Measurement of Copper in p-Type Silicon Using Charge-Carrier Lifetime Methods
2005 ◽
Vol 108-109
◽
pp. 643-648
◽
1997 ◽
Vol 127-128
◽
pp. 388-392
◽
Keyword(s):
2018 ◽
Vol 24
(56)
◽
pp. 14928-14932
◽
2017 ◽
Vol 7
(22)
◽
pp. 1701536
◽
Keyword(s):
Keyword(s):