BIOINDICATION OF TRACE METAL POLLUTION IN THE ATMOSPHERE OF BAKU CITY USING LIGUSTRUM JAPONICUM, OLEA EUROPEA, AND PYRACANTHA COCCINEA LEAVES

The leaves of Ligustrum japonicum (Oleaceae), Olea europaea (Oleaceae), and Pyracantha coccinea (Rosaceae) were evaluated with the aim of using them as bioindicators for trace metal contamination in Baku city, Azerbaijan, one of the most highly polluted cities worldwide. These species of trees are the most abundant in urban and rural areas of Azerbaijan, because of high tolerance against climatic influences due to their modesty and adaptability. Concentrations of Cd, Cr, Cu, Fe, and Pb were determined in the leaves by AAS method. The samples were collected at three locations with different degrees of trace metal pollution (industrial, high traffic, and reference [botanical garden] site). The highest element concentrations were detected at sites of high traffic. Up to 70 times higher Pb concentrations could be found in the leaves of the trees that reflect the known Pb problem around Baku. The results presented give a first impression of a correlation between the degree of trace metal contamination in the environment and the trace metal concentration in the leaves of L. japonicum and O. europaea

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Analysis of Trace Metal Contamination in Pahang River and Kelantan River, Malaysia

MATEC Web of Conferences ◽

10.1051/matecconf/201926604003 ◽

2019 ◽

Vol 266 ◽

pp. 04003 ◽

Cited By ~ 1

Author(s):

Norpadzlihatun Manap ◽

Kavitha Sandirasegaran ◽

Noor Shahifah Syahrom ◽

Amnorzahira Amir

Keyword(s):

Trace Metals ◽

Trace Metal ◽

Metal Contamination ◽

Sediment Quality ◽

Primary Objective ◽

Trace Metal Concentration ◽

Trace Metal Contamination ◽

Quality Guidelines ◽

Fish Samples ◽

Negative Impacts

The primary objective of this study is to determine trace metal contamination in environmental samples obtained from Pahang River and Kelantan River, Malaysia which may help to identify the risk of sustainable dredging in these areas. This research also proceeds to compare the trace metal concentration with the National Water Quality Standards of Malaysia, Interim Canadian Sediment Quality Guidelines and Malaysian Food Act 1983 to determine its limits and risks. Samples of water, sediment, snails and fishes were collected and analyzed for As, Cu, Cd, Cr, Fe, Pb, Ni, Mn, and Hg by using atomic absorption spectrophotometer. It was found that the concentration of trace metals namely As, Cu, Cd, Cr, Pb, Ni, and Hg in river water, sediment, snail and fish samples in Pahang River were lower than the maximum allowable limits, except for Fe and Mn. In Kelantan River, the concentration of trace metals indicating that it is contaminated with Fe, Mn, Pb, Cr, Cu, Hg, and As as all trace metals exceeded the maximum allowable limits. Negative impacts may arise, and the river may contaminate more in future if there is no proper management to tackle this issue during execution of dredging activities.

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Method of Detecting Trace Metal Contamination in Thick-Film SOI Device

ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2005p0220 ◽

2005 ◽

Author(s):

Yasunori Goto ◽

Hiroomi Eguchi ◽

Masaru Iida

Keyword(s):

Trace Metal ◽

Thick Film ◽

Metal Contamination ◽

Semiconductor Device ◽

Trace Element Analysis ◽

Silicon On Insulator ◽

Element Analysis ◽

Trace Metal Contamination ◽

Trace Metal Elements ◽

Output Characteristics

Abstract In the automotive IC using thick-film silicon on insulator (SOI) semiconductor device, if the gettering capability of a SOI wafer is inadequate, electrical characteristics degradation by metal contamination arises and the yield falls. At this time, an automotive IC was made experimentally for evaluation of the gettering capability as one of the purposes. In this IC, one of the output characteristics varied from the standard, therefore failure analysis was performed, which found trace metal elements as one of the causes. By making full use of 3D perspective, it is possible to fabricate a site-specific sample into 0.1 micrometre in thickness without missing a failure point that has very minute quantities of contaminant in a semiconductor device. Using energy dispersive X-ray, it is possible to detect trace metal contamination at levels 1E12 atoms per sq cm. that are conventionally detected only by trace element analysis.

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