Uncertainty Evaluation of SEM-Based Nanoroughness Measurement
2012 ◽
Vol 472-475
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pp. 1319-1322
Keyword(s):
In metrology, a measurement process without uncertainty evaluation is incomplete. The same applies to nanoroughness metrology. In this paper, Scanning Electron Microscopy (SEM) measurement uncertainty of nanoroughness is studied based on ISO Geometric Product Specification and Verification (GPS). The uncertainty propagation model of SEM-based nanoroughness measurement is presented. The evaluation model of SEM-based standard measurement uncertainty is conducted. As a case study, the line edge roughness uncertainty produced by the JSM-6700F SEM is evaluated.
2011 ◽
Vol 201-203
◽
pp. 1642-1648
2014 ◽
Vol 568-570
◽
pp. 76-81
2021 ◽
Vol 781
(2)
◽
pp. 022053
2019 ◽
Vol 2019
◽
pp. 1-13
◽
Keyword(s):
2008 ◽
Vol 47
(4)
◽
pp. 2501-2505
◽
Study of the acid-diffusion effect on line edge roughness using the edge roughness evaluation method
2002 ◽
Vol 20
(4)
◽
pp. 1342
◽
Keyword(s):
On Line
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