Improved reverse current-voltage characteristics of a 4H-SiC PiN diode by bias-enhanced reduction of surface damage
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2019 ◽
Vol 34
(5)
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pp. 055021
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2006 ◽
Vol 527-529
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pp. 1339-1342
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2001 ◽
Vol 40
(Part 2, No. 5B)
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pp. L518-L520
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Vol 778-780
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pp. 657-660
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2007 ◽
Vol 556-557
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pp. 885-888
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