO3 by Scanning Probe Microscopy

2012 ◽  
Vol 485 ◽  
pp. 510-513
Author(s):  
Hui Feng Bo ◽  
Zhan Xin Zhang ◽  
Hong Kui Hu ◽  
Ru Zheng Wang
Keyword(s):  
Lithium Niobate ◽  
Scanning Probe Microscopy ◽  
Pulse Width ◽  
Scanning Force Microscopy ◽  
Ferroelectric Domain ◽  
Domain Engineering ◽  
Scanning Probe ◽  
Feature Size ◽  
Force Microscopy ◽  
Scanning Force

Scanning force microscopy is used to investigate nanoscale ferroelectric domain engineering in near-stoichiometric lithium niobate (SLN) single crystals. The topography of the SLN single crystal was studied after polished to about 10 micron thickness. Dot patterns of the domain structure were fabricated by applying positive DC voltages of magnitude form 80 to 100 V with different pulse width from 0.5 to 20 s. The dot nanodomains of radius down to 200 nm were fabricated. With the increase of the magnitude of voltage and pulse width, feature size of switched domains increased to 940 nm.

Electrical characterization of integrated circuits by scanning force microscopy

1994 ◽  
Vol 24 (1-3) ◽  
pp. 218-222 ◽  
Author(s):  
C. Böhm ◽  
C. Roths ◽  
U. Müller ◽  
A. Beyer ◽  
E. Kubalek
Keyword(s):  
Integrated Circuits ◽  
Electrical Characterization ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force

scholarly journals Scanning Probe Microscopy in Materials Science

MRS Bulletin ◽  
2004 ◽  
Vol 29 (7) ◽  
pp. 443-448 ◽  
Author(s):  
Ernst Meyer ◽  
Suzanne P. Jarvis ◽  
Nicholas D. Spencer
Keyword(s):  
Scanning Probe Microscopy ◽  
Materials Science ◽  
Scanning Force Microscopy ◽  
Scanning Probe ◽  
Aqueous Environment ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scanning Force ◽  
Made In

AbstractThis brief article introduces the July 2004 issue of MRS Bulletin, focusing on Scanning Probe Microscopy in Materials Science.Those application areas of scanning probe microscopy (SPM) in which the most impact has been made in recent years are covered in the articles in this theme.They include polymers and semiconductors, where scanning force microscopy is now virtually a standard characterization method; magnetism, where magnetic force microscopy has served both as a routine analytical approach and a method for fundamental studies;tribology, where friction force microscopy has opened entirely new vistas of investigation;biological materials, where atomic force microscopy in an aqueous environment allows biosystems to be imaged and measured in a native (or near-native) state;and nanostructured materials, where SPM has often been the only approach capable of elucidating nanostructures.

Measurement of Plasticity Gradients with Scanning Probe Microscopy

1993 ◽  
Vol 318 ◽  
Author(s):  
James D. Kiely ◽  
Dawn A. Bonnell
Keyword(s):  
Fracture Surface ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Ceramic System ◽  
Force Microscopy ◽  
Metal Fracture ◽  
Atomic Force ◽  
Metal Ceramic

ABSTRACTScanning Tunneling and Atomic Force Microscopy were used to characterize the topography of fractured Au /sapphire interfaces. Variance analysis which quantifies surface morphology was developed and applied to the characterization of the metal fracture surface of the metal/ceramic system. Fracture surface features related to plasticity were quantified and correlated to the fracture energy and energy release rate.

Characterization of metal decorated protein templates by scanning electron/scanning force microscopy and microanalysis

2004 ◽  
Vol 36 (8) ◽  
pp. 720-723 ◽  
Author(s):  
Wilhelm Habicht ◽  
Silke Behrens ◽  
Jin Wu ◽  
Eberhard Unger ◽  
Eckhard Dinjus
Keyword(s):  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Scanning Electron
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