Estimation of Thickness Ratio of Bi-Layer TiNi to Enhance Shape Memory Behavior

2012 ◽  
Vol 428 ◽  
pp. 141-146
Author(s):  
Maryam Mohri ◽  
Mahmud Nili Ahmadabadi
Keyword(s):  
Thin Films ◽  
Shape Memory ◽  
Composite Layer ◽  
Amorphous Structure ◽  
Nanostructured Material ◽  
Film Structure ◽  
Thickness Ratio ◽  
Vacuum Arc ◽  
Shape Memory Behavior ◽  
Alloy Target

Shape memory thin films deposited by sputtering are attractive candidates for micro-electro-mechanical-system (MEMS) because of their large deformation and strong recovery force. In the present study Ni-Ti thin films have been deposited on NaCl substrates by DC magnetron sputtering source fitted with an 80mm diameter alloy target. In order to obtain a variety of film compositions, several discs of alloy target, which prepared in vacuum arc remelting (VAR), were used. Three types of thin films have been deposited; Ti and Ni-rich thin films were separately deposited on NaCl substrate and also a composite layer of Ni45Ti50Cu5 and Ni-rich. The as deposited Ni-Ti thin films were crystallized to change the amorphous structure to a nanostructured material to characterize shape memory and superelastic behaviors. The effect of composition on film structure and mechanical behavior was studied by using X-ray diffraction (XRD) and nanoindentation. The results of thin films behavior were used to calculate the thickness ratio of be-layer composite NiTi to obtain enhanced shape memory behavior.

GROWTH AND STRUCTURAL STUDY OF NANOCRYSTALLINE TITANIUM OXIDE AND ZIRCONIUM OXIDE THIN FILMS DEPOSITED AT LOW TEMPERATURES

2005 ◽  
Vol 04 (04) ◽  
pp. 795-801
Author(s):  
B. K. TAY ◽  
Z. W. ZHAO ◽  
S. P. LAU ◽  
J. X. GAO
Keyword(s):  
Thin Films ◽  
Titanium Oxide ◽  
Low Temperatures ◽  
Zirconium Oxide ◽  
Amorphous Structure ◽  
Film Structure ◽  
Vacuum Arc ◽  
Oxide Thin Films ◽  
Metal Oxide Thin Films ◽  
Filtered Cathodic Vacuum Arc

Titanium oxide and zirconium oxide thin films were deposited at low temperatures (not exceeding 350°C) by off-plane filtered cathodic vacuum arc (FCVA). The film structures were studied by XRD and Raman spectra. For titanium oxide thin films, amorphous structure remains up to 230°C, and anatase film with the crystallite size of 16 nm is observed at 330°C as confirmed by XRD and Raman analysis. For zirconium oxide, the film structure develops from amorphous at room temperature to polycrystalline state at 150°C and above. Moreover, for the crystallized films, preferred orientation is along [-111] direction. At 150°C the films possess nano-sized crystallites (less than 15 nm). For these two kinds of metal oxide thin films, surface roughness both increases with the growth temperature.

The effect of annealing treatment on microstructure and shape memory behavior of Ti-Ta-Zr thin films

Vacuum ◽  
2018 ◽  
Vol 153 ◽  
pp. 1-5 ◽  
Author(s):  
R. Ning ◽  
X.H. Zheng ◽  
J. Yao ◽  
Z.G. Zhang ◽  
W. Cai
Keyword(s):  
Thin Films ◽  
Shape Memory ◽  
Annealing Treatment ◽  
Shape Memory Behavior

Shape memory behavior of high temperature Ti–Ni–Pt thin films

2006 ◽  
Vol 515 (4) ◽  
pp. 1938-1941 ◽  
Author(s):  
Mohanchandra K. Panduranga ◽  
Daniel D. Shin ◽  
Gregory P. Carman
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Shape Memory ◽  
Shape Memory Behavior

Shape memory behavior of Ti–Ni–Cu thin films

2006 ◽  
Vol 438-440 ◽  
pp. 683-686 ◽  
Author(s):  
A. Ishida ◽  
M. Sato ◽  
K. Ogawa ◽  
K. Yamada
Keyword(s):  
Thin Films ◽  
Shape Memory ◽  
Shape Memory Behavior

Effect of Ni-Content on Shape Memory Behavior of Ti-Rich Ti-Ni Melt-Spun Ribbons

2005 ◽  
Vol 475-479 ◽  
pp. 1925-1928 ◽  
Author(s):  
Hongyang Xing ◽  
Anak Khantachawana ◽  
Hee Young Kim ◽  
Shuichi Miyazaki
Keyword(s):  
Shape Memory ◽  
Melt Spinning ◽  
Shape Recovery ◽  
Amorphous Structure ◽  
Shape Memory Behavior ◽  
Ni Content ◽  
Recovery Strain ◽  
Heat Treated ◽  
Melt Spun ◽  
Melt Spun Ribbons

The microstructure and shape memory behavior of Ti-rich Ti-Ni melt-spun ribbons with various Ni-contents were investigated. Ti-xNi(x=40~48at%) ribbons were fabricated by the melt-spinning method at the rotation speed of 5000rpm. They were heat-treated at 1073K for 3.6ks. It was found that the Ti-40at%Ni as-spun ribbon exhibited almost complete amorphous structure, while the specimen with more Ni-content, such as 48at%Ni ribbon exhibited the coexistence of amorphous and crystalline structures. It was also found that the maximum shape recovery strain increased with increasing Ni-content. The Ti-40at%Ni ribbon was very brittle because of many Ti2Ni precipitates formed.

scholarly journals Effect of Heat Treatment on Shape Memory Behavior of Ti-rich Ti–Ni Thin Films

1995 ◽  
Vol 36 (11) ◽  
pp. 1349-1355 ◽  
Author(s):  
Akira Ishida ◽  
Morio Sato ◽  
Atsushi Takei ◽  
Shuichi Miyazaki
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Shape Memory ◽  
Shape Memory Behavior

scholarly journals Effects of Composition and Annealing on Shape Memory Behavior of Ti-Rich Ti-Ni Thin Films Formed by Sputtering

2001 ◽  
Vol 42 (6) ◽  
pp. 1060-1067 ◽  
Author(s):  
Akira Ishida ◽  
Morio Sato ◽  
Takashi Kimura ◽  
Takahiro Sawaguchi
Keyword(s):  
Thin Films ◽  
Shape Memory ◽  
Shape Memory Behavior
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