Properties of Al Doped ZnO Thin films by DC Reaction Magnetron Sputtering
2011 ◽
Vol 306-307
◽
pp. 362-367
Keyword(s):
The high quality ZAO thin films were successfully produced by DC reaction magnetron sputtering technology. The XRD,electrical and optical properties of films are particular investigated. The results show that ZAO films are polycrystalline hexagonal wurtzite structure,and Al2O3 crystal phase are not found. At the same time,the high quality ZAO films with the minimum resistivity of 4.5x10-4Ω•㎝, the transmittance in visible region above 80% and the reflectivity in IR region above 70% are gained.
2015 ◽
Vol 351
◽
pp. 392-400
◽
Keyword(s):
2014 ◽
Vol 26
(1)
◽
pp. 493-497
◽
Keyword(s):
2012 ◽
Vol 21
(1)
◽
pp. 17-21
◽
2018 ◽
Vol 5
(1)
◽
pp. 2710-2715
◽
2011 ◽
Vol 299-300
◽
pp. 530-533
Keyword(s):