scholarly journals Scanning Probe Microscopy in Materials Science

MRS Bulletin ◽  
2004 ◽  
Vol 29 (7) ◽  
pp. 443-448 ◽  
Author(s):  
Ernst Meyer ◽  
Suzanne P. Jarvis ◽  
Nicholas D. Spencer
Keyword(s):  
Scanning Probe Microscopy ◽  
Materials Science ◽  
Scanning Force Microscopy ◽  
Scanning Probe ◽  
Aqueous Environment ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scanning Force ◽  
Made In

AbstractThis brief article introduces the July 2004 issue of MRS Bulletin, focusing on Scanning Probe Microscopy in Materials Science.Those application areas of scanning probe microscopy (SPM) in which the most impact has been made in recent years are covered in the articles in this theme.They include polymers and semiconductors, where scanning force microscopy is now virtually a standard characterization method; magnetism, where magnetic force microscopy has served both as a routine analytical approach and a method for fundamental studies;tribology, where friction force microscopy has opened entirely new vistas of investigation;biological materials, where atomic force microscopy in an aqueous environment allows biosystems to be imaged and measured in a native (or near-native) state;and nanostructured materials, where SPM has often been the only approach capable of elucidating nanostructures.

Learning the core ideas of scanning probe microscopy by toy model inquiries

2013 ◽  
Vol 2 (2) ◽  
pp. 229-239 ◽  
Author(s):  
Anssi Lindell ◽  
Anna-Leena Kähkönen
Keyword(s):  
Scanning Probe Microscopy ◽  
Large Family ◽  
Scanning Force Microscopy ◽  
Scanning Probe ◽  
Laboratory Unit ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
The Core ◽  
Atomic Force ◽  
Probe Calibration

AbstractAtomic force microscopy has developed from an atomic level imaging technique to a large family of nanoscientific research setups called scanning probe microscopy. Following this trend, we also need to develop our education from instructions to use the instrument for imaging into an approach of deeper understanding of the science behind the technologies. In this article, we describe our new university level scanning probe microscopy laboratory unit to learn the main scientific principles and applications of the instruments. Three inquiries using toy models were designed to cover the core ideas of scanning probe microscopy. Learning outcomes were analyzed and categorized into levels from the research reports of nine students. We found that practically every student learned atomic force imaging basics: scanning and essential properties of the topography image. One-third of the students showed good understanding in image artifacts and probe calibration, but just one of the students reached the level beyond the topography images to scanning force microscopy and combined force and topography techniques in his report. Also, the connection between scanning probe techniques and human senses was considered an important objective in design of this laboratory unit, although with modest success in learning so far.

scholarly journals The memory effect of nanoscale memristors investigated by conducting scanning probe microscopy methods

2012 ◽  
Vol 3 ◽  
pp. 722-730 ◽  
Author(s):  
César Moreno ◽  
Carmen Munuera ◽  
Xavier Obradors ◽  
Carmen Ocal
Keyword(s):  
Memory Effect ◽  
Scanning Probe Microscopy ◽  
Electrical Characterization ◽  
Scanning Force Microscopy ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Versatile Tool ◽  
Scanning Force ◽  
Memristor Device

We report on the use of scanning force microscopy as a versatile tool for the electrical characterization of nanoscale memristors fabricated on ultrathin La0.7Sr0.3MnO3 (LSMO) films. Combining conventional conductive imaging and nanoscale lithography, reversible switching between low-resistive (ON) and high-resistive (OFF) states was locally achieved by applying voltages within the range of a few volts. Retention times of several months were tested for both ON and OFF states. Spectroscopy modes were used to investigate the I–V characteristics of the different resistive states. This permitted the correlation of device rectification (reset) with the voltage employed to induce each particular state. Analytical simulations by using a nonlinear dopant drift within a memristor device explain the experimental I–V bipolar cycles.

Developments in Using Scanning Probe Microscopy To Study Molecules on Surfaces — From Thin Films and Single-Molecule Conductivity to Drug–Living Cell Interactions

2006 ◽  
Vol 59 (6) ◽  
pp. 359 ◽  
Author(s):  
Pall Thordarson ◽  
Rob Atkin ◽  
Wouter H. J. Kalle ◽  
Gregory G. Warr ◽  
Filip Braet
Keyword(s):  
Single Molecule ◽  
Scanning Probe Microscopy ◽  
Cell Interactions ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tunnelling Microscopy ◽  
Molecule Surface

Scanning probe microscopy (SPM) techniques, including atomic force microscopy (AFM) and scanning tunnelling microscopy (STM), have revolutionized our understanding of molecule–surface interactions. The high resolution and versatility of SPM techniques have helped elucidate the morphology of adsorbed surfactant layers, facilitated the study of electronically conductive single molecules and biomolecules connected to metal substrates, and allowed direct observation of real-time processes such as in situ DNA hybridization and drug–cell interactions. These examples illustrate the power that SPM possesses to study (bio)molecules on surfaces and will be discussed in depth in this review.

scholarly journals Nanomechanical Probing With Scanning Force Microscopy

2001 ◽  
Vol 9 (1) ◽  
pp. 8-15 ◽  
Author(s):  
V. V. Tsukruk ◽  
V. V. Gorbunov
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Force Microscopy ◽  
Scanning Probe ◽  
Static Force ◽  
Local Surface ◽  
Materials Properties ◽  
Force Microscopy ◽  
Nanomechanical Properties ◽  
Scanning Force ◽  
Magnetic And Electric Properties

Highly localized probing of surface nanomechanical properties with a submicron resolution can be accomplished with scanning probe microscopy (SPM). The SPM ability to probe local surface topography in conjunction with mechanical, adhesive, friction, thermal, magnetic, and electric properties is unique.1 However, the quantitative probing of the nanomechanical materials properties is still a challenge and only a few examples have been published to date.In this note, we briefly review the latest developments in the nanomechanical probing of compliant materials (predominantly polymers). We solely focus our analysis of SPM-based approach in a so-called static force spectroscopy (SFS) mode.

The Effect of -Cyclodextrin Inclusion on the Morphology of [Ru(bpy)2Cl(BPEB)](PF6) Films by Scanning Force Microscopy

2005 ◽  
Vol 11 (S03) ◽  
pp. 142-145
Author(s):  
S. H. Toma ◽  
M. Nakamura ◽  
H. E. Toma
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Force Microscopy ◽  
Recognition Site ◽  
Van Der Waals Interactions ◽  
Scanning Probe ◽  
Guest Molecules ◽  
Force Microscopy ◽  
Scanning Force ◽  
Great Relevance ◽  
Macrocyclic Molecules

Molecular level organization has been a subject of great relevance in supramolecular chemistry and nanotechnology. Supramolecular chemists count on the ability of molecules to form several kinds of organization, allowing the development of nanoscaled devices. In this way, the scanning probe microscopy provides a great tool for characterization, manipulation and interfacing such devices [1]. Regarding the ruthenium complexes [Ru(bpy)2Cl(BPEB)](PF6) and {[Ru(bpy)2Cl]2(BPEB)}(PF6)2, where bpy = 2,2'-bipyridine, the presence of the BPEB (1,4-bis[4-pyridyl)ethenyl]benzene) ligand has an important role as a recognition site for van der Waals interactions (Figure 1). On the other hand, cyclodextrins are macrocyclic molecules bearing a hydrophobic cavity that can support several types of guest molecules [2-3]. In this work we are showing the influence of the recognition site of the BPEB ligand and the formation of an inclusion compound in the patterning structures of films deposited over mica substrates, by SFM microscopy.

scholarly journals Micro-Area Ferroelectric, Piezoelectric and Conductive Properties of Single BiFeO3 Nanowire by Scanning Probe Microscopy

Nanomaterials ◽  
2019 ◽  
Vol 9 (2) ◽  
pp. 190 ◽  
Author(s):  
Shenglan Wu ◽  
Jing Zhang ◽  
Xiaoyan Liu ◽  
Siyi Lv ◽  
Rongli Gao ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Bismuth Ferrite ◽  
Piezoresponse Force Microscopy ◽  
Scanning Probe ◽  
Switching Behavior ◽  
X Ray Diffraction ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Conductive Properties

Ferroelectric nanowires have attracted great attention due to their excellent physical properties. We report the domain structure, ferroelectric, piezoelectric, and conductive properties of bismuth ferrite (BFO, short for BiFeO3) nanowires characterized by scanning probe microscopy (SPM). The X-ray diffraction (XRD) pattern presents single phase BFO without other obvious impurities. The piezoresponse force microscopy (PFM) results indicate that the nanowires possess a multidomain configuration, and the maximum piezoelectric coefficient (d33) of single BFO nanowire is 22.21 pm/V. Poling experiments and local switching spectroscopy piezoresponse force microscopy (SS-PFM) demonstrate that there is sufficient polarization switching behavior and obvious piezoelectric properties in BFO nanowires. The conducting atomic force microscopy (C-AFM) results show that the current is just hundreds of pA at 8 V. These lay the foundation for the application of BFO nanowires in nanodevices.

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