Determination of SiO2 Content in Boron-Containing Silica Refractories by Hydrofluoric Acid Gravimetry

2010 ◽  
Vol 177 ◽  
pp. 478-480
Author(s):  
Jian Ping Xu

The co-volatilization of boron and silicon has been studied for determination of SiO2 content in boron-containing silica refractories. The co-volatilization of boron may cause positive interference for determining of SiO2 content. The interference can be eliminated by the volatilization of boron with 5mL and 2mL of ethanol by separately volatizing, before volatilization of SiO2 with hydrofluoric acid. The method for determination of SiO2 content in boron-containing silica refractories has been established. The scope and precision of this method are equaled to that of the conventional method by hydrofluoric acid gravimetry.

1993 ◽  
Vol 42 (7) ◽  
pp. T113-T117 ◽  
Author(s):  
Yutaka NAKAMURA ◽  
Sigeto SIGEMORI ◽  
Takako TAKAHASHI ◽  
Yuichi TAKAKU ◽  
Tadashi SIMAMURA

1898 ◽  
Vol 20 (7) ◽  
pp. 504-506 ◽  
Author(s):  
Allen P. Ford ◽  
I. M. Bregowsky
Keyword(s):  

2004 ◽  
Vol 818 ◽  
Author(s):  
I.D. Sharp ◽  
Q. Xu ◽  
C.Y. Liao ◽  
D.O. Yi ◽  
J.W. Ager ◽  
...  

AbstractIsotopically pure 70Ge and 74Ge nanocrystals embedded in SiO2 thin films on Si substrates have been fabricated through ion implantation and thermal annealing. Nanocrystals were subsequently exposed using a hydrofluoric acid etching procedure to selectively remove the oxide matrix while retaining up to 69% of the implanted Ge. Comparison of transmission electron micrographs (TEM) of as-grown crystals to atomic force microscope (AFM) data of exposed crystals reveals that the nanocrystal size distribution is very nearly preserved during etching. Therefore, this process provides a new means to use AFM for rapid and straightforward determination of size distributions of nanocrystals formed in a silica matrix. Once exposed, nanocrystals may be transferred to a variety of substrates, such as conducting metal films and optically transparent insulators for further characterization.


2013 ◽  
Vol 2013 ◽  
pp. 1-7 ◽  
Author(s):  
Hyun Wook Moon ◽  
Woojoong Kim ◽  
Sewoong Kwon ◽  
Jaeheung Kim ◽  
Young Joong Yoon

A simple and exact closed-form equation to determine a penetrated ray path in a ray tracing is proposed for an accurate channel prediction in indoor environments. Whereas the penetrated ray path in a conventional ray tracing is treated as a straight line without refraction, the proposed method is able to consider refraction through the wall in the penetrated ray path. Hence, it improves the accuracy in ray tracing simulation. To verify the validation of the proposed method, the simulated results of conventional method, approximate method, and proposed method are compared with the measured results. The comparison shows that the proposed method is in better agreement with the measured results than the conventional method and approximate method, especially in high frequency bands.


2007 ◽  
Vol 4 (2) ◽  
pp. 180-190
Author(s):  
Baghdad Science Journal

New microphotometer was constructed in our Laboratory Which deals with the determination of Molybdenum (VI) through its Catalysis effect on Hydrogen peroxide and potasum iodide Reaction in acid medium H2SO4 0.01 mM. Linearity of 97.3% for the range 5- 100 ppm. The repeatability of result was better than 0.8 % 0.5 ppm was obtanined as L.U. (The method applied for the determination of Molybdenum (VI) in medicinal Sample (centrum). The determination was compared well with the developed method the conventional method.


1997 ◽  
Vol 80 (3) ◽  
pp. 647-650 ◽  
Author(s):  
Da-Hai Sun ◽  
James K Waters ◽  
Thomas P Mawhtnney

Abstract A microwave digestion procedure was developed for determining aluminum and boron and 13 other elements in plant tissues by inductively coupled plasma atomic emission spectrometry (ICP-AES). The sample (0.5 g) was digested in a closed Teflon vessel with 10 mL concentrated nitric acid and 3 mL hydrofluoric acid, and further digested in an open Teflon vessel with 5 mL hydrogen peroxide. Excess hydrofluoric acid was eliminated by adding 0.2 g silicon (IV) oxide. Four National Institute of Standards and Technology standard reference materials (apple leaves, peach leaves, tomato leaves, and pine needles) were analyzed to test the reliability of the method. The excellent recoveries indicate that the proposed procedure is simple and effective for determination of Al, B, Ba, Ca, Cr, Cu, Fe, K, Mg, Mn, Na, P, S, Sr, and Zn in plants.


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