Neutron shielding material design based on Monte Carlo simulation

2012 ◽  
Vol 24 (12) ◽  
pp. 3006-3010 ◽  
Author(s):  
陈飞达 Chen Feida ◽  
汤晓斌 Tang Xiaobin ◽  
王鹏 Wang Peng ◽  
陈达 Chen Da
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Material Design ◽  
Neutron Shielding ◽  
Shielding Material

Development of SiO2 based doped with LiF, Cr2O3, CoO4 and B2O3 glasses for gamma and fast neutron shielding

2020 ◽  
Vol 0 (0) ◽  
Author(s):  
Bünyamin Aygün ◽  
Erdem Şakar ◽  
Abdulhalik Karabulut ◽  
Bünyamin Alım ◽  
Mohammed I. Sayyed ◽  
...  
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Fast Neutron ◽  
Cross Sections ◽  
Gamma Ray ◽  
Absorbed Dose ◽  
Neutron Shielding ◽  
Shielding Properties ◽  
Effective Neutron ◽  
Simulation Codes

AbstractIn this study, the fast neutron and gamma-ray absorption capacities of the new glasses have been investigated, which are obtained by doping CoO,CdWO4,Bi2O3, Cr2O3, ZnO, LiF,B2O3 and PbO compounds to SiO2 based glasses. GEANT4 and FLUKA Monte Carlo simulation codes have been used in the planning of the samples. The glasses were produced using a well-known melt-quenching technique. The effective neutron removal cross-sections, mean free paths, half-value layer, and transmission numbers of the fabricated glasses have been calculated through both GEANT4 and FLUKA Monte Carlo simulation codes. Experimental neutron absorbed dose measurements have been carried out. It was found that GS4 glass has the best neutron protection capacity among the produced glasses. In addition to neutron shielding properties, the gamma-ray attenuation capacities, were calculated using newly developed Phy-X/PSD software. The gamma-ray shielding properties of GS1 and GS2 are found to be equivalent to Pb-based glass.

Assessment of neutron shielding performance of nano-TiO2-incorporated cement paste by Monte Carlo simulation

2019 ◽  
Vol 117 ◽  
pp. 103043 ◽  
Author(s):  
Jaeyeon Park ◽  
Heongwon Suh ◽  
Seung Min Woo ◽  
Keunhong Jeong ◽  
Seungwook Seok ◽  
...  
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Cement Paste ◽  
Nano Tio2 ◽  
Neutron Shielding

scholarly journals Monte Carlo simulation of neutron shielding performance of iron spherical shell

2018 ◽  
Vol 1053 ◽  
pp. 012079
Author(s):  
Yinghong Zuo ◽  
Jinhui Zhu ◽  
Honggang Xie ◽  
Yuan Wei ◽  
Shengli Niu
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Spherical Shell ◽  
Neutron Shielding

Development of Al2O3-Bi2O3-B2O3 Glasses for Neutron Shielding Material

2016 ◽  
Vol 675-676 ◽  
pp. 430-433
Author(s):  
Suparat Tuscharoen ◽  
Smit Insiripong ◽  
T. Korkut ◽  
Jakrapong Kaewkhao
Keyword(s):  
Monte Carlo ◽  
Physical Properties ◽  
Chemical Formula ◽  
Melt Quenching ◽  
Neutron Shielding ◽  
Equivalent Dose Rate ◽  
Monte Carlo Techniques ◽  
Positive Effects ◽  
Shielding Properties ◽  
Shielding Material

A glass system with chemical formula xB2O3:20Bi2O3:(100-x) Al2O3 (x = 55, 60, 65, 70, 75 and 80 mol%) is prepared by melt quenching technique and were investigated the physical and neutron shielding properties. The physical properties were investigated by density, molar volume and discussed with different Al2O3 contents. The neutron shielding property was investigated by Monte Carlo techniques (FLUKA and GEANT4 codes) and neutron equivalent dose rate measurements. As a result, neutron shielding capacity of glass samples decrease with increased Al2O3 content, so increased B2O3 content is a result of positive effects on neutron shielding.

Electron Scattering in Solids

1990 ◽  
Vol 48 (2) ◽  
pp. 4-5
Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Elastic Scattering ◽  
Electron Scattering ◽  
Cross Sections ◽  
Expansion Method ◽  
Electron Excitation ◽  
Partial Wave Expansion ◽  
Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 264-265
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Compound Semiconductors ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Metastable Alloys ◽  
Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

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